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Correcting the Effect of LED Spectra on External Quantum Efficiency Measurements of Solar Cells

IEEE journal of photovoltaics, 2018-03, Vol.8 (2), p.559-564

2018

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Comparison of Terminal and Implied Open-Circuit Voltage Measurements

IEEE journal of photovoltaics, 2017-09, Vol.7 (5), p.1376-1383

2017

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Relative External Quantum Efficiency of Crystalline Silicon Wafers From Photoluminescence

IEEE journal of photovoltaics, 2017-07, Vol.7 (4), p.1074-1080

2017

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Outdoor Implied Current-Voltage Measurements of an Individual Encapsulated Cell in a Module

IEEE journal of photovoltaics, 2021-01, Vol.11 (1), p.164-173

2021

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Photoluminescence Imaging of Silicon Wafers and Solar Cells With Spatially Inhomogeneous Illumination

IEEE journal of photovoltaics, 2017-07, Vol.7 (4), p.1087-1091

2017

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Lifetime Imaging on Silicon Bricks Using the Ratio of Photoluminescence Images With Different Excitation Wavelengths

IEEE journal of photovoltaics, 2018-07, Vol.8 (4), p.943-951

2018

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Temperature-dependent Photoluminescence Imaging using Non-uniform Excitation

2020 47th IEEE Photovoltaic Specialists Conference (PVSC), 2020, p.0789-0792

2020

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Applications of DMD-based Inhomogeneous Illumination Photoluminescence Imaging for Silicon Wafers and Solar Cells

2017 IEEE 44th Photovoltaic Specialist Conference (PVSC), 2017, p.66-69

2017

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Metal Induced Contact Recombination Measured By Quasi-steady-state Photoluminescence

2017 IEEE 44th Photovoltaic Specialist Conference (PVSC), 2017, p.3315-3318

2017

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On the use of voltage measurements for determining carrier lifetime at high illumination intensity

2017 IEEE 44th Photovoltaic Specialist Conference (PVSC), 2017, p.420-424

2017

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Estimating the effect of LED spectra on EQE measurement in solar cells

2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC), 2016, p.1580-1584

2016

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Emitter sheet resistance from photoluminescence images

2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 2013, p.0198-0202

2013

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Comparison of Line Scan Luminescence Imaging Techniques for Defect Characterisation in Crystalline Silicon Solar Modules

2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC), 2018, p.1364-1369

2018

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Limitations of photoluminescence based external quantum efficiency measurements

2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC), 2018, p.2224-2228

2018

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Extracting Surface Saturation Current Density from Lifetime Measurements of Samples with Metallized Surfaces

2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC), 2018, p.3243-3247

2018

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Contactless Extraction of Implied I-V Curves of Individual Solar Cells in Fully Assembled Modules Using Photoluminescence

2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC), 2018, p.3598-3602

2018

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Correcting the Effect of LED Spectra on External Quantum Efficiency Measurements of Solar Cells

Comparison of Terminal and Implied Open-Circuit Voltage Measurements

Relative External Quantum Efficiency of Crystalline Silicon Wafers From Photoluminescence

Outdoor Implied Current-Voltage Measurements of an Individual Encapsulated Cell in a Module

Photoluminescence Imaging of Silicon Wafers and Solar Cells With Spatially Inhomogeneous Illumination

Lifetime Imaging on Silicon Bricks Using the Ratio of Photoluminescence Images With Different Excitation Wavelengths

Temperature-dependent Photoluminescence Imaging using Non-uniform Excitation

Applications of DMD-based Inhomogeneous Illumination Photoluminescence Imaging for Silicon Wafers and Solar Cells

Metal Induced Contact Recombination Measured By Quasi-steady-state Photoluminescence

On the use of voltage measurements for determining carrier lifetime at high illumination intensity

Estimating the effect of LED spectra on EQE measurement in solar cells

Emitter sheet resistance from photoluminescence images

Comparison of Line Scan Luminescence Imaging Techniques for Defect Characterisation in Crystalline Silicon Solar Modules

Limitations of photoluminescence based external quantum efficiency measurements

Extracting Surface Saturation Current Density from Lifetime Measurements of Samples with Metallized Surfaces

Contactless Extraction of Implied I-V Curves of Individual Solar Cells in Fully Assembled Modules Using Photoluminescence

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