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IEEE transactions on device and materials reliability, 2006-03, Vol.6 (1), p.17-27
2006
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IEEE transactions on device and materials reliability, 2019-09, Vol.19 (3), p.473-483
2019
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IEEE transactions on device and materials reliability, 2005-09, Vol.5 (3), p.305-316
2005
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IEEE transactions on device and materials reliability, 2024-06, Vol.24 (2), p.184-193
2024
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IEEE transactions on device and materials reliability, 2021-12, Vol.21 (4), p.518-527
2021
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IEEE transactions on device and materials reliability, 2023-06, Vol.23 (2), p.276-280
2023
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IEEE transactions on device and materials reliability, 2016-06, Vol.16 (2), p.227-234
2016
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IEEE transactions on device and materials reliability, 2005-09, Vol.5 (3), p.405-418
2005
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IEEE transactions on device and materials reliability, 2017-12, Vol.17 (4), p.727-737
2017
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IEEE transactions on device and materials reliability, 2023-03, Vol.23 (1), p.72-79
2023
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IEEE transactions on device and materials reliability, 2024-06, Vol.24 (2), p.203-210
2024
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IEEE transactions on device and materials reliability, 2018-06, Vol.18 (2), p.154-162
2018
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IEEE transactions on device and materials reliability, 2017-03, Vol.17 (1), p.157-162
2017
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IEEE transactions on device and materials reliability, 2021-09, Vol.21 (3), p.389-393
2021
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IEEE transactions on device and materials reliability, 2023-12, Vol.23 (4), p.615-622
2023
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IEEE transactions on device and materials reliability, 2022-09, Vol.22 (3), p.319-321
2022
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IEEE transactions on device and materials reliability, 2021-06, Vol.21 (2), p.169-175
2021
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IEEE transactions on device and materials reliability, 2016-03, Vol.16 (1), p.80-97
2016
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Geosphere (Boulder, Colo.), 2016-02, Vol.12 (1), p.203-220
2016
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IEEE transactions on device and materials reliability, 2019-12, Vol.19 (4), p.630-641
2019
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IEEE transactions on device and materials reliability, 2020-06, Vol.20 (2), p.230-241
2020
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IEEE transactions on device and materials reliability, 2020-06, Vol.20 (2), p.404-412
2020
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IEEE transactions on device and materials reliability, 2018-06, Vol.18 (2), p.144-153
2018
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IEEE transactions on device and materials reliability, 2007-03, Vol.7 (1), p.69-73
2007
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Geosphere (Boulder, Colo.), 2022-04, Vol.18 (2), p.503-561
2022
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