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Intrinsic parameter fluctuations in decananometer MOSFETs introduced by gate line edge roughness

IEEE transactions on electron devices, 2003-05, Vol.50 (5), p.1254-1260

2003

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Simulation of intrinsic parameter fluctuations in decananometer and nanometer-scale MOSFETs

IEEE transactions on electron devices, 2003-09, Vol.50 (9), p.1837-1852

2003

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Intrinsic threshold voltage fluctuations in decanano MOSFETs due to local oxide thickness variations

IEEE transactions on electron devices, 2002-01, Vol.49 (1), p.112-119

2002

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Optimization of RF linearity in DG-MOSFETs

IEEE electron device letters, 2004-05, Vol.25 (5), p.308-310

2004

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Use of Semivariograms to Identify Earthquake Damage in an Urban Area

IEEE transactions on geoscience and remote sensing, 2007-06, Vol.45 (6), p.1590-1594

2007

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COSMOS-a novel MOS device paradigm

IEEE transactions on nanotechnology, 2005-09, Vol.4 (5), p.588-593

Kaya, S.

2005

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Low-Power Tunable Analog Circuit Blocks Based on Nanoscale Double-Gate MOSFETs

IEEE transactions on circuits and systems. 2, Analog and digital signal processing, 2007-07, Vol.54 (7), p.571-575

2007

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The determination of the pulse pile-up reject (PUR) counting for X and gamma ray spectrometry

AIP Conference Proceedings, 2017, Vol.1815 (1)

2017

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Breakdown of universal mobility curves in sub-100-nm MOSFETs

IEEE transactions on nanotechnology, 2002-12, Vol.1 (4), p.260-264

2002

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Simulation of interface roughness in DGMOSFETs using non-equilibrium Green's functions

Conference Digest [Includes 'Late News Papers' volume] Device Research Conference, 2004. 62nd DRC, 2004, p.65-66 vol.1

2004

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Study of RF Performance for Graded-Channel SOI MOSFETs

2005 International Conference On Simulation of Semiconductor Processes and Devices, 2005, p.259-262

2005

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A Novel Single-Gated Strained CMOS Architecture: COSMOS

2005 International Conference On Simulation of Semiconductor Processes and Devices, 2005, p.263-266

2005

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Dead zone free area efficient Charge Pump Phase Frequency Detector in nanoscale DG-MOSFET

2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS), 2013, p.920-923

2013

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Grating Couplers for Fiber-to-Fiber Characterizations of Stand-Alone Dielectric Loaded Surface Plasmon Waveguide Components

Journal of lightwave technology, 2012-10, Vol.30 (19), p.3118-3125

2012

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High power AlGaN/GaN HFET with a high breakdown voltage of over 1.8 kV on 4 inch Si substrates and the suppression of current collapse

2008 20th International Symposium on Power Semiconductor Devices and IC's, 2008, p.287-290

2008

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Design of DG-MOSFETs for high linearity performance

2003 IEEE International Conference on SOI, 2003, p.68-69

2003

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A closed form memristor SPICE model and oscillator

2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS), 2012, p.1192-1195

2012

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High-power AlGaN/GaN MIS-HFETs with field-plates on Si substrates

2009 21st International Symposium on Power Semiconductor Devices & IC's, 2009, p.251-254

2009

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Optimum biasing and design of high performance double gate MOSFET RF mixers

2012 IEEE International Symposium on Circuits and Systems (ISCAS), 2012, p.3278-3281

2012

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Evaluation and performance analysis of energy efficient wireless NoC architecture

2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS), 2012, p.798-801

2012

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iWISE: Inter-router Wireless Scalable Express Channels for Network-on-Chips (NoCs) Architecture

2011 IEEE 19th Annual Symposium on High Performance Interconnects, 2011, p.11-18

2011

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On Tunable Compact Analog Circuits with Nanoscale DG-MOSFETs

2010 53rd IEEE International Midwest Symposium on Circuits and Systems, 2010, p.189-192

2010

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Quantification of food intake using food image analysis

2009 Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 2009-01, Vol.2009, p.6869-6872

2009

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Effect of oxide interface roughness on the threshold voltage fluctuations in decanano MOSFETs with ultrathin gate oxides

2000 International Conference on Simulation Semiconductor Processes and Devices (Cat. No.00TH8502), 2000, p.135-138

2000

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Scaling of RF linearity in DG and SOI MOSFETs

The 11th IEEE International Symposium on Electron Devices for Microwave and Optoelectronic Applications, 2003. EDMO 2003, 2003, p.255-260

2003

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Intrinsic parameter fluctuations in decananometer MOSFETs introduced by gate line edge roughness

Simulation of intrinsic parameter fluctuations in decananometer and nanometer-scale MOSFETs

Intrinsic threshold voltage fluctuations in decanano MOSFETs due to local oxide thickness variations

Optimization of RF linearity in DG-MOSFETs

Use of Semivariograms to Identify Earthquake Damage in an Urban Area

COSMOS-a novel MOS device paradigm

Low-Power Tunable Analog Circuit Blocks Based on Nanoscale Double-Gate MOSFETs

The determination of the pulse pile-up reject (PUR) counting for X and gamma ray spectrometry

Breakdown of universal mobility curves in sub-100-nm MOSFETs

Simulation of interface roughness in DGMOSFETs using non-equilibrium Green's functions

Study of RF Performance for Graded-Channel SOI MOSFETs

A Novel Single-Gated Strained CMOS Architecture: COSMOS

Dead zone free area efficient Charge Pump Phase Frequency Detector in nanoscale DG-MOSFET

Grating Couplers for Fiber-to-Fiber Characterizations of Stand-Alone Dielectric Loaded Surface Plasmon Waveguide Components

High power AlGaN/GaN HFET with a high breakdown voltage of over 1.8 kV on 4 inch Si substrates and the suppression of current collapse

Design of DG-MOSFETs for high linearity performance

A closed form memristor SPICE model and oscillator

High-power AlGaN/GaN MIS-HFETs with field-plates on Si substrates

Optimum biasing and design of high performance double gate MOSFET RF mixers

Evaluation and performance analysis of energy efficient wireless NoC architecture

iWISE: Inter-router Wireless Scalable Express Channels for Network-on-Chips (NoCs) Architecture

On Tunable Compact Analog Circuits with Nanoscale DG-MOSFETs

Quantification of food intake using food image analysis

Effect of oxide interface roughness on the threshold voltage fluctuations in decanano MOSFETs with ultrathin gate oxides

Scaling of RF linearity in DG and SOI MOSFETs

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