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Contribution of Atrial Fibrillation to In-Hospital Mortality in Patients With COVID-19

Circulation. Arrhythmia and electrophysiology, 2021-02, Vol.14 (2), p.e009375-e009375

2021

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COVID-19 and related symptoms in patients under disulfiram for alcohol use disorder

Internal and emergency medicine, 2021-09, Vol.16 (6), p.1729-1731

2021

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Effect of Nanodiamond Particles Incorporation in Hydroxyapatite Coatings

ECS transactions, 2009, Vol.25 (3), p.403-410

2009

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Comparison of Evaluation Criteria for Efficient Gettering of Cu and Ni in Silicon Wafers

ECS transactions, 2009, Vol.25 (3), p.67-78

2009

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Drain Leakage Current Evaluation in the Diamond SOI nMOSFET at High Temperatures

ECS transactions, 2009, Vol.25 (3), p.243-253

2009

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Probing Patterned Wafer Structures by Means of Grazing Incidence X-ray Fluorescence Analysis

ECS transactions, 2009, Vol.25 (3), p.441-451

2009

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Comparability of TXRF Systems at Different Laboratories

ECS transactions, 2009, Vol.25 (3), p.325-335

2009

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Investigations of the Surface Chemical Composition and Atomic Structure of ex-situ Sulfur Passivated Ge(100)

ECS transactions, 2009, Vol.25 (3), p.421-432

2009

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Electrical Characterization of Deep-Lying Donor Layers Created by Proton Implantation and Subsequent Annealing in N-Type Float Zone and Czochralski Silicon

ECS transactions, 2009, Vol.25 (3), p.55-65

2009

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Studies on Galvanic Corrosion on Floating and Grounded Bondpads in Wafer Fabrication

ECS transactions, 2009, Vol.25 (3), p.219-223

2009

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Advanced Application of Resistivity and Hall Effect Measurements to Characterization of Silicon

ECS transactions, 2009, Vol.25 (3), p.25-34

2009

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Detection of Vacancy Distributions by Decoration with Hydrogen

ECS transactions, 2009, Vol.25 (3), p.35-49

2009

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Si Wafer Analysis of Light Elements by TXRF

ECS transactions, 2009, Vol.25 (3), p.301-309

2009

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Revealing Copper Contamination in Silicon after Low Temperature Treatments

ECS transactions, 2009, Vol.25 (3), p.337-348

2009

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Defect Analysis in Solar Cell Silicon by Photoluminescence Spectroscopy and Topography

ECS transactions, 2009, Vol.25 (3), p.3-10

2009

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Controlling Copper ECD Processes by Early Fault Detection and Diagnosis Using In-situ Electrochemical Sensor Coupled with Pattern Recognition Chemometrics

ECS transactions, 2009, Vol.25 (3), p.199-217

2009

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Investigation on Particle Generation Mechanism during Dichlorosilane-Based WSi Deposition Process

ECS transactions, 2009, Vol.25 (3), p.225-231

2009

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A Comparison Between Self-assembled Monolayers on Gold and Germanium Employing Grazing Incidence X-ray Absorption Spectrometry GIXRF-NEXAFS

ECS transactions, 2009, Vol.25 (3), p.433-439

2009

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Poly Si TFT on Microsheet

ECS transactions, 2009, Vol.25 (3), p.255-258

Won, Sunghwan

2009

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Characterisation of High-k Containing Nanolayers by Reference-Free X-Ray Fluorescence Analysis with Synchrotron Radiation

ECS transactions, 2009, Vol.25 (3), p.293-300

2009

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Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction

ECS transactions, 2009, Vol.25 (3), p.373-378

2009

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New Modes of Fast Fourier Impedance Spectroscopy Applied to Solar Materials Characterization and Semiconductor Pore Etching

ECS transactions, 2009, Vol.25 (3), p.11-23

2009

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A Study of the Morphology of 3C-SiC Layers Grown at Different C/Si Ratios

ECS transactions, 2009, Vol.25 (3), p.397-401

2009

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Considerable Improvement of Depth Resolution in Auger Sputter Depth Profiling of Polycrystalline Thin Films Using In-situ Sample Preparation Methods

ECS transactions, 2009, Vol.25 (3), p.103-117

Scheithauer, Uwe

2009

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Assessing Various Analytical Techniques with Different Lateral Resolution by Investigating Spin-coated Inorganic Contamination on Si Wafer Surfaces

ECS transactions, 2009, Vol.25 (3), p.311-323

2009

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Contribution of Atrial Fibrillation to In-Hospital Mortality in Patients With COVID-19

COVID-19 and related symptoms in patients under disulfiram for alcohol use disorder

Effect of Nanodiamond Particles Incorporation in Hydroxyapatite Coatings

Comparison of Evaluation Criteria for Efficient Gettering of Cu and Ni in Silicon Wafers

Drain Leakage Current Evaluation in the Diamond SOI nMOSFET at High Temperatures

Probing Patterned Wafer Structures by Means of Grazing Incidence X-ray Fluorescence Analysis

Comparability of TXRF Systems at Different Laboratories

Investigations of the Surface Chemical Composition and Atomic Structure of ex-situ Sulfur Passivated Ge(100)

Electrical Characterization of Deep-Lying Donor Layers Created by Proton Implantation and Subsequent Annealing in N-Type Float Zone and Czochralski Silicon

Studies on Galvanic Corrosion on Floating and Grounded Bondpads in Wafer Fabrication

Advanced Application of Resistivity and Hall Effect Measurements to Characterization of Silicon

Detection of Vacancy Distributions by Decoration with Hydrogen

Si Wafer Analysis of Light Elements by TXRF

Revealing Copper Contamination in Silicon after Low Temperature Treatments

Defect Analysis in Solar Cell Silicon by Photoluminescence Spectroscopy and Topography

Controlling Copper ECD Processes by Early Fault Detection and Diagnosis Using In-situ Electrochemical Sensor Coupled with Pattern Recognition Chemometrics

Investigation on Particle Generation Mechanism during Dichlorosilane-Based WSi Deposition Process

A Comparison Between Self-assembled Monolayers on Gold and Germanium Employing Grazing Incidence X-ray Absorption Spectrometry GIXRF-NEXAFS

Poly Si TFT on Microsheet

Characterisation of High-k Containing Nanolayers by Reference-Free X-Ray Fluorescence Analysis with Synchrotron Radiation

Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction

New Modes of Fast Fourier Impedance Spectroscopy Applied to Solar Materials Characterization and Semiconductor Pore Etching

A Study of the Morphology of 3C-SiC Layers Grown at Different C/Si Ratios

Considerable Improvement of Depth Resolution in Auger Sputter Depth Profiling of Polycrystalline Thin Films Using In-situ Sample Preparation Methods

Assessing Various Analytical Techniques with Different Lateral Resolution by Investigating Spin-coated Inorganic Contamination on Si Wafer Surfaces

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