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1, 2020
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2016 IEEE Symposium on VLSI Technology, 2016, p.1-2
- Cho, H.-J.
- Oh, H.S.
- Nam, K.J.
- Kim, Y.H.
- Yeo, K.H.
- Kim, W.D.
- Chung, Y.S.
- Nam, Y.S.
- Kim, S.M.
- Kwon, W.H.
- Kang, M.J.
- Kim, I.R.
- Fukutome, H.
- Jeong, C.W.
- Shin, H.J.
- Kim, Y.S.
- Kim, D.W.
- Park, S.H.
- Jeong, J.H.
- Kim, S.B.
- Ha, D.W.
- Park, J.H.
- Rhee, H.S.
- Hyun, S.J.
- Shin, D.S.
- Kim, D.H.
- Kim, H.Y.
- Maeda, S.
- Lee, K.H.
- Kim, M.C.
- Koh, Y.S.
- Yoon, B.
- Shin, K.
- Lee, N.I.
- Kangh, S.B.
- Hwang, K.H.
- Lee, J.H.
- Ku, J.-H.
- Nam, S.W.
- Jung, S.M.
- Kang, H.K.
- Yoon, J.S.
- Jung, E.S.
2016
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2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2022, p.369-370
2022
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2024 IEEE International Reliability Physics Symposium (IRPS), 2024, p.1-7
2024
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1, 2019
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2015 IEEE 26th Symposium on Fusion Engineering (SOFE), 2015, p.1-5
2015
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2020 IEEE International Solid- State Circuits Conference - (ISSCC), 2020, p.76-78
2020
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2012 Symposium on VLSI Technology (VLSIT), 2012, p.57-58
2012
- Link zum Volltext
2019 Symposium on VLSI Technology, 2019, p.T30-T31
- Meunier, T.
- Hutin, L.
- Bertrand, B.
- Thonnart, Y.
- Pillonnet, G.
- Billiot, G.
- Jacquinot, H.
- Casse, M.
- Barraud, S.
- Kim, Y.-J.
- Mazzocchi, V.
- Amisse, A.
- Bohuslavskyi, H.
- Bourdet, L.
- Crippa, A.
- Jehl, X.
- Maurand, R.
- Niquet, Y.-M.
- Sanquer, M.
- Venitucci, B.
- Jadot, B.
- Chanrion, E.
- Mortemousque, P.-A.
- Spence, C.
- Urdampilleta, M.
- De Franceschi, S.
- Vinet, M.
2019
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2021 Symposium on VLSI Technology, 2021, p.1-2
2021
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1st ed. 2021., 2021
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Mechanical behavior of the KSTAR central solenoid preloading structure according to the coil current
2015
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1, 2012
Link zum Volltext
2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2021, p.9297-9306
2021
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2012 Symposium on VLSI Technology (VLSIT), 2012, p.151-152
- Hyung Dong Lee
- Kim, S. G.
- Cho, K.
- Hwang, H.
- Choi, H.
- Lee, J.
- Lee, S. H.
- Lee, H. J.
- Suh, J.
- Chung, S.
- Kim, Y. S.
- Kim, K. S.
- Nam, W. S.
- Cheong, J. T.
- Kim, J. T.
- Chae, S.
- Hwang, E.
- Park, S. N.
- Sohn, Y. S.
- Lee, C. G.
- Shin, H. S.
- Lee, K. J.
- Hong, K.
- Jeong, H. G.
- Rho, K. M.
- Kim, Y. K.
- Nickel, J.
- Yang, J. J.
- Cho, H. S.
- Perner, F.
- Williams, R. S.
- Lee, J. H.
- Park, S. K.
- Hong, S.
2012
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Air Pollution Modeling and its Application XXVIII, p.287-293
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Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005, 2005, p.34-35
2005
- Link zum Volltext
1, 2014
Link zum Volltext
2019 IEEE International Electron Devices Meeting (IEDM), 2019, p.2.2.1-2.2.4
2019
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