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Dielectric function representation by B-splines

Physica status solidi. A, Applications and materials science, 2008-04, Vol.205 (4), p.715-719

2008

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Spectroscopic ellipsometry characterization of multilayer optical coatings

Surface & coatings technology, 2019-01, Vol.357, p.114-121

2019

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Prospects for IR emissivity control using electrochromic structures

Thin solid films, 1999-02, Vol.339 (1-2), p.174-180

1999

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Visible and infrared optical constants of electrochromic materials for emissivity modulation applications

Thin solid films, 1998-02, Vol.313 (1-2), p.205-209

1998

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Application of a B-spline model dielectric function to infrared spectroscopic ellipsometry data analysis

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2020-01, Vol.38 (1)

2020

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Determining thickness and refractive index from free-standing ultra-thin polymer films with spectroscopic ellipsometry

Applied surface science, 2017-11, Vol.421 (B), p.508-512

2017

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Estimating Depolarization with the Jones Matrix Quality Factor

Applied surface science, 2017-11, Vol.421, p.494-499

2017

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Determining thickness and refractive index from free-standing ultra-thin polymer films with spectroscopic ellipsometry

Applied surface science, 2017-11, Vol.421 (PB)

2017

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Oxygen plasma asher contamination: An analysis of sources and remedies

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1996-11, Vol.14 (6), p.3075-3081

1996

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Degradation of thin films: comparison between low Earth orbit experiments and laboratory simulations of the space environment

Thin solid films, 1994-04, Vol.241 (1), p.218-221

1994

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Thin film materials exposure to low Earth orbit aboard Space Shuttle

Journal of spacecraft and rockets, 1995-01, Vol.32 (1), p.97-102

1995

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Low earth simulation and materials characterization

Journal of spacecraft and rockets, 1993-01, Vol.30 (1), p.116-119

1993

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Errata-Low Earth Orbit Simulation and Materials Characterization

Journal of spacecraft and rockets, 1993-11, Vol.30 (6), p.788-788

1993

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Low-Earth-orbit exposure of carbon-based materials aboard Shuttle flight STS-46

Journal of spacecraft and rockets, 1995-11, Vol.32 (6), p.1015-1017

1995

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Through-the-glass optical metrology for mapping 60 cm × 120 cm CdTe photovoltaic panels in off-line and on-line configurations

2012 38th IEEE Photovoltaic Specialists Conference, 2012, p.000377-000381

2012

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Infrared emittance modulation devices using electrochromic crystalline tungsten oxide, polymer conductor, and nickel oxide

Thin solid films, 1999-11, Vol.355-356, p.26-34

1999

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Prospects for IR emissivity control using electrochromic structures 1Presentented at the ICMCTF ’97 Conference, San Diego, CA, USA, April 1997. 1

Thin solid films, 1999-02, Vol.339 (1-2), p.174-180

1999

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Optical constants of crystalline WO3 deposited by magnetron sputtering

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1999-09, Vol.17 (5), p.2906-2910

1999

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Optical constants of crystalline WO 3 deposited by magnetron sputtering

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1999-09, Vol.17 (5), p.2906-2910

1999

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Microstructural characterization of SiO x surface contaminants on ashed aluminum thin films

Surface & coatings technology, 1997, Vol.90 (1), p.150-155

1997

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In-situ ellipsometric characterization of the electrodeposition of metal films

Thin solid films, 1995-12, Vol.270 (1), p.73-77

1995

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Characterizing Thin Films in the Flat Panel Display Industry with Variable Angle Spectroscopic Ellipsometry (VASE®)

SID International Symposium Digest of technical papers, 1998-05, Vol.29 (1), p.491-494

1998

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Microstructural characterization of SiOx surface contaminants on ashed aluminum thin films

Surface & coatings technology, 1997-03, Vol.90 (1-2), p.150-155

1997

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Low Earth orbit effects on indium tin oxide and polyester and comparison with laboratory simulations

Surface & coatings technology, 1993-12, Vol.62 (1), p.499-503

1993

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Atomic Oxygen Plasma Effects on Cvd Deposited Diamond-Like Carbon Films

MRS proceedings, 1991, Vol.236, Article 307

1991

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Dielectric function representation by B-splines

Spectroscopic ellipsometry characterization of multilayer optical coatings

Prospects for IR emissivity control using electrochromic structures

Visible and infrared optical constants of electrochromic materials for emissivity modulation applications

Application of a B-spline model dielectric function to infrared spectroscopic ellipsometry data analysis

Determining thickness and refractive index from free-standing ultra-thin polymer films with spectroscopic ellipsometry

Estimating Depolarization with the Jones Matrix Quality Factor

Determining thickness and refractive index from free-standing ultra-thin polymer films with spectroscopic ellipsometry

Oxygen plasma asher contamination: An analysis of sources and remedies

Degradation of thin films: comparison between low Earth orbit experiments and laboratory simulations of the space environment

Thin film materials exposure to low Earth orbit aboard Space Shuttle

Low earth simulation and materials characterization

Errata-Low Earth Orbit Simulation and Materials Characterization

Low-Earth-orbit exposure of carbon-based materials aboard Shuttle flight STS-46

Through-the-glass optical metrology for mapping 60 cm × 120 cm CdTe photovoltaic panels in off-line and on-line configurations

Infrared emittance modulation devices using electrochromic crystalline tungsten oxide, polymer conductor, and nickel oxide

Prospects for IR emissivity control using electrochromic structures 1Presentented at the ICMCTF ’97 Conference, San Diego, CA, USA, April 1997. 1

Optical constants of crystalline WO3 deposited by magnetron sputtering

Optical constants of crystalline WO 3 deposited by magnetron sputtering

Microstructural characterization of SiO x surface contaminants on ashed aluminum thin films

In-situ ellipsometric characterization of the electrodeposition of metal films

Characterizing Thin Films in the Flat Panel Display Industry with Variable Angle Spectroscopic Ellipsometry (VASE®)

Microstructural characterization of SiOx surface contaminants on ashed aluminum thin films

Low Earth orbit effects on indium tin oxide and polyester and comparison with laboratory simulations

Atomic Oxygen Plasma Effects on Cvd Deposited Diamond-Like Carbon Films

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