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2012 Conference on Lasers and Electro-Optics (CLEO), 2012, p.1-2
2012
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IVEC 2012, 2012, p.223-224
2012
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IVEC 2012, 2012, p.221-222
2012
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IVEC 2012, 2012, p.219-220
2012
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2010 IEEE International Vacuum Electronics Conference (IVEC), 2010, p.389-390
2010
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ICASSP 2022 - 2022 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP), 2022, p.8477-8481
2022
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2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2019, p.1239-1242
2019
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2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2020, Vol.1, p.1351-1354
2020
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Evolutionary Computation in Combinatorial Optimization, 2023, Vol.13987, p.1-15
2023
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2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2018, p.195-200
2018
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A >150dB dynamic range, enhanced input swing, high precision current mirror in 180nm CMOS technology
2023
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Computer Safety, Reliability, and Security, p.65-80
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Computer Vision – ECCV 2018 Workshops, p.689-701
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CONCUR 2003 - Concurrency Theory, 2003, p.144-158
2003
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Computer Safety, Reliability, and Security, p.90-108
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2019 IEEE International Solid- State Circuits Conference - (ISSCC), 2019, p.322-324
2019
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2020 IEEE Sensors, 2020, p.1-4
2020
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MATEC Web of Conferences, 2018, Vol.165, p.22026
2018
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2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2020, p.163-168
2020
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2019 IEEE SENSORS, 2019, p.1-4
2019
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EPJ Web of Conferences, 2018, Vol.176, p.10007
- Newchurch, Michael J.
- Alvarez, Raul J.
- Berkoff, Timothy A.
- Carrion, William
- DeYoung, Russell J.
- Ganoe, Rene
- Gronoff, Guillaume
- Kirgis, Guillaume
- Kuang, Shi
- Langford, Andy O.
- Leblanc, Thierry
- McGee, Thomas J.
- Pliutau, Denis
- Senff, Christoph
- Sullivan, John T.
- Sumnicht, Grant
- Twigg, Laurence W.
- Wang, Lihua
- Comeron, A.
- Makoto, A.
- Vassilis, A.
- Balis, D.
- Nicolae, D.
- Gibert, F.
- Behrendt, A.
- Landulfo, E.
- Wandinger, U.
- Senff, C.
- Veselovskii, I.
- McCormick, M.P.
2018
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Proceedings of the 23rd Conference on Design, Automation and Test in Europe, 2020, p.163-168
2020
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Euro-Par 2016: Parallel Processing, p.171-182
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Proceedings of the Third International Afro-European Conference for Industrial Advancement — AECIA 2016, 2017, p.149-158
2017
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023, p.1-2
- Schon, Guillaume
- Bourke, Denis
- Doisneau, Pierre-Antoine
- Finateu, Thomas
- Gonzalez, Adrien
- Hanajima, Naoyuki
- Hitana, Tahar
- Vuuren, Lucas Janse Van
- Kadry, Moataz
- Laurent, Charles
- Goff, Florian Le
- Matolin, Daniel
- Mezaour, Adel
- Michel, Benoit
- Naguleswaran, Thulaxan
- Opperman, Tjaart
- Perrin, Patrice
- Reynaud, Etienne
- Shahrokhi, Farzaneh
- Tahachouite, Hiba
- Tianfan, Chen
- Branden, Gerd Van Den
- Ziram, Akli
- Jaffard, Jean-Luc
- Posch, Christoph
2023
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