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Microelectronics and reliability, 2012-03, Vol.52 (3), p.530-533
2012
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Microelectronics and reliability, 2012-09, Vol.52 (9-10), p.1848-1852
2012
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Microelectronics and reliability, 2012, Vol.52 (1), p.39-70
2012
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Journal of electronic materials, 2011-01, Vol.40 (1), p.42-50
2011
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Journal of electronic materials, 2013-12, Vol.42 (12), p.3582-3592
2013
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Solid-state electronics, 2012-12, Vol.78, p.159-165
2012
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Journal of electronic materials, 2014-04, Vol.43 (4), p.947-961
2014
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Journal of electronic materials, 2014-08, Vol.43 (8), p.2788-2794
2014
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Solid-state electronics, 2011-11, Vol.65-66, p.33-37
2011
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Microelectronic engineering, 2014-09, Vol.127, p.44-50
2014
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Solid-state electronics, 2013-04, Vol.82, p.103-110
2013
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Microelectronics and reliability, 2013-01, Vol.53 (1), p.90-104
2013
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Journal of materials science. Materials in electronics, 2009-09, Vol.20 (9), p.789-834
2009
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Journal of materials science. Materials in electronics, 2007-10, Vol.18 (S1), p.15-19
2007
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Journal of electronic materials, 2012, Vol.41 (1), p.153-158
2012
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IEEE transactions on electron devices, 2012-07, Vol.59 (7), p.1813-1828
2012
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Journal of materials science. Materials in electronics, 2011-09, Vol.22 (9), p.1313-1320
2011
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Microelectronic engineering, 2013-12, Vol.112, p.35-40
2013
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Journal of materials science. Materials in electronics, 2013-10, Vol.24 (10), p.4060-4067
2013
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Journal of electronic materials, 2014-06, Vol.43 (6), p.1733-1739
2014
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Journal of electronic materials, 2008-09, Vol.37 (9), p.1406-1410
2008
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Solid-state electronics, 2011-06, Vol.60 (1), p.2-6
2011
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Solid-state electronics, 2013-11, Vol.89, p.177-188
2013
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Journal of materials science. Materials in electronics, 2007-03, Vol.18 (1-3), p.155-174
2007
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Solid-state electronics, 2011-09, Vol.63 (1), p.37-41
2011
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