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Influence of screening on calculations on the total energy of calcium oxide

Technical physics letters, 1999-04, Vol.25 (4), p.278-279

1999

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Energy dependence of aluminum diffusion in α-Fe under ion irradiation

Technical physics letters, 2011-08, Vol.37 (8), p.780-783

2011

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Argon-oxygen ion-plasma treatment modifies the surface composition and photoluminescence spectrum of porous silicon

Technical physics letters, 2000-01, Vol.26 (10), p.919-922

2000

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Effect of the physicochemical properties of the point material on the surface modification by voltage pulses in a scanning tunneling microscope

Technical physics letters, 2000-01, Vol.26 (5), p.375-376

2000

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Influence of tip vibration on the probability of surface modification by a voltage pulse in a scanning tunneling microscope

Technical physics letters, 1998-08, Vol.24 (8), p.599-600

1998

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Photonic crystals based on natural oceanic biominerals

Technical physics letters, 2008-08, Vol.34 (8), p.633-635

2008

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Structural transformations in nanoglobular carbon under the action of pulsed high-energy-density electron beam

Technical physics letters, 2012-04, Vol.38 (4), p.301-303

2012

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A New Approach to TOF-SIMS Analysis of the Phase Composition of Carbon-Containing Materials

Technical physics letters, 2019, Vol.45 (1), p.48-52

2019

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New Cluster Secondary Ions for Quantitative Analysis of the Concentration of Boron Atoms in Diamond by Time-of-Flight Secondary-Ion Mass Spectrometry

Technical physics letters, 2018-04, Vol.44 (4), p.297-300

2018

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The Use of Pulsed Laser Annealing to Form Ohmic Mo/Ti Contacts to Diamond

Technical physics letters, 2020-06, Vol.46 (6), p.551-555

2020

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A New Limitation of the Depth Resolution in TOF-SIMS Elemental Profiling: the Influence of a Probing Ion Beam

Technical physics letters, 2018-04, Vol.44 (4), p.320-323

2018

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SIMS Analysis of Carbon-Containing Materials: Content of Carbon Atoms in sp2 and sp3 Hybridization States

Technical physics letters, 2020, Vol.46 (3), p.290-294

2020

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Selective analysis of the elemental composition of InGaAs/GaAs nanoclusters by secondary ion mass spectrometry

Technical physics letters, 2017-05, Vol.43 (5), p.477-480

2017

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Formation of a Ni3Al Intermetallic Coating by Cold Spray Deposition of a Ni–Al Powder Mixture Mechanically Processed in a Planetary Mill

Technical physics letters, 2023-04, Vol.49 (4), p.33-36

2023

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Extremely deep profiling analysis of the atomic composition of thick (>100 μm) GaAs layers within power PIN diodes by secondary ion mass spectrometry

Technical physics letters, 2016-08, Vol.42 (8), p.783-787

2016

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Nonlinear calibration curves in secondary ion mass spectrometry for quantitative analysis of gesi heterostructures with nanoclusters

Technical physics letters, 2016-03, Vol.42 (3), p.243-247

2016

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A new approach to the diagnostics of nanoislands in GexSi1 − x/Si heterostructures by secondary ion mass spectrometry

Technical physics letters, 2014-07, Vol.40 (7), p.601-605

2014

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Experimental Observation of the Confinement of Atomic Collision Cascades during Ion Sputtering of Porous Silicon

Technical physics letters, 2019-01, Vol.45 (1), p.37-40

2019

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Growing InN films by plasma-assisted metalorganic vapor-phase epitaxy on Al2O3 and YSZ substrates in plasma generated by gyrotron radiation under electron cyclotron resonance conditions

Technical physics letters, 2013, Vol.39 (1), p.51-54

2013

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Depth profiling of fullerene-containing structures by time-of-flight secondary ion mass spectrometry

Technical physics letters, 2013-12, Vol.39 (12), p.1097-1100

2013

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Formation of Multilayered Nanostructures of NV Sites in Single-Crystal CVD Diamond

Technical physics letters, 2020-07, Vol.46 (7), p.641-645

2020

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Single-crystal GaN/AlN layers on CVD diamond

Technical physics letters, 2015-10, Vol.41 (10), p.954-956

2015

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A new alternative to secondary CsM+ ions for depth profiling of multilayer metal structures by secondary ion mass spectrometry

Technical physics letters, 2013, Vol.39 (1), p.46-50

2013

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Changes in the elemental composition and microstructure of an YBa2Cu3O7 − δ target during magnetron sputtering

Technical physics letters, 2013-10, Vol.39 (10), p.862-865

2013

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High-rate growth of InN films on fianite and sapphire substrates by metalorganic vapor phase epitaxy with plasma-assisted nitrogen activation

Technical physics letters, 2015-03, Vol.41 (3), p.266-269

2015

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Influence of screening on calculations on the total energy of calcium oxide

Energy dependence of aluminum diffusion in α-Fe under ion irradiation

Argon-oxygen ion-plasma treatment modifies the surface composition and photoluminescence spectrum of porous silicon

Effect of the physicochemical properties of the point material on the surface modification by voltage pulses in a scanning tunneling microscope

Influence of tip vibration on the probability of surface modification by a voltage pulse in a scanning tunneling microscope

Photonic crystals based on natural oceanic biominerals

Structural transformations in nanoglobular carbon under the action of pulsed high-energy-density electron beam

A New Approach to TOF-SIMS Analysis of the Phase Composition of Carbon-Containing Materials

New Cluster Secondary Ions for Quantitative Analysis of the Concentration of Boron Atoms in Diamond by Time-of-Flight Secondary-Ion Mass Spectrometry

The Use of Pulsed Laser Annealing to Form Ohmic Mo/Ti Contacts to Diamond

A New Limitation of the Depth Resolution in TOF-SIMS Elemental Profiling: the Influence of a Probing Ion Beam

SIMS Analysis of Carbon-Containing Materials: Content of Carbon Atoms in sp2 and sp3 Hybridization States

Selective analysis of the elemental composition of InGaAs/GaAs nanoclusters by secondary ion mass spectrometry

Formation of a Ni3Al Intermetallic Coating by Cold Spray Deposition of a Ni–Al Powder Mixture Mechanically Processed in a Planetary Mill

Extremely deep profiling analysis of the atomic composition of thick (>100 μm) GaAs layers within power PIN diodes by secondary ion mass spectrometry

Nonlinear calibration curves in secondary ion mass spectrometry for quantitative analysis of gesi heterostructures with nanoclusters

A new approach to the diagnostics of nanoislands in GexSi1 − x/Si heterostructures by secondary ion mass spectrometry

Experimental Observation of the Confinement of Atomic Collision Cascades during Ion Sputtering of Porous Silicon

Growing InN films by plasma-assisted metalorganic vapor-phase epitaxy on Al2O3 and YSZ substrates in plasma generated by gyrotron radiation under electron cyclotron resonance conditions

Depth profiling of fullerene-containing structures by time-of-flight secondary ion mass spectrometry

Formation of Multilayered Nanostructures of NV Sites in Single-Crystal CVD Diamond

Single-crystal GaN/AlN layers on CVD diamond

A new alternative to secondary CsM+ ions for depth profiling of multilayer metal structures by secondary ion mass spectrometry

Changes in the elemental composition and microstructure of an YBa2Cu3O7 − δ target during magnetron sputtering

High-rate growth of InN films on fianite and sapphire substrates by metalorganic vapor phase epitaxy with plasma-assisted nitrogen activation

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