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Radiation damage to organic and inorganic specimens in the TEM

Micron (Oxford, England : 1993), 2019-04, Vol.119, p.72-87

Egerton, R.F.

2019

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Mechanisms of radiation damage in beam-sensitive specimens, for TEM accelerating voltages between 10 and 300 kV

Microscopy research and technique, 2012-11, Vol.75 (11), p.1550-1556

Egerton, R.F.

2012

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Choice of operating voltage for a transmission electron microscope

Ultramicroscopy, 2014-10, Vol.145, p.85-93

Egerton, R.F.

2014

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Scattering delocalization and radiation damage in STEM-EELS

Ultramicroscopy, 2017-09, Vol.180, p.115-124

Egerton, R.F.

2017

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Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy

Ultramicroscopy, 2007-08, Vol.107 (8), p.575-586

Egerton, R.F.

2007

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Beam-Induced Motion of Adatoms in the Transmission Electron Microscope

Microscopy and microanalysis, 2013-04, Vol.19 (2), p.479-486

Egerton, R.F.

2013

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Delocalized radiation damage in polymers

Micron (Oxford, England : 1993), 2012, Vol.43 (1), p.2-7

2012

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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Egerton, R. F

Second edition., 2016

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Validity of the dipole approximation in TEM-EELS studies

Microscopy research and technique, 2014-10, Vol.77 (10), p.773-778

2014

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Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms

Ultramicroscopy, 2011-06, Vol.111 (7), p.865-876

2011

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Control of radiation damage in the TEM

Ultramicroscopy, 2013-04, Vol.127, p.100-108

Egerton, R.F.

2013

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Dose measurement in the TEM and STEM

Ultramicroscopy, 2021-10, Vol.229, p.113363-113363, Article 113363

Egerton, R.F.

2021

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Voxel dose-limited resolution for thick beam-sensitive specimens imaged in a TEM or STEM

Micron (Oxford, England : 1993), 2024-02, Vol.177, p.103576-103576, Article 103576

Egerton, R F

2024

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Spatial resolution in transmission electron microscopy

Micron (Oxford, England : 1993), 2022-09, Vol.160, p.103304-103304, Article 103304

2022

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Vibrational-loss EELS and the avoidance of radiation damage

Ultramicroscopy, 2015-12, Vol.159, p.95-100

Egerton, R.F.

2015

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Electron Energy-Loss Spectroscopy in the Electron Microscope

Egerton, R. F

Third edition., 2011

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Transmission electron microscopy of thick polymer and biological specimens

Micron (Oxford, England : 1993), 2023-06, Vol.169, p.103449-103449, Article 103449

2023

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Characterization of single-atom catalysts by EELS and EDX spectroscopy

Ultramicroscopy, 2018-10, Vol.193, p.111-117

2018

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Basic questions related to electron-induced sputtering in the TEM

Ultramicroscopy, 2010-07, Vol.110 (8), p.991-997

2010

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Fundamental limit to single-atom analysis by STEM-EDX spectroscopy

Microscopy and microanalysis, 2017-07, Vol.23 (S1), p.380-381

2017

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Damage in electron cryomicroscopy: Lessons from biology for materials science

MRS bulletin, 2019-12, Vol.44 (12), p.935-941

2019

Volltextzugriff (PDF)

Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Egerton, R. F

1, 2010

Volltextzugriff (PDF)

Radiation damage in the TEM and SEM

Micron (Oxford, England : 1993), 2004-01, Vol.35 (6), p.399-409

2004

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Exploiting the Dose-Rate Dependence of Radiolysis – a Future for Cryo-STEM ?

Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.992-993

2019

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Opportunities for Low-Voltage TEM/STEM

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.349-350

R F, Egerton

2015

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Radiation damage to organic and inorganic specimens in the TEM

Mechanisms of radiation damage in beam-sensitive specimens, for TEM accelerating voltages between 10 and 300 kV

Choice of operating voltage for a transmission electron microscope

Scattering delocalization and radiation damage in STEM-EELS

Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy

Beam-Induced Motion of Adatoms in the Transmission Electron Microscope

Delocalized radiation damage in polymers

Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Validity of the dipole approximation in TEM-EELS studies

Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms

Control of radiation damage in the TEM

Dose measurement in the TEM and STEM

Voxel dose-limited resolution for thick beam-sensitive specimens imaged in a TEM or STEM

Spatial resolution in transmission electron microscopy

Vibrational-loss EELS and the avoidance of radiation damage

Electron Energy-Loss Spectroscopy in the Electron Microscope

Transmission electron microscopy of thick polymer and biological specimens

Characterization of single-atom catalysts by EELS and EDX spectroscopy

Basic questions related to electron-induced sputtering in the TEM

Fundamental limit to single-atom analysis by STEM-EDX spectroscopy

Damage in electron cryomicroscopy: Lessons from biology for materials science

Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Radiation damage in the TEM and SEM

Exploiting the Dose-Rate Dependence of Radiolysis – a Future for Cryo-STEM ?

Opportunities for Low-Voltage TEM/STEM

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