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2008 33rd IEEE Photovoltaic Specialists Conference, 2008, p.1-2
2008
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Proceedings of the International Solid-State Sensors and Actuators Conference - TRANSDUCERS '95, 1995, Vol.2, p.732-735
1995
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Journal of physics. Conference series, 2014, Vol.514 (1)
2014
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CAS 2010 Proceedings (International Semiconductor Conference), 2010, Vol.1, p.225-228
2010
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Advanced materials research, 2010, Vol.93-94, p.583-586
2010
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E3S Web of Conferences, 2023, Vol.375, p.3008
2023
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2022 37th Youth Academic Annual Conference of Chinese Association of Automation (YAC), 2022, p.459-462
2022
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2009 International Semiconductor Conference, 2009, Vol.1, p.135-138
2009
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2006 IEEE International Frequency Control Symposium and Exposition, 2006, p.318-321
2006
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2010 3rd International Nanoelectronics Conference (INEC), 2010, p.338-339
2010
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2016 IEEE EMBS Conference on Biomedical Engineering and Sciences (IECBES), 2016, p.420-425
2016
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2023 IEEE BioSensors Conference (BioSensors), 2023, p.1-4
2023
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2013 2nd International Symposium on Instrumentation and Measurement, Sensor Network and Automation (IMSNA), 2013, p.712-715
2013
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2017 International Seminar on Sensors, Instrumentation, Measurement and Metrology (ISSIMM), 2017, p.119-123
2017
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2007 2nd IEEE International Conference on Nano/Micro Engineered and Molecular Systems, 2007, p.29-32
2007
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2011 9th IEEE International Conference on ASIC, 2011, p.180-183
2011
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2019 IEEE SENSORS, 2019, p.1-4
2019
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2014 2nd International Conference on Electronic Design (ICED), 2014, p.455-460
2014
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Proceedings of IEEE Sensors, 2004, 2004, p.718-721 vol.2
2004
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2008 33rd IEEE Photovoltaic Specialists Conference, 2008, p.1-5
2008
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2009 IEEE Sensors, 2009, p.287-290
2009
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2017 First International Conference on Landmine: Detection, Clearance and Legislations (LDCL), 2017, p.1-6
2017
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2011 - 14th International Symposium on Electrets, 2011, p.181-182
2011
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2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), 2018, Vol.2018, p.4472-4475
2018
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Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510), 2004, Vol.1, p.605-609 Vol.1
2004
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