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Enhancement of hydrogen storage capacity in polyaniline-vanadium pentoxide nanocomposites

International journal of hydrogen energy, 2010-02, Vol.35 (3), p.1300-1304

2010

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Electrical and structural properties of high-k Er-silicate gate dielectric formed by interfacial reaction between Er and SiO2 films

Applied physics letters, 2007-07, Vol.91 (1)

2007

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Electrical quadruple hysteresis in Pd-doped vanadium pentoxide nanowires due to water adsorption

Science and technology of advanced materials, 2010-12, Vol.11 (6), p.065003-065003

2010

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Structural and Electrical Properties of High Pressure Hydrogen Post-Annealed Pt-Er Alloy Metal Gate on HfO2 Film

ECS transactions, 2007, Vol.6 (1), p.295-301

2007

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Fabrication technology for improving pattern quality in focusing waveguide grating coupler manufacture

Microelectronic engineering, 2003-03, Vol.65 (3), p.307-318, Article 307

2003

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Magnetic properties of amorphous (Fe1-xNix)75Si10B15 alloys

Materials science & engineering. A, Structural materials : properties, microstructure and processing, 1991-03, Vol.133, p.216-219

1991

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Ferromagnetic resonance of amorphous Fe–Hf thin films

Journal of applied physics, 2000-05, Vol.87 (9), p.5251-5253

2000

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Production of large-scale, freestanding vanadium pentoxide nanobelt porous structures

Nanoscale, 2012-01, Vol.4 (5), p.1636-164

2012

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Electrical current suppression in Pd-doped vanadium pentoxide nanowires caused by reduction in PdO due to hydrogen exposure

Applied physics letters, 2010-04, Vol.96 (16), p.163111-163111-3

2010

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The Observation of Electrical Hysteric Behavior in Synthesized V2 O5 Nanoplates by Recrystallization

Journal of nanomaterials, 2013-01, Vol.2013

2013

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The Observation of Electrical Hysteric Behavior in Synthesized V 2 O 5 Nanoplates by Recrystallization

Journal of nanomaterials, 2013-01, Vol.2013 (1)

2013

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The Observation of Electrical Hysteric Behavior in Synthesized V2O5 Nanoplates by Recrystallization

Journal of nanomaterials, 2013-01, Vol.2013 (2013), p.1-7

2013

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Electrical and structural properties of high- k Er-silicate gate dielectric formed by interfacial reaction between Er and Si O 2 films

Applied physics letters, 2007-07, Vol.91 (1), p.012903-012903-3

2007

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Electrical and structural properties of high-k Er-silicate gate dielectric formed by interfacial reaction between Er and SiO{sub 2} films

Applied physics letters, 2007-07, Vol.91 (1)

2007

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Spin wave stiffness constant of amorphous (Co1−xNix)75Si10B15 alloys

Materials science & engineering. A, Structural materials : properties, microstructure and processing, 1994-05, Vol.181-182, p.941-945

1994

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FMR study of Zr oxidation effect for amorphous Co sub(77)Zr sub(23) thin film

Journal of magnetism and magnetic materials, 2001-05, Vol.226, p.487-489

2001

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FMR study of Zr oxidation effect for amorphous Co 77Zr 23 thin film

Journal of magnetism and magnetic materials, 2001, Vol.226, p.487-489

2001

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Effects of High-Pressure Hydrogen Postannealing on the Electrical and Structural Properties of the Pt-Er Alloy Metal Gate on HfO[sub 2] Film

Electrochemical and solid-state letters, 2006, Vol.9 (7), p.G228

2006

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Erratum to: “Fabrication technology for improving pattern quaility in focusing waveguide grating coupler manufacture”: [Microelect. Eng. 65 (2003) 307–318]

Microelectronic engineering, 2003-05, Vol.65 (4), p.498-499

2003

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Microwave absorption in magnetic bilayers

Journal of magnetism and magnetic materials, 2001-05, Vol.226, p.515-517

2001

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FMR study of Zr oxidation effect for amorphous Co77Zr23 thin film

Journal of magnetism and magnetic materials, 2001-05, Vol.226-230, p.487-489

2001

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Schottky Barrier MOSFETs with High Current Drivability for Nano-regime Applications

Journal of semiconductor technology and science, 2006, Vol.6 (1), p.10-15

2006

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Characteristics of Schottky Diode and Schottky Barrier Metal-Oxide-Semiconductor Field-Effect Transistors

Journal of semiconductor technology and science, 2005, Vol.5 (2), p.69-76

2005

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Novel properties of erbium-silicided n-type Schottky barrier metal-oxide-semiconductor field-effect transistors

Journal of semiconductor technology and science, 2004, Vol.4 (2), p.94-99

2004

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Spin wave resonance of amorphous Co1−xZrx thin films

Journal of applied physics, 1999-04, Vol.85 (8), p.6004-6006

1999

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Enhancement of hydrogen storage capacity in polyaniline-vanadium pentoxide nanocomposites

Electrical and structural properties of high-k Er-silicate gate dielectric formed by interfacial reaction between Er and SiO2 films

Electrical quadruple hysteresis in Pd-doped vanadium pentoxide nanowires due to water adsorption

Structural and Electrical Properties of High Pressure Hydrogen Post-Annealed Pt-Er Alloy Metal Gate on HfO2 Film

Fabrication technology for improving pattern quality in focusing waveguide grating coupler manufacture

Magnetic properties of amorphous (Fe1-xNix)75Si10B15 alloys

Ferromagnetic resonance of amorphous Fe–Hf thin films

Production of large-scale, freestanding vanadium pentoxide nanobelt porous structures

Electrical current suppression in Pd-doped vanadium pentoxide nanowires caused by reduction in PdO due to hydrogen exposure

The Observation of Electrical Hysteric Behavior in Synthesized V2 O5 Nanoplates by Recrystallization

The Observation of Electrical Hysteric Behavior in Synthesized V 2 O 5 Nanoplates by Recrystallization

The Observation of Electrical Hysteric Behavior in Synthesized V2O5 Nanoplates by Recrystallization

Electrical and structural properties of high- k Er-silicate gate dielectric formed by interfacial reaction between Er and Si O 2 films

Electrical and structural properties of high-k Er-silicate gate dielectric formed by interfacial reaction between Er and SiO{sub 2} films

Spin wave stiffness constant of amorphous (Co1−xNix)75Si10B15 alloys

FMR study of Zr oxidation effect for amorphous Co sub(77)Zr sub(23) thin film

FMR study of Zr oxidation effect for amorphous Co 77Zr 23 thin film

Effects of High-Pressure Hydrogen Postannealing on the Electrical and Structural Properties of the Pt-Er Alloy Metal Gate on HfO[sub 2] Film

Erratum to: “Fabrication technology for improving pattern quaility in focusing waveguide grating coupler manufacture”: [Microelect. Eng. 65 (2003) 307–318]

Microwave absorption in magnetic bilayers

FMR study of Zr oxidation effect for amorphous Co77Zr23 thin film

Schottky Barrier MOSFETs with High Current Drivability for Nano-regime Applications

Characteristics of Schottky Diode and Schottky Barrier Metal-Oxide-Semiconductor Field-Effect Transistors

Novel properties of erbium-silicided n-type Schottky barrier metal-oxide-semiconductor field-effect transistors

Spin wave resonance of amorphous Co1−xZrx thin films

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