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IEEE transactions on electron devices, 2019-05, Vol.66 (5), p.2301-2306
2019
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IEEE transactions on electron devices, 2016-07, Vol.63 (7), p.2722-2728
2016
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IEEE transactions on electron devices, 2016-01, Vol.63 (1), p.272-279
2016
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IEEE transactions on electron devices, 2016-02, Vol.63 (2), p.620-624
2016
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IEEE transactions on electron devices, 2001-12, Vol.48 (12), p.2953-2956
2001
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2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278), 2002, Vol.2, p.677-680 vol.2
2002
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IEEE MTT-S International Microwave Symposium Digest, 2003, 2003, Vol.2, p.837-840 vol.2
2003
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IEEE International Integrated Reliability Workshop Final Report, 2004, 2004, p.86-89
2004
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IEEE transactions on semiconductor manufacturing, 1990-08, Vol.3 (3), p.145-147
1990
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IEEE/SEMI Conference and Workshop on Advanced Semiconductor Manufacturing 2005, 2005, p.5-10
2005
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IEEE transactions on magnetics, 2004-07, Vol.40 (4), p.3171-3173
2004
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2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2006, p.235-238
2006
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1994 IEEE MTT-S International Microwave Symposium Digest (Cat. No.94CH3389-4), 1994, p.1179-1182 vol.2
1994
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2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2019, p.1-11
2019
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Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743), 2004, p.235-238
2004
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2004 IEEE International Conference on Semiconductor Electronics, 2004, p.7 pp.
2004
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Advances in Electronic Materials and Packaging 2001 (Cat. No.01EX506), 2001, p.44-51
2001
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Advances in Electronic Materials and Packaging 2001 (Cat. No.01EX506), 2001, p.235-242
2001
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1992 Proceedings 42nd Electronic Components & Technology Conference, 1992, p.930-938
1992
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IEEE transactions on device and materials reliability, 2022-03, Vol.22 (1), p.65-72
2022
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29th Annual Proceedings Reliability Physics 1991, 1991, p.152-159
1991
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IEEE transactions on device and materials reliability, 2013-03, Vol.13 (1), p.301-309
2013
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Journal of microelectromechanical systems, 2013-06, Vol.22 (3), p.560-568
2013
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IEEE transactions on electron devices, 2010-04, Vol.57 (4), p.928-938
2010
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Journal of microelectromechanical systems, 2006-02, Vol.15 (1), p.120-130
2006
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