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Resistive switching mechanism of TiO2 thin films grown by atomic-layer deposition

Journal of applied physics, 2005-08, Vol.98 (3)

2005

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A large reversible room temperature magneto-caloric effect in Ni-TM-Co-Mn-Sn (TM = Ti, V, Cr) meta-magnetic Heusler alloys

Journal of applied physics, 2018-01, Vol.123 (3)

2018

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The microwave absorbing and resonance phenomena of Y-type hexagonal ferrite microwave absorbers

Journal of applied physics, 1994-05, Vol.75 (10), p.6109-6111

1994

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Effect of top Ru deposition pressure on magnetic and microstructural properties of CoCrPt–SiO2 media in two-step Ru layer

Journal of applied physics, 2006-04, Vol.99 (8)

2006

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Phase-field modeling of stress-induced surface instabilities in heteroepitaxial thin films

Journal of applied physics, 2005-08, Vol.98 (4), p.044910-044910-5

2005

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Using band engineering to tailor the emission spectra of trichromatic semipolar InGaN light-emitting diodes for phosphor-free polarized white light emission

Journal of applied physics, 2016-07, Vol.120 (3)

2016

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A model for the segregation and pileup of boron at the SiO2/Si interface during the formation of ultrashallow p+ junctions

Journal of applied physics, 2001-03, Vol.89 (6), p.3458-3463

2001

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The effect of Mn substitution on the properties of NiCuZn ferrites

Journal of applied physics, 1997-04, Vol.81 (8), p.4794-4796

1997

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The multilayer-modified Stoney’s formula for laminated polymer composites on a silicon substrate

Journal of applied physics, 1999-11, Vol.86 (10), p.5474-5479

1999

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Imaging ellipsometry study on the Ni-mediated crystallization of a - Si

Journal of applied physics, 2006-12, Vol.100 (11), p.113529-113529-5

2006

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Effects of strain energy on the preferred orientation of TiN thin films

Journal of applied physics, 1993-08, Vol.74 (3), p.1692-1696

1993

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Impact of surface properties on the dielectric breakdown for polycrystalline and multilayered BaTiO3 thin films

Journal of applied physics, 1997-12, Vol.82 (12), p.6203-6208

1997

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Ferromagnetic behavior of p-type GaN epilayer implanted with Fe+ ions

Journal of applied physics, 2004-01, Vol.95 (2), p.761-763

2004

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Electron-paramagnetic-resonance study of the Mn2+ luminescence center in ZnS:Mn powder and thin films

Journal of applied physics, 1996-01, Vol.79 (2), p.1004-1007

1996

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Light-emission phenomena from porous silicon: Siloxene compounds and quantum size effect

Journal of applied physics, 1994-06, Vol.75 (12), p.8060-8065

1994

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Molecular dynamics simulation of electron trapping in sapphire

Journal of applied physics, 1997-04, Vol.81 (7), p.3263-3267

1997

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Decrease of the number of the isolated emission center Mn2+ in an aged ZnS:Mn electroluminescent device

Journal of applied physics, 1995-09, Vol.78 (6), p.4253-4257

1995

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Charge trapping on different cuts of a single-crystalline α-SiO2

Journal of applied physics, 1993-08, Vol.74 (3), p.1944-1948

1993

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Thermal stability dependence on the stacking order and thickness ratio of the CoPt–TiO2∕CoCrPt–SiO2 stacked media

Journal of applied physics, 2008-04, Vol.103 (7)

2008

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Recording physics of perpendicular recording with single layered medium and ring head

Journal of applied physics, 2002-05, Vol.91 (10), p.8700-8702

2002

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Microstructural and electronic properties of Ni thin films grown on p -InP (100) substrates

Journal of applied physics, 2002-04, Vol.91 (7), p.4238-4241

2002

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A Monte Carlo model for trapped charge distribution in electron-irradiated α-quartz

Journal of applied physics, 1993-12, Vol.74 (11), p.6859-6865

1993

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Electromagnetic particle simulation of electron cyclotron resonance microwave discharge

Journal of applied physics, 1993-05, Vol.73 (9), p.4205-4211

1993

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Variation of trapping/detrapping properties as a function of the insulator size

Journal of applied physics, 1993-08, Vol.74 (3), p.1960-1967

1993

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Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope technique

Journal of applied physics, 1993-07, Vol.74 (2), p.1250-1255

1993

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Resistive switching mechanism of TiO2 thin films grown by atomic-layer deposition

A large reversible room temperature magneto-caloric effect in Ni-TM-Co-Mn-Sn (TM = Ti, V, Cr) meta-magnetic Heusler alloys

The microwave absorbing and resonance phenomena of Y-type hexagonal ferrite microwave absorbers

Effect of top Ru deposition pressure on magnetic and microstructural properties of CoCrPt–SiO2 media in two-step Ru layer

Phase-field modeling of stress-induced surface instabilities in heteroepitaxial thin films

Using band engineering to tailor the emission spectra of trichromatic semipolar InGaN light-emitting diodes for phosphor-free polarized white light emission

A model for the segregation and pileup of boron at the SiO2/Si interface during the formation of ultrashallow p+ junctions

The effect of Mn substitution on the properties of NiCuZn ferrites

The multilayer-modified Stoney’s formula for laminated polymer composites on a silicon substrate

Imaging ellipsometry study on the Ni-mediated crystallization of a - Si

Effects of strain energy on the preferred orientation of TiN thin films

Impact of surface properties on the dielectric breakdown for polycrystalline and multilayered BaTiO3 thin films

Ferromagnetic behavior of p-type GaN epilayer implanted with Fe+ ions

Electron-paramagnetic-resonance study of the Mn2+ luminescence center in ZnS:Mn powder and thin films

Light-emission phenomena from porous silicon: Siloxene compounds and quantum size effect

Molecular dynamics simulation of electron trapping in sapphire

Decrease of the number of the isolated emission center Mn2+ in an aged ZnS:Mn electroluminescent device

Charge trapping on different cuts of a single-crystalline α-SiO2

Thermal stability dependence on the stacking order and thickness ratio of the CoPt–TiO2∕CoCrPt–SiO2 stacked media

Recording physics of perpendicular recording with single layered medium and ring head

Microstructural and electronic properties of Ni thin films grown on p -InP (100) substrates

A Monte Carlo model for trapped charge distribution in electron-irradiated α-quartz

Electromagnetic particle simulation of electron cyclotron resonance microwave discharge

Variation of trapping/detrapping properties as a function of the insulator size

Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope technique

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