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Parameters of lightning strokes: a review

IEEE transactions on power delivery, 2005-01, Vol.20 (1), p.346-358

2005

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Single-event upset in flash memories

IEEE transactions on nuclear science, 1997-12, Vol.44 (6), p.2315-2324

1997

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Comparison of AAS, ICP-AES, PSA, and XRF in Determining Lead and Cadmium in Soil

Environmental science & technology, 1996-01, Vol.30 (1), p.204-213

1996

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An observation of proton-induced latchup (in CMOS microprocessor)

IEEE transactions on nuclear science, 1992-12, Vol.39 (6), p.1654-1656

1992

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Latchup in CMOS Devices from Heavy Ions

IEEE transactions on nuclear science, 1983-12, Vol.30 (6), p.4514-4519

1983

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Heavy ion and proton induced single event transients in comparators

IEEE transactions on nuclear science, 1996-12, Vol.43 (6), p.2960-2967

1996

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Update on parts SEE susceptibility from heavy ions

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1991-12, Vol.38 (6), p.1529-1539

1991

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Temperature and Epi Thickness Dependence of the Heavy Ion Induced Latchup Threshold for a CMOS/EPI 16K Static RAM

IEEE transactions on nuclear science, 1987-12, Vol.34 (6), p.1800-1802

1987

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SEU of Complementary GaAs Static Rams Due to Heavy Ions

IEEE transactions on nuclear science, 1984-12, Vol.31 (6), p.1121-1123

1984

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Trends in Parts Susceptibility to Single Event Upset from Heavy Ions

IEEE transactions on nuclear science, 1985-12, Vol.32 (6), p.4189-4194

1985

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Single Event Upset (SEU) of Semiconductor Devices - A Summary of JPL Test Data

IEEE transactions on nuclear science, 1983-12, Vol.30 (6), p.4520-4525

1983

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Recent Trends in Parts SEU Susceptibility from Heavy Ions

IEEE transactions on nuclear science, 1987-12, Vol.34 (6), p.1332-1337

1987

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A Remote Surge Analyzer to Monitor Zinc Oxide Arrester Performance

IEEE transactions on power delivery, 1986, Vol.1 (3), p.191-196

1986

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A Summary of JPL Single Event Upset Test Data from May 1982, Through January 1984

IEEE transactions on nuclear science, 1984-12, Vol.31 (6), p.1186-1189

1984

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Single Event Upset Immune Integrated Circuits for Project Galileo

IEEE transactions on nuclear science, 1985-12, Vol.32 (6), p.4159-4163

1985

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The Single Event Upset (SEU) Response to 590 MeV Protons

IEEE transactions on nuclear science, 1984-12, Vol.31 (6), p.1565-1567

1984

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Single Event Upset Sensitivity of Low Power Schottky Devices

IEEE transactions on nuclear science, 1982-01, Vol.29 (6), p.2064-2066

1982

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Radiation-Induced Surface States in MOS Devices

IEEE transactions on nuclear science, 1975-01, Vol.22 (6), p.2193-2196

1975

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Investigation for Single-Event Upset in MSI Devices

IEEE transactions on nuclear science, 1981-01, Vol.28 (6), p.4022-4025

1981

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A Prediction Model for Bipolar RAMs in a High Energy Ion/Proton Environment

IEEE transactions on nuclear science, 1981-01, Vol.28 (6), p.3959-3961

1981

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Radiation-Induced Memory Loss in Thin-Oxide MNOS Devices

IEEE transactions on nuclear science, 1976-01, Vol.23 (6), p.1554-1557

1976

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Latest trends in parts SEP susceptibility from heavy ions

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA), 1989-12, Vol.36 (6), p.2388-2397

1989

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A Review of Dose Rate Dependent Effects of Total Ionizing Dose (TID) Irradiations

IEEE transactions on nuclear science, 1980-01, Vol.27 (2), p.1016-1024

Nichols, D. K.

1980

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A new control method of permanent magnet generator for maximum power tracking in wind turbine application

IEEE Power Engineering Society General Meeting, 2005, 2005, p.2090-2095 Vol. 3

2005

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Assessment of microturbine generators

2003 IEEE Power Engineering Society General Meeting (IEEE Cat. No.03CH37491), 2003, Vol.4, p.2314-2315 Vol. 4

2003

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Parameters of lightning strokes: a review

Single-event upset in flash memories

Comparison of AAS, ICP-AES, PSA, and XRF in Determining Lead and Cadmium in Soil

An observation of proton-induced latchup (in CMOS microprocessor)

Latchup in CMOS Devices from Heavy Ions

Heavy ion and proton induced single event transients in comparators

Update on parts SEE susceptibility from heavy ions

Temperature and Epi Thickness Dependence of the Heavy Ion Induced Latchup Threshold for a CMOS/EPI 16K Static RAM

SEU of Complementary GaAs Static Rams Due to Heavy Ions

Trends in Parts Susceptibility to Single Event Upset from Heavy Ions

Single Event Upset (SEU) of Semiconductor Devices - A Summary of JPL Test Data

Recent Trends in Parts SEU Susceptibility from Heavy Ions

A Remote Surge Analyzer to Monitor Zinc Oxide Arrester Performance

A Summary of JPL Single Event Upset Test Data from May 1982, Through January 1984

Single Event Upset Immune Integrated Circuits for Project Galileo

The Single Event Upset (SEU) Response to 590 MeV Protons

Single Event Upset Sensitivity of Low Power Schottky Devices

Radiation-Induced Surface States in MOS Devices

Investigation for Single-Event Upset in MSI Devices

A Prediction Model for Bipolar RAMs in a High Energy Ion/Proton Environment

Radiation-Induced Memory Loss in Thin-Oxide MNOS Devices

Latest trends in parts SEP susceptibility from heavy ions

A Review of Dose Rate Dependent Effects of Total Ionizing Dose (TID) Irradiations

A new control method of permanent magnet generator for maximum power tracking in wind turbine application

Assessment of microturbine generators

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