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2016 IEEE Symposium on VLSI Technology, 2016, p.1-2
- Cho, H.-J.
- Oh, H.S.
- Nam, K.J.
- Kim, Y.H.
- Yeo, K.H.
- Kim, W.D.
- Chung, Y.S.
- Nam, Y.S.
- Kim, S.M.
- Kwon, W.H.
- Kang, M.J.
- Kim, I.R.
- Fukutome, H.
- Jeong, C.W.
- Shin, H.J.
- Kim, Y.S.
- Kim, D.W.
- Park, S.H.
- Jeong, J.H.
- Kim, S.B.
- Ha, D.W.
- Park, J.H.
- Rhee, H.S.
- Hyun, S.J.
- Shin, D.S.
- Kim, D.H.
- Kim, H.Y.
- Maeda, S.
- Lee, K.H.
- Kim, M.C.
- Koh, Y.S.
- Yoon, B.
- Shin, K.
- Lee, N.I.
- Kangh, S.B.
- Hwang, K.H.
- Lee, J.H.
- Ku, J.-H.
- Nam, S.W.
- Jung, S.M.
- Kang, H.K.
- Yoon, J.S.
- Jung, E.S.
2016
- Link zum Volltext
2018 IEEE International Electron Devices Meeting (IEDM), 2018, p.28.7.1-28.7.4
- Bae, Geumjong
- Bae, D.-I.
- Kang, M.
- Hwang, S.M.
- Kim, S.S.
- Seo, B.
- Kwon, T.Y.
- Lee, T.J.
- Moon, C.
- Choi, Y.M.
- Oikawa, K.
- Masuoka, S.
- Chun, K.Y.
- Park, S.H.
- Shin, H.J.
- Kim, J.C.
- Bhuwalka, K.K.
- Kim, D.H.
- Kim, W.J.
- Yoo, J.
- Jeon, H.Y.
- Yang, M.S.
- Chung, S.-J.
- Kim, D.
- Ham, B.H.
- Park, K.J.
- Kim, W.D.
- Song, G.
- Kim, Y.H.
- Kang, M.S.
- Hwang, K.H.
- Park, C.-H.
- Lee, J.-H.
- Kim, D.-W.
- Jung, S-M.
- Kang, H.K.
2018
- Link zum Volltext
International journal of fatigue, 2004-05, Vol.26 (5), p.553-560
2004
Link zum Volltext
IEEE transactions on semiconductor manufacturing, 2002-05, Vol.15 (2), p.245-252
2002
- Link zum Volltext
AIAA journal, 1994-05, Vol.32 (5), p.1066-1071
1994
Link zum Volltext
JSME International Journal Series B Fluids and Thermal Engineering, 2003, Vol.46(2), pp.278-286
2003
Link zum Volltext
1996 IEEE International SOI Conference Proceedings, 1996, p.114-115
1996
- Link zum Volltext
IEEE transactions on antennas and propagation, 2006-11, Vol.54 (11), p.3095-3105
2006
- Link zum Volltext
Journal of electronic materials, 2010-11, Vol.39 (11), p.2483-2488
2010
Link zum Volltext
Journal of microelectromechanical systems, 2004-04, Vol.13 (2), p.230-237
2004
- Link zum Volltext
IEEE transactions on applied superconductivity, 2008-06, Vol.18 (2), p.1471-1474
2008
- Link zum Volltext
Reliability engineering & system safety, 2001, Vol.71 (1), p.21-32
2001
Link zum Volltext
Engineering failure analysis, 2009-09, Vol.16 (6), p.1889-1893
2009
Link zum Volltext
2018 IEEE 68th Electronic Components and Technology Conference (ECTC), 2018, p.504-514
2018
- Link zum Volltext
Engineering failure analysis, 2009-09, Vol.16 (6), p.1964-1967
2009
Link zum Volltext
Water research (Oxford), 1998-02, Vol.32 (2), p.287-294
1998
Link zum Volltext
Journal of loss prevention in the process industries, 2002-03, Vol.15 (2), p.97-104
2002
Link zum Volltext
IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 1995-05, Vol.42 (3), p.351-361
1995
- Link zum Volltext
Conference Record of the Thirty-first IEEE Photovoltaic Specialists Conference, 2005, 2005, p.1070-1073
2005
- Link zum Volltext
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA), 1989-12, Vol.36 (6), p.2155-2160
1989
- Link zum Volltext
IEEE Symposium on Ultrasonics, 1990, p.179-183 vol.1
1990
Link zum Volltext
IEEE electron device letters, 1983-07, Vol.4 (7), p.212-214
1983
- Link zum Volltext
Images of the Twenty-First Century. Proceedings of the Annual International Engineering in Medicine and Biology Society, 1989, p.1520-1521 vol.5
1989
Link zum Volltext
1994 Proceedings of IEEE Ultrasonics Symposium, 1994, Vol.1, p.407-410 vol.1
1994
- Link zum Volltext
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