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IEEE transactions on device and materials reliability, 2016-03, Vol.16 (1), p.80-97
2016
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IEEE transactions on device and materials reliability, 2010-12, Vol.10 (4), p.460-475
2010
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IEEE transactions on device and materials reliability, 2019-09, Vol.19 (3), p.563-567
2019
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IEEE transactions on device and materials reliability, 2024-03, Vol.24 (1), p.98-104
2024
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IEEE transactions on device and materials reliability, 2012-06, Vol.12 (2), p.482-493
2012
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IEEE transactions on device and materials reliability, 2012-06, Vol.12 (2), p.470-477
2012
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Solid state technology, 1998-04, Vol.41 (4), p.67-74
1998
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IEEE transactions on device and materials reliability, 2014-06, Vol.14 (2), p.751-756
2014
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Solid state technology, 1997-10, Vol.40 (10), p.90-96
1997
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Solid state technology, 1998-08, Vol.41 (8), p.53-58
1998
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Solid state technology, 1998-07, Vol.41 (7), p.133-136
1998
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IEEE transactions on device and materials reliability, 2017-09, Vol.17 (3), p.531-538
2017
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Solid state technology, 2017-09
2017
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IEEE transactions on device and materials reliability, 2017-12, Vol.17 (4), p.692-697
2017
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IEEE transactions on device and materials reliability, 2018-06, Vol.18 (2), p.214-223
2018
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Solid state technology, 2012-09, Vol.55 (7), p.6-10
2012
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Solid state technology, 2012-03, Vol.55 (2), p.8-8
2012
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IEEE transactions on device and materials reliability, 2016-12, Vol.16 (4), p.647-666
2016
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IEEE transactions on device and materials reliability, 2011-12, Vol.11 (4), p.531-539
2011
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IEEE transactions on device and materials reliability, 2018-12, Vol.18 (4), p.487-489
2018
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Solid state technology, 2009-07, Vol.52 (7), p.24-26
2009
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Solid state technology, 2008-03, Vol.51 (3), p.36-39
2008
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IEEE transactions on device and materials reliability, 2010-12, Vol.10 (4), p.437-448
2010
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Solid state technology, 1998-10, Vol.41 (10), p.101-110
1998
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IEEE transactions on device and materials reliability, 2005-09, Vol.5 (3), p.317-328
2005
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