UB Paderborn / Katalog / Suche / in CDI

1 – 23 von 23

Sortiert nach

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Analytical chemistry (Washington), 2012-09, Vol.84 (18), p.7865-7873

2012

Link zum Volltext

Verfügbarkeit prüfen

Detection of micro- and nano-particles in animal cells by ToF-SIMS 3D analysis

Surface and interface analysis, 2013-01, Vol.45 (1), p.315-319

2013

Link zum Volltext

Verfügbarkeit prüfen

The 3D OrbiSIMS-label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power

Nature methods, 2017-12, Vol.14 (12), p.1175

2017

Link zum Volltext

Verfügbarkeit prüfen

Ultra high spatial resolution SIMS with cluster ions - approaching the physical limits

Surface and interface analysis, 2013-01, Vol.45 (1), p.312-314

2013

Link zum Volltext

Verfügbarkeit prüfen

Recent Innovations and Perspectives in TOF-SIMS

Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.942-943

2022

Link zum Volltext

Verfügbarkeit prüfen

Improvement of Biological Time-of-Flight-Secondary Ion Mass Spectrometry Imaging with a Bismuth Cluster Ion Source

Journal of the American Society for Mass Spectrometry, 2005-10, Vol.16 (10), p.1608-1618

2005

Link zum Volltext

Verfügbarkeit prüfen

Recent Advances in 2D and 3D TOF SIMS Analysis of Organic and Inorganic Surfaces

Microscopy and microanalysis, 2020-08, Vol.26 (S2), p.76-77

2020

Link zum Volltext

Verfügbarkeit prüfen

OrbiSIMS metrology Part I: Optimisation of the target potential and collision cell pressure

Surface and interface analysis, 2022-04, Vol.54 (4), p.331-340

2022

Link zum Volltext

Verfügbarkeit prüfen

Featured Cover

Surface and interface analysis, 2022-04, Vol.54 (4), p.i-i

2022

Link zum Volltext

Verfügbarkeit prüfen

Surface analysis in the semiconductor industry: Present use and future possibilities

Surface and interface analysis, 2020-12, Vol.52 (12), p.786-791

2020

Link zum Volltext

Verfügbarkeit prüfen

Dual beam depth profiling of organic materials: assessment of capabilities and limitations

Surface and interface analysis, 2014-11, Vol.46 (S1), p.70-73

2014

Link zum Volltext

Verfügbarkeit prüfen

TOF-SIMS Analysis with High Lateral and High Mass Resolution in Parallel

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.1026-1027

2018

Link zum Volltext

Verfügbarkeit prüfen

A Review of Recent Developments in Low Energy Ion Scattering (LEIS) and Its Applications

Microscopy and microanalysis, 2016-07, Vol.22 (S3), p.358-359

2016

Link zum Volltext

Verfügbarkeit prüfen

SFM Assisted In-Situ by ToF-SIMS: Accessing Chemical Information in True Three Dimensions

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.1431-1432

2015

Link zum Volltext

Verfügbarkeit prüfen

In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.2086-2087

2014

Link zum Volltext

Verfügbarkeit prüfen

Molecular weight distributions of polymers using time-of-flight secondary-ion mass spectrometry

Analytical chemistry (Washington), 1991-09, Vol.63 (18), p.1953-1960

1991

Link zum Volltext

Verfügbarkeit prüfen

Label-free 3D analysis of biological tissue with micron spatial and 240k mass resolution using a new SIMS hybrid mass analyser

Frontiers in bioengineering and biotechnology, 2016, Vol.4

2016

Link zum Volltext

Verfügbarkeit prüfen

A Novel Hybrid Dual Analyzer SIMS Instrument for Improved Surface and 3D-Analysis

Microscopy and microanalysis, 2016-07, Vol.22 (S3), p.340-341

2016

Link zum Volltext

Verfügbarkeit prüfen

Application of TOF-SIMS for high precision ion implant dosimetry: Possibilities and limitations

Applied surface science, 2008-12, Vol.255 (4), p.1404-1407

2008

Link zum Volltext

Verfügbarkeit prüfen

Time-of-flight secondary ion mass spectrometry: detection of fragments from thick polymer films in the range m/z .ltoreq. 4500

Analytical chemistry (Washington), 1988-05, Vol.60 (9), p.938-944

1988

Link zum Volltext

Verfügbarkeit prüfen

Time-of-flight secondary ion mass spectrometry: detection of fragments from thick polymer films in the range m/z≤4500

Analytical chemistry (Washington), 1988-05, Vol.60 (9), p.938-944

1988

Link zum Volltext

Verfügbarkeit prüfen

Chemoreceptor Diversity in Apoid Wasps and Its Reduction during the Evolution of the Pollen-Collecting Lifestyle of Bees (Hymenoptera: Apoidea)

Genome biology and evolution, 2021-03, Vol.13 (3)

2021

Link zum Volltext

Verfügbarkeit prüfen

Numerical Studies of Turbulent Flow Influence on a Two-Element Airfoil

Advances in Simulation of Wing and Nacelle Stall, 2016, p.111-135

2016

Link zum Volltext

Verfügbarkeit prüfen

1 – 23 von 23

Suche als RSS-Feed

Aktive Filter

Zeitschrift / SerieRapid Communications In Mass Spectrometry

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(22)
Mit Volltextzugriff
(22)

Publikationsform

Artikel
(22)
Buchkapitel
(1)

Sprache

Englisch
(23)
Japanisch
(4)

Erscheinungsjahr

n.n

Zeitschrift / Serie

3 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Detection of micro- and nano-particles in animal cells by ToF-SIMS 3D analysis

The 3D OrbiSIMS-label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power

Ultra high spatial resolution SIMS with cluster ions - approaching the physical limits

Recent Innovations and Perspectives in TOF-SIMS

Improvement of Biological Time-of-Flight-Secondary Ion Mass Spectrometry Imaging with a Bismuth Cluster Ion Source

Recent Advances in 2D and 3D TOF SIMS Analysis of Organic and Inorganic Surfaces

OrbiSIMS metrology Part I: Optimisation of the target potential and collision cell pressure

Featured Cover

Surface analysis in the semiconductor industry: Present use and future possibilities

Dual beam depth profiling of organic materials: assessment of capabilities and limitations

TOF-SIMS Analysis with High Lateral and High Mass Resolution in Parallel

A Review of Recent Developments in Low Energy Ion Scattering (LEIS) and Its Applications

SFM Assisted In-Situ by ToF-SIMS: Accessing Chemical Information in True Three Dimensions

In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures

Molecular weight distributions of polymers using time-of-flight secondary-ion mass spectrometry

Label-free 3D analysis of biological tissue with micron spatial and 240k mass resolution using a new SIMS hybrid mass analyser

A Novel Hybrid Dual Analyzer SIMS Instrument for Improved Surface and 3D-Analysis

Application of TOF-SIMS for high precision ion implant dosimetry: Possibilities and limitations

Time-of-flight secondary ion mass spectrometry: detection of fragments from thick polymer films in the range m/z .ltoreq. 4500

Time-of-flight secondary ion mass spectrometry: detection of fragments from thick polymer films in the range m/z≤4500

Chemoreceptor Diversity in Apoid Wasps and Its Reduction during the Evolution of the Pollen-Collecting Lifestyle of Bees (Hymenoptera: Apoidea)

Numerical Studies of Turbulent Flow Influence on a Two-Element Airfoil

Aktive Filter

Suchergebnisse filtern