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Applications of Synchrotron Radiation to Materials Analysis

1, 1996

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Cobalt impurities in synthetic diamond

Diamond and related materials, 1999-10, Vol.8 (10), p.1895-1899

1999

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Summary of ISO/TC 201 Standard: VI ISO 14706:2000-Surface chemical analysis-Determination of surface elemental contamination on silicon wafers by total reflection x-ray fluorescence (TXRF) spectroscopy

Surface and interface analysis, 2002-04, Vol.33 (4), p.369-370

Gohshi, Yohichi

2002

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An experimental comparison of the total-electron-yield and conversion-electron-yield modes for near-surface characterization using X-ray excitation

Journal of electron spectroscopy and related phenomena, 1997-10, Vol.87 (1), p.81-89

1997

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Instrumentation chemistry — a versatile strategy

TrAC, Trends in analytical chemistry (Regular ed.), 1991-08, Vol.10 (7), p.202-206

Gohshi, Yohichi

1991

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High-frequency split zero-vector PWM with harmonic reduction for induction motor drive

IEEE transactions on industry applications, 1992-01, Vol.28 (1), p.105-112

1992

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Development of a high mass-resolution TOF-ERDA system for a wide mass range

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1997-04, Vol.124 (1), p.95-99

1997

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Material analysis end-station of the Hyogo-ken beamline at SPring-8

Journal of synchrotron radiation, 1998-05, Vol.5 (3), p.509-511

1998

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Long range ordering observations by high resolution x-ray fluorescence spectroscopy

Solid state communications, 1991-12, Vol.80 (11), p.951-952

1991

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Trace analysis, chemical state analysis and instrumentation chemistry – several experiences in research life

Spectrochimica acta. Part B: Atomic spectroscopy, 1999-01, Vol.54 (1), p.21-28

Gohshi, Yohichi

1999

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Analysis of trace Co in synthetic diamonds using synchrotron radiation excited X-ray fluorescence analysis

Journal of crystal growth, 2000-03, Vol.210 (1), p.388-394

2000

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Standardization of Total Reflection X-ray Fluorescence Analysis

Materia Japan, 2003/01/20, Vol.42(1), pp.20-23

Gohshi, Yohichi

2003

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Grazing incidence X-ray fluorescence analysis

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 1986-05, Vol.246 (1), p.736-738

1986

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X-ray microanalysis with energy tunable synchrotron X-rays

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1990-04, Vol.49 (1), p.555-560

1990

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Unusually Strong Interactions Mediated by Both .pi.-.pi. Stacking and CH-.pi. Interactions Present in the Dimer of Nickel(II) Complex Coordinated with n-Butyl-Substituted Salen

Journal of the American Chemical Society, 1995-03, Vol.117 (8), p.2377-2378

1995

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Energy dispersive X-ray fluorescence analysis with synchrotron radiation

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 1985-01, Vol.228 (2-3), p.556-563

1985

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The slip-reducing mechanism in polypropylene-laminated films studied by FTIR and XPS

Journal of applied polymer science, 1993-07, Vol.49 (4), p.711-717

1993

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Imaging the phenol molecule adsorbed in TiO2(110) by scanning tunneling microscopy

Surface science, 1989-09, Vol.219 (3), p.L531-L536

1989

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High resolution soft X-ray absorption spectroscopy for the chemical state analysis of Mn

Spectrochimica acta. Part B: Atomic spectroscopy, 2000-09, Vol.55 (9), p.1385-1395

2000

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Chemical state analysis of Al by high resolution X-ray spectroscopy

Spectrochimica acta. Part B: Atomic spectroscopy, 1981, Vol.36 (7), p.763-765

Gohshi, Yohichi

1981

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X-ray irradiation effects on superconductivity of cuprate superconductor thin films

Journal of applied physics, 1991-12, Vol.70 (11), p.6945-6951

1991

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Synchrotron radiation excited X-ray fluorescence analysis using wide band pass monochromators

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 1985-01, Vol.235 (3), p.597-602

1985

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A Simple and Rugged Home-Built Scanning Tunneling Microscope for Operation in Both Air and Liquid

Bulletin of the Chemical Society of Japan, 1989-09, Vol.62 (9), p.2890-2896

1989

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Iron and Chromium as Impurities in Artificial Diamonds

The review of high pressure science and technology, 1998, Vol.7, p.998-1000

1998

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A Method for Background Reduction in IR Spectroscopy

Applied spectroscopy, 1989-01, Vol.43 (1), p.154-156

1989

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Applications of Synchrotron Radiation to Materials Analysis

Cobalt impurities in synthetic diamond

Summary of ISO/TC 201 Standard: VI ISO 14706:2000-Surface chemical analysis-Determination of surface elemental contamination on silicon wafers by total reflection x-ray fluorescence (TXRF) spectroscopy

An experimental comparison of the total-electron-yield and conversion-electron-yield modes for near-surface characterization using X-ray excitation

Instrumentation chemistry — a versatile strategy

High-frequency split zero-vector PWM with harmonic reduction for induction motor drive

Development of a high mass-resolution TOF-ERDA system for a wide mass range

Material analysis end-station of the Hyogo-ken beamline at SPring-8

Long range ordering observations by high resolution x-ray fluorescence spectroscopy

Trace analysis, chemical state analysis and instrumentation chemistry – several experiences in research life

Analysis of trace Co in synthetic diamonds using synchrotron radiation excited X-ray fluorescence analysis

Standardization of Total Reflection X-ray Fluorescence Analysis

Grazing incidence X-ray fluorescence analysis

X-ray microanalysis with energy tunable synchrotron X-rays

Unusually Strong Interactions Mediated by Both .pi.-.pi. Stacking and CH-.pi. Interactions Present in the Dimer of Nickel(II) Complex Coordinated with n-Butyl-Substituted Salen

Energy dispersive X-ray fluorescence analysis with synchrotron radiation

The slip-reducing mechanism in polypropylene-laminated films studied by FTIR and XPS

Imaging the phenol molecule adsorbed in TiO2(110) by scanning tunneling microscopy

High resolution soft X-ray absorption spectroscopy for the chemical state analysis of Mn

Chemical state analysis of Al by high resolution X-ray spectroscopy

X-ray irradiation effects on superconductivity of cuprate superconductor thin films

Synchrotron radiation excited X-ray fluorescence analysis using wide band pass monochromators

A Simple and Rugged Home-Built Scanning Tunneling Microscope for Operation in Both Air and Liquid

Iron and Chromium as Impurities in Artificial Diamonds

A Method for Background Reduction in IR Spectroscopy

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