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Phosphors for LED-based light sources: Thermal properties and reliability issues

Microelectronics and reliability, 2012-09, Vol.52 (9-10), p.2164-2167

2012

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Optical losses in single-mode laser diodes

Microelectronics and reliability, 2013-09, Vol.53 (9-11), p.1529-1533

2013

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The role of the optical trans-characteristics in laser diode analysis

Microelectronics and reliability, 2013-09, Vol.53 (9-11), p.1538-1542

2013

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Peculiar failure mechanisms in GaN power transistors

Microelectronics and reliability, 2020-11, Vol.114, p.113896, Article 113896

2020

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FIB-induced electro-optical alterations in a DFB InP laser diode

Microelectronics and reliability, 2014-09, Vol.54 (9-10), p.2151-2153

2014

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XEBIC at the Dual Beam

Microelectronics and reliability, 2013-09, Vol.53 (9-11), p.1399-1402

2013

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The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis

Microelectronics and reliability, 2010-04, Vol.50 (4), p.471-478

2010

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Failure Analysis-assisted FMEA

Microelectronics and reliability, 2006-09, Vol.46 (9), p.1795-1799

2006

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Sulfur-contamination of high power white LED

Microelectronics and reliability, 2008-08, Vol.48 (8), p.1208-1211

2008

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“Hot-plugging” of LED modules: Electrical characterization and device degradation

Microelectronics and reliability, 2013-09, Vol.53 (9-11), p.1524-1528

2013

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Lot reliability issues in commercial off the shelf (COTS) microelectronic devices

Microelectronics and reliability, 2009-09, Vol.49 (9), p.1196-1199

2009

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An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy

IEEE transactions on instrumentation and measurement, 2008-05, Vol.57 (5), p.989-996

2008

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Further improvements of an extended Hakki-Paoli method

Microelectronics and reliability, 2018-09, Vol.88-90, p.859-863

2018

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High brightness GaN LEDs degradation during dc and pulsed stress

Microelectronics and reliability, 2006-09, Vol.46 (9), p.1720-1724

2006

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An original DoE-based tool for silicon photodetectors EoL estimation in space environments

Microelectronics and reliability, 2011-09, Vol.51 (9-11), p.1999-2003

2011

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A physically based mobility model for numerical simulation of nonplanar devices

IEEE transactions on computer-aided design of integrated circuits and systems, 1988-11, Vol.7 (11), p.1164-1171

1988

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Implementation of a "Design of Experiments" Methodology for the Prediction of Phototransistor Degradation in a Space Environment

IEEE transactions on nuclear science, 2009-08, Vol.56 (4), p.2465-2472

2009

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Reliability predictions in electronic industrial applications

Microelectronics and reliability, 2005-09, Vol.45 (9), p.1321-1326

2005

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Improvements in automated photometric stereo 3D SEM

Microscopy and microanalysis, 2008-08, Vol.14 (S2), p.608-609

2008

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Optical gain in laser diodes with null reflectivity

Microelectronics and reliability, 2019-09, Vol.100-101, p.113455, Article 113455

2019

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Reliability of visible GaN LEDs in plastic package

Microelectronics and reliability, 2003-09, Vol.43 (9), p.1737-1742

2003

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SEM Remote Control with a 3D Option

Microscopy and microanalysis, 2008-08, Vol.14 (S2), p.892-893

2008

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ESD tests on 850nm GaAs-based VCSELs

Microelectronics and reliability, 2016-09, Vol.64, p.617-622

2016

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Quantitative 3D reconstruction from BS imaging

Microelectronics and reliability, 2004-09, Vol.44 (9), p.1547-1552

2004

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Clamp voltage and ideality factor in laser diodes

Microelectronics and reliability, 2015-08, Vol.55 (9-10), p.1736-1740

2015

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Phosphors for LED-based light sources: Thermal properties and reliability issues

Optical losses in single-mode laser diodes

The role of the optical trans-characteristics in laser diode analysis

Peculiar failure mechanisms in GaN power transistors

FIB-induced electro-optical alterations in a DFB InP laser diode

XEBIC at the Dual Beam

The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis

Failure Analysis-assisted FMEA

Sulfur-contamination of high power white LED

“Hot-plugging” of LED modules: Electrical characterization and device degradation

Lot reliability issues in commercial off the shelf (COTS) microelectronic devices

An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy

Further improvements of an extended Hakki-Paoli method

High brightness GaN LEDs degradation during dc and pulsed stress

An original DoE-based tool for silicon photodetectors EoL estimation in space environments

A physically based mobility model for numerical simulation of nonplanar devices

Implementation of a "Design of Experiments" Methodology for the Prediction of Phototransistor Degradation in a Space Environment

Reliability predictions in electronic industrial applications

Improvements in automated photometric stereo 3D SEM

Optical gain in laser diodes with null reflectivity

Reliability of visible GaN LEDs in plastic package

SEM Remote Control with a 3D Option

ESD tests on 850nm GaAs-based VCSELs

Quantitative 3D reconstruction from BS imaging

Clamp voltage and ideality factor in laser diodes

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