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Impact of the Metal-Gate Material Properties in FinFET (Versus FD-SOI MOSFET) on High- \kappa /Metal-Gate Work-Function Variation

IEEE transactions on electron devices, 2018-11, Vol.65 (11), p.4780-4785

2018

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IEEE_Xplore

Resistive-Gate Field-Effect Transistor: A Novel Steep-Slope Device Based on a Metal-Insulator-Metal-Oxide Gate Stack

IEEE electron device letters, 2014-08, Vol.35 (8), p.877-879

2014

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IEEE_Xplore

Temperature-Dependent Operation of InGaZnO Ferroelectric Thin-Film Transistors With a Metal-Ferroelectric-Metal-Insulator- Semiconductor Structure

IEEE electron device letters, 2021-12, Vol.42 (12), p.1786-1789

2021

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IEEE_Xplore

600 V/ 1.7~\Omega Normally-Off GaN Vertical Trench Metal–Oxide–Semiconductor Field-Effect Transistor

IEEE electron device letters, 2016-11, Vol.37 (11), p.1466-1469

2016

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Improvement in Long-Term and High-Temperature Retention Stability of Ferroelectric Field-Effect Memory Transistors With Metal-Ferroelectric-Metal-Insulator-Semiconductor Gate-Stacks Using Al-Doped HfO2 Thin Films

IEEE transactions on electron devices, 2020-02, Vol.67 (2), p.499-504

2020

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IEEE_Xplore

Elevated-Metal-Metal-Oxide Thin-Film Transistor: Technology and Characteristics

IEEE electron device letters, 2016-06, Vol.37 (6), p.728-730

2016

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IEEE_Xplore

Threshold Selector and Capacitive Coupled Assist Techniques for Write Voltage Reduction in Metal-Ferroelectric-Metal Field-Effect Transistor

IEEE transactions on electron devices, 2021-12, Vol.68 (12), p.6132-6138

2021

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IEEE_Xplore

Grain-Orientation Induced Work Function Variation in Nanoscale Metal-Gate Transistors-Part I: Modeling, Analysis, and Experimental Validation

IEEE transactions on electron devices, 2010-10, Vol.57 (10), p.2504-2514

2010

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IEEE_Xplore

Electrothermal Characteristics of Delta-Doped \beta -Ga2O3 Metal-Semiconductor Field-Effect Transistors

IEEE transactions on electron devices, 2019-12, Vol.66 (12), p.5360-5366

2019

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IEEE_Xplore

All Optical Logic Gates Using Hybrid Metal Insulator Metal Plasmonic Waveguide

IEEE photonics technology letters, 2018-05, Vol.30 (10), p.959-962

2018

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IEEE_Xplore

Performance Limits of Monolayer Transition Metal Dichalcogenide Transistors

IEEE transactions on electron devices, 2011-09, Vol.58 (9), p.3042-3047

2011

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IEEE_Xplore

High Performance β-Ga2O3 Solar-Blind Metal-Oxide-Semiconductor Field-Effect Phototransistor With Hafnium Oxide Gate Dielectric Process

IEEE electron device letters, 2021-04, Vol.42 (4), p.545-548

2021

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IEEE_Xplore

Study of Work-Function Variation in High- \kappa /Metal-Gate Gate-All-Around Nanowire MOSFET

IEEE transactions on electron devices, 2016-08, Vol.63 (8), p.3338-3341

2016

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IEEE_Xplore

Enhancement-Mode \beta -Ga2O3 Metal-Oxide-Semiconductor Field-Effect Solar-Blind Phototransistor With Ultrahigh Detectivity and Photo-to-Dark Current Ratio

IEEE electron device letters, 2019-05, Vol.40 (5), p.742-745

2019

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IEEE_Xplore

A Diamond:H/WO3 Metal-Oxide-Semiconductor Field-Effect Transistor

IEEE electron device letters, 2018-04, Vol.39 (4), p.540-543

2018

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IEEE_Xplore

Temperature-Dependent Gate-Induced Drain Leakages Assessment of Dual-Metal Nanowire Field-Effect Transistor-Analytical Model

IEEE transactions on electron devices, 2019-05, Vol.66 (5), p.2437-2445

2019

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IEEE_Xplore

Effect of Stacked Work Function Metals on Gate Stress Reliability of N-and P-FinFETs

IEEE transactions on electron devices, 2023-08, Vol.70 (8), p.1-5

2023

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IEEE_Xplore

Suppressed Degradation of Elevated-Metal Metal-Oxide Thin-Film Transistors Under Bipolar Gate Pulse Stress

IEEE electron device letters, 2018-05, Vol.39 (5), p.707-710

2018

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IEEE_Xplore

Metal-CH3NH3PbI3-Metal Tunnel FET

IEEE transactions on electron devices, 2018-05, Vol.65 (5), p.1902-1909

2018

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IEEE_Xplore

Modeling of Organic Metal-Insulator- Semiconductor Capacitor

IEEE transactions on electron devices, 2019-09, Vol.66 (9), p.3967-3972

2019

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IEEE_Xplore

High-Quality Solution-Processed Metal-Oxide Gate Dielectrics Realized With a Photo-Activated Metal-Oxide Nanocluster Precursor

IEEE electron device letters, 2018-11, Vol.39 (11), p.1668-1671

2018

Link zum Volltext
IEEE_Xplore

Effect of Nitrogen Doping on Elevated-Metal Metal-Oxide (EMMO) Thin-Film Transistors

IEEE transactions on electron devices, 2022-08, Vol.69 (8), p.4271-4276

2022

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IEEE_Xplore

High-Performance Vertical Gate-All-Around Silicon Nanowire FET With High- \kappa /Metal Gate

IEEE transactions on electron devices, 2014-11, Vol.61 (11), p.3896-3900

2014

Link zum Volltext
IEEE_Xplore

Experimental Study of 1/f1+α Noise in Transient Leakage Current of Metal-Insulator-Metal With Stacked High-k Polycrystalline Films

IEEE transactions on electron devices, 2020-06, Vol.67 (6), p.2503-2509

2020

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IEEE_Xplore

Performance Improvement of a β-Ga₂O₃-Based Solar-Blind Metal Oxide Semiconductor Field-Effect Phototransistor Using In Situ Ozone Pretreatment Technology

IEEE transactions on electron devices, 2022-03, Vol.69 (3), p.1143-1148

2022

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IEEE_Xplore

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Impact of the Metal-Gate Material Properties in FinFET (Versus FD-SOI MOSFET) on High- \kappa /Metal-Gate Work-Function Variation

Resistive-Gate Field-Effect Transistor: A Novel Steep-Slope Device Based on a Metal-Insulator-Metal-Oxide Gate Stack

Temperature-Dependent Operation of InGaZnO Ferroelectric Thin-Film Transistors With a Metal-Ferroelectric-Metal-Insulator- Semiconductor Structure

600 V/ 1.7~\Omega Normally-Off GaN Vertical Trench Metal–Oxide–Semiconductor Field-Effect Transistor

Improvement in Long-Term and High-Temperature Retention Stability of Ferroelectric Field-Effect Memory Transistors With Metal-Ferroelectric-Metal-Insulator-Semiconductor Gate-Stacks Using Al-Doped HfO2 Thin Films

Elevated-Metal-Metal-Oxide Thin-Film Transistor: Technology and Characteristics

Threshold Selector and Capacitive Coupled Assist Techniques for Write Voltage Reduction in Metal-Ferroelectric-Metal Field-Effect Transistor

Grain-Orientation Induced Work Function Variation in Nanoscale Metal-Gate Transistors-Part I: Modeling, Analysis, and Experimental Validation

Electrothermal Characteristics of Delta-Doped \beta -Ga2O3 Metal-Semiconductor Field-Effect Transistors

All Optical Logic Gates Using Hybrid Metal Insulator Metal Plasmonic Waveguide

Performance Limits of Monolayer Transition Metal Dichalcogenide Transistors

High Performance β-Ga2O3 Solar-Blind Metal-Oxide-Semiconductor Field-Effect Phototransistor With Hafnium Oxide Gate Dielectric Process

Study of Work-Function Variation in High- \kappa /Metal-Gate Gate-All-Around Nanowire MOSFET

Enhancement-Mode \beta -Ga2O3 Metal-Oxide-Semiconductor Field-Effect Solar-Blind Phototransistor With Ultrahigh Detectivity and Photo-to-Dark Current Ratio

A Diamond:H/WO3 Metal-Oxide-Semiconductor Field-Effect Transistor

Temperature-Dependent Gate-Induced Drain Leakages Assessment of Dual-Metal Nanowire Field-Effect Transistor-Analytical Model

Effect of Stacked Work Function Metals on Gate Stress Reliability of N-and P-FinFETs

Suppressed Degradation of Elevated-Metal Metal-Oxide Thin-Film Transistors Under Bipolar Gate Pulse Stress

Metal-CH3NH3PbI3-Metal Tunnel FET

Modeling of Organic Metal-Insulator- Semiconductor Capacitor

High-Quality Solution-Processed Metal-Oxide Gate Dielectrics Realized With a Photo-Activated Metal-Oxide Nanocluster Precursor

Effect of Nitrogen Doping on Elevated-Metal Metal-Oxide (EMMO) Thin-Film Transistors

High-Performance Vertical Gate-All-Around Silicon Nanowire FET With High- \kappa /Metal Gate

Experimental Study of 1/f1+α Noise in Transient Leakage Current of Metal-Insulator-Metal With Stacked High-k Polycrystalline Films

Performance Improvement of a β-Ga₂O₃-Based Solar-Blind Metal Oxide Semiconductor Field-Effect Phototransistor Using In Situ Ozone Pretreatment Technology

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