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On the suitability of non-hardened high density SRAMs for space applications

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1991-12, Vol.38 (6), p.1507-1513

1991

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Correlation of picosecond laser-induced latchup and energetic particle-induced latchup in CMOS test structures

IEEE transactions on nuclear science, 1995-12, Vol.42 (6), p.1948-1956

1995

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Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions

IEEE transactions on nuclear science, 1997-12, Vol.44 (6), p.2325-2332

1997

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Observation of single event upsets in analog microcircuits

IEEE transactions on nuclear science, 1993-12, Vol.40 (6), p.1838-1844

1993

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Comparative SEU sensitivities to relativistic heavy ions

IEEE transactions on nuclear science, 1998-12, Vol.45 (6), p.2475-2482

1998

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Update on parts SEE suspectibility from heavy ions

IEEE transactions on nuclear science, 1991-12, Vol.38 (6), p.1529-1539

1991

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Multi-Channel Charge Amplifier-Discriminator-Counter IC for the Space Sciences

2006 IEEE Nuclear Science Symposium Conference Record, 2006, Vol.3, p.1605-1608

2006

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Single event effects in pulse width modulation controllers

IEEE transactions on nuclear science, 1996-12, Vol.43 (6), p.2968-2973

1996

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The risk of utilizing SEE sensitive COTS digital signal processor (DSP) devices in space

IEEE transactions on nuclear science, 1996-12, Vol.43 (6), p.2982-2989

1996

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Serendipitous SEU hardening of resistive load SRAMs

IEEE transactions on nuclear science, 1996-06, Vol.43 (3), p.931-935

1996

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Ion induced charge collection and SEU sensitivity of emitter coupled logic (ECL) devices

IEEE transactions on nuclear science, 1995-12, Vol.42 (6), p.1823-1828

1995

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Mutually exclusive expression of the Strongylocentrotus purpuratus Spec1 gene and its Lytechinus pictus homologue in cells of hybrid embryos

Development (Cambridge), 1992-01, Vol.114 (1), p.193-201

1992

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The impact of ASIC devices on the SEU vulnerability of space-borne computers

IEEE transactions on nuclear science, 1992-12, Vol.39 (6), p.1685-1692

1992

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Three Strongylocentrotus purpuratus actin genes show correct cell-specific expression in hybrid embryos of S. purpuratus and Lytechinus pictus

Development (Cambridge), 1989-02, Vol.105 (2), p.407-413

1989

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Update on parts SEE susceptibility from heavy ions

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1991-12, Vol.38 (6), p.1529-1539

1991

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Single event functional interrupt (SEFI) sensitivity in microcircuits

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294), 1997, p.311-318

1997

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Single event effects test results for the 80C186 and 80C286 microprocessors and the SMJ320C30 and SMJ320C40 digital signal processors

1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385), 1998, p.51-57

1998

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Comparison of flight and ground data for radiation-induced high current states in the 68302 microprocessor

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527), 2000, p.85-88

2000

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The SEU in pulse width modulation controllers with soft start and shutdown circuits

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference, 1997, p.73-79

1997

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Serendipitous SEU hardening of resistive load SRAMs

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems, 1995, p.354-358

1995

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Device SEE susceptibility from heavy ions (1995-1996)

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference, 1997, p.1-13

1997

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Overview Of Device See Susceptibility From Heavy Ions

1993 IEEE Radiation Effects Data Workshop, 1993, p.1-12

1993

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On the suitability of non-hardened high density SRAMs for space applications

Correlation of picosecond laser-induced latchup and energetic particle-induced latchup in CMOS test structures

Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions

Observation of single event upsets in analog microcircuits

Comparative SEU sensitivities to relativistic heavy ions

Update on parts SEE suspectibility from heavy ions

Multi-Channel Charge Amplifier-Discriminator-Counter IC for the Space Sciences

Single event effects in pulse width modulation controllers

The risk of utilizing SEE sensitive COTS digital signal processor (DSP) devices in space

Serendipitous SEU hardening of resistive load SRAMs

Ion induced charge collection and SEU sensitivity of emitter coupled logic (ECL) devices

Mutually exclusive expression of the Strongylocentrotus purpuratus Spec1 gene and its Lytechinus pictus homologue in cells of hybrid embryos

The impact of ASIC devices on the SEU vulnerability of space-borne computers

Three Strongylocentrotus purpuratus actin genes show correct cell-specific expression in hybrid embryos of S. purpuratus and Lytechinus pictus

Update on parts SEE susceptibility from heavy ions

Single event functional interrupt (SEFI) sensitivity in microcircuits

Single event effects test results for the 80C186 and 80C286 microprocessors and the SMJ320C30 and SMJ320C40 digital signal processors

Comparison of flight and ground data for radiation-induced high current states in the 68302 microprocessor

The SEU in pulse width modulation controllers with soft start and shutdown circuits

Serendipitous SEU hardening of resistive load SRAMs

Device SEE susceptibility from heavy ions (1995-1996)

Overview Of Device See Susceptibility From Heavy Ions

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