UB Paderborn / Katalog / Suche / in CDI

1 – 25 von 63

Sortiert nach

Fault characterizations and design-for-testability technique for detecting I/sub DDQ/ faults in CMOS/BiCMOS circuits

Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232), 2001, p.313-316

2001

Link zum Volltext
IEEE_Xplore

Characterization and estimation of circuit reliability degradation under NBTI using on-line I DDQ measurement

Proceedings of the 44th annual Design Automation Conference, 2007, p.358-363

2007

Link zum Volltext

Verfügbarkeit prüfen

Synthesis of I/sub DDQ/-testable circuits: integrating built-in current sensors

Proceedings of the 1995 European conference on design and test, 1995, p.573-580

1995

Link zum Volltext
IEEE_Xplore

Influence of manufacturing variations in I DDQ measurements: a new test criterion

Proceedings of the conference on design, automation and test in europe, 2000, p.645-649

2000

Link zum Volltext

Verfügbarkeit prüfen

Exploring the combination of I DDQ and i DDt testing: energy testing

Proceedings of the conference on design, automation and test in europe, 1999, p.110-es

1999

Link zum Volltext

Verfügbarkeit prüfen

Synthesis of I/ DDQ/-testable circuits:integrating built-in current sensors

European Design and Test Conference: Proceedings of the 1995 European conference on Design and Test; 06-09 Mar. 1995, 1995

1995

Link zum Volltext

Verfügbarkeit prüfen

Bridging fault detection in FPGA interconnects using I DDQ

Proceedings of the 1998 ACM/SIGDA sixth international symposium on field programmable gate arrays, 1998, p.95-104

1998

Link zum Volltext

Verfügbarkeit prüfen

Evaluation of statistical outlier rejection methods for I/sub DDQ/ limit setting

Proceedings of ASP-DAC/VLSI Design 2002. 7th Asia and South Pacific Design Automation Conference and 15h International Conference on VLSI Design, 2002, p.755-760

2002

Link zum Volltext
IEEE_Xplore

IOCIMU-an integrated off-chip I/sub DDQ/ measurement unit

Proceedings Design, Automation and Test in Europe, 1998, p.959-960

1998

Link zum Volltext
IEEE_Xplore

Driving toward higher I DDQ test quality for sequential circuits: a generalized fault model and its ATPG

Proceedings of the 1996 IEEE/ACM international conference on computer-aided design, 1997, p.228-232

1997

Link zum Volltext

Verfügbarkeit prüfen

Fault characterizations and design-for-testability technique for detecting $I_{DDQ}$ faults in CMOS/BiCMOS circuits

Annual ACM IEEE Design Automation Conference: Proceedings of the 38th conference on Design automation, 2001, p.313-316

2001

Link zum Volltext

Verfügbarkeit prüfen

Correlation between I/sub DDQ/ testing quality and sensor accuracy

Proceedings of the 1995 European conference on design and test, 1995, p.568-572

1995

Link zum Volltext
IEEE_Xplore

Correlation between I/ DDQ/ testing quality and sensor accuracy

European Design and Test Conference: Proceedings of the 1995 European conference on Design and Test; 06-09 Mar. 1995, 1995

1995

Link zum Volltext

Verfügbarkeit prüfen

GOLDENGATE: a fast and accurate bridging fault simulator under a hybrid logic/I DDQ testing environment

Proceedings of the 1997 IEEE/ACM international conference on computer-aided design, 1997, p.555-561

1997

Link zum Volltext

Verfügbarkeit prüfen

A fully digital controlled off-chip I/sub DDQ/ measurement unit

Proceedings Design, Automation and Test in Europe, 1998, p.495-500

1998

Link zum Volltext
IEEE_Xplore

Estimation of the defective I/sub DDQ/ caused by shorts in deep-submicron CMOS ICs

Proceedings Design, Automation and Test in Europe, 1998, p.490-494

1998

Link zum Volltext
IEEE_Xplore

Enhanced controllability for I DDQ test sets using partial scan

Proceedings of the 28th ACM/IEEE Design Automation Conference, 1991, p.278-281

1991

Link zum Volltext

Verfügbarkeit prüfen

GOLDENGATE: a fast and accurate bridging fault simulator under a hybrid logic/I/sub DDQ/ testing environment

1997 Proceedings of IEEE International Conference on Computer Aided Design (ICCAD), 1997, p.555-561

1997

Link zum Volltext
IEEE_Xplore

Driving toward higher I/sub DDQ/ test quality for sequential circuits: A generalized fault model and its ATPG

Proceedings of International Conference on Computer Aided Design, 1996, p.228-232

1996

Link zum Volltext
IEEE_Xplore

Test generation for I DDQ testing and leakage fault detection in CMOS circuits

Proceedings of the conference on european design automation, 1992, p.486-491

1992

Link zum Volltext

Verfügbarkeit prüfen

Test generation for I/sub DDQ/ testing and leakage fault detection in CMOS circuits

Proceedings EURO-DAC '92: European Design Automation Conference, 1992, p.486-491

1992

Link zum Volltext
IEEE_Xplore

An indirect current sensing technique for IDDQ and IDDT tests

Great Lakes Symposium on VLSI: Proceedings of the 16th ACM Great Lakes symposium on VLSI; 30 Apr.-01 May 2006, 2006, p.235-240

2006

Link zum Volltext

Verfügbarkeit prüfen

A built-in quiescent current monitor for CMOS VLSI circuits

European Design and Test Conference: Proceedings of the 1995 European conference on Design and Test; 06-09 Mar. 1995, 1995, p.581-585

1995

Link zum Volltext
IEEE_Xplore

Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement

2007 44th ACM/IEEE Design Automation Conference, 2007, p.358-363

2007

Link zum Volltext
IEEE_Xplore

IC test using the energy consumption ratio

Proceedings - ACM IEEE Design Automation Conference, 1999, p.976-981

1999

Link zum Volltext

Verfügbarkeit prüfen

1 – 25 von 63

Suche als RSS-Feed

Aktive Filter

Zeitschrift / SerieChemistry - A European Journal

Zeitschrift / SerieChemistry : A European Journal

PublikationsformArtikel

KollektionACM Digital Library Complete

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Mit Volltextzugriff
(63)

Publikationsform

Tagungsberichte
(63)

Sprache

Englisch
(63)
Japanisch
(2)

Erscheinungsjahr

n.n

Kollektion

Menü

Weitere Dienste

Einstellungen

Fault characterizations and design-for-testability technique for detecting I/sub DDQ/ faults in CMOS/BiCMOS circuits

Characterization and estimation of circuit reliability degradation under NBTI using on-line I DDQ measurement

Synthesis of I/sub DDQ/-testable circuits: integrating built-in current sensors

Influence of manufacturing variations in I DDQ measurements: a new test criterion

Exploring the combination of I DDQ and i DDt testing: energy testing

Synthesis of I/ DDQ/-testable circuits:integrating built-in current sensors

Bridging fault detection in FPGA interconnects using I DDQ

Evaluation of statistical outlier rejection methods for I/sub DDQ/ limit setting

IOCIMU-an integrated off-chip I/sub DDQ/ measurement unit

Driving toward higher I DDQ test quality for sequential circuits: a generalized fault model and its ATPG

Fault characterizations and design-for-testability technique for detecting $I_{DDQ}$ faults in CMOS/BiCMOS circuits

Correlation between I/sub DDQ/ testing quality and sensor accuracy

Correlation between I/ DDQ/ testing quality and sensor accuracy

GOLDENGATE: a fast and accurate bridging fault simulator under a hybrid logic/I DDQ testing environment

A fully digital controlled off-chip I/sub DDQ/ measurement unit

Estimation of the defective I/sub DDQ/ caused by shorts in deep-submicron CMOS ICs

Enhanced controllability for I DDQ test sets using partial scan

GOLDENGATE: a fast and accurate bridging fault simulator under a hybrid logic/I/sub DDQ/ testing environment

Driving toward higher I/sub DDQ/ test quality for sequential circuits: A generalized fault model and its ATPG

Test generation for I DDQ testing and leakage fault detection in CMOS circuits

Test generation for I/sub DDQ/ testing and leakage fault detection in CMOS circuits

An indirect current sensing technique for IDDQ and IDDT tests

A built-in quiescent current monitor for CMOS VLSI circuits

Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement

IC test using the energy consumption ratio

Aktive Filter

Suchergebnisse filtern