UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

When Should a Black Box Be Transparent?: When is a replacement not a replacement?

ACM queue, 2022-04, Vol.20 (2), p.11-15

Neville-Neil, George V.

2022

Volltextzugriff (PDF)

The Fun in Fuzzing: The debugging technique comes into its own

ACM queue, 2022-12, Vol.20 (6), p.80-87

2022

Volltextzugriff (PDF)

Taking Flight with Copilot: Early insights and opportunities of AI-powered pair-programming tools

ACM queue, 2022-12, Vol.20 (6), p.35-57

2022

Volltextzugriff (PDF)

Getting Off the Mad Path: Debuggers and assertions

ACM queue, 2021-12, Vol.19 (6), p.18-21

Neville-Neil, George V.

2021

Volltextzugriff (PDF)

Improving Testing of Deep-learning Systems: A combination of differential and mutation testing results in better test data

ACM queue, 2023-10, Vol.21 (5), p.54-65

2023

Volltextzugriff (PDF)

Divide and Conquer: The use and limits of bisection

ACM queue, 2021-06, Vol.19 (3), p.37-39

Neville-Neil, George V.

2021

Volltextzugriff (PDF)

Debugging Incidents in Google’s Distributed Systems: How experts debug production issues in complex distributed systems

ACM queue, 2020-04, Vol.18 (2), p.47-66

2020

Volltextzugriff (PDF)

To Catch a Failure: The Record-and-Replay Approach to Debugging: A discussion with Robert O’Callahan, Kyle Huey, Devon O’Dell, and Terry Coatta

ACM queue, 2020-02, Vol.18 (1), p.61-79

2020

Volltextzugriff (PDF)

EngageCSEduAssignments: to re-use or not re-use? That is the question

ACM Inroads, 2021-09, Vol.12 (3), p.18-20

2021

Volltextzugriff (PDF)

Writing an online debugging program for the experienced user

Communications of the ACM, 1968-06, Vol.11 (6), p.423-427

Brady, Paul T.

1968

Volltextzugriff (PDF)

Ultra-Low Noise Defect Probing Instrument for Defect Spectroscopy of MOS Transistors

IEEE transactions on device and materials reliability, 2020-06, Vol.20 (2), p.242-250

Waltl, Michael

2020

Volltextzugriff (PDF)

Aging and Sintered Layer Defect Detection of Discrete MOSFETs Using Frequency Domain Reflectometry Associated With Parasitic Resistance

IEEE transactions on device and materials reliability, 2024-03, Vol.24 (1), p.1-1

2024

Volltextzugriff (PDF)

Machine Learning Approach for Prediction of Point Defect Effect in FinFET

IEEE transactions on device and materials reliability, 2021-06, Vol.21 (2), p.252-257

2021

Volltextzugriff (PDF)

An automated cucumber inspection system based on neural network

Journal of food process engineering, 2022-09, Vol.45 (9), p.n/a

2022

Volltextzugriff (PDF)

Extraction of Charge Trapping Kinetics of Defects From Single-Defect Measurements

IEEE transactions on device and materials reliability, 2024-06, Vol.24 (2), p.168-173

2024

Volltextzugriff (PDF)

Visual Exploration and Analysis of Simulation and Testing Data in Motor Engineering

IEEE computer graphics and applications, 2024-07, Vol.44 (4), p.113-125

2024

Volltextzugriff (PDF)

Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO2Transistors

IEEE transactions on device and materials reliability, 2023-09, Vol.23 (3), p.355

2023

Volltextzugriff (PDF)

LCHC-DFT: A Low-Cost High-Coverage Design-for-Testability Technique to Detect Hard-to-Detect Faults in STT-MRAMs in the Presence of Process Variations

IEEE transactions on device and materials reliability, 2022-12, Vol.22 (4), p.477-487

2022

Volltextzugriff (PDF)

A deep reinforcement learning‐based maintenance optimization for vacuum packaging machines considering product quality degradation

Journal of food process engineering, 2023-11, Vol.46 (11)

2023

Volltextzugriff (PDF)

Assessing AMS-RF Test Quality by Defect Simulation

IEEE transactions on device and materials reliability, 2019-03, Vol.19 (1), p.55-63

2019

Volltextzugriff (PDF)

CD-DFT: A Current-Difference Design-for-Testability to Detect Short Defects of STT-MRAM Under Process Variations

IEEE transactions on device and materials reliability, 2021-09, Vol.21 (3), p.436-443

2021

Volltextzugriff (PDF)

Extraction of Statistical Gate Oxide Parameters From Large MOSFET Arrays

IEEE transactions on device and materials reliability, 2020-06, Vol.20 (2), p.251-257

2020

Volltextzugriff (PDF)

Universal Dielectric Breakdown Modeling Under Off-State TDDB for Ultra-Scaled Device From 130nm to 28nm Nodes and Beyond

IEEE transactions on device and materials reliability, 2024-06, Vol.24 (2), p.174-183

2024

Volltextzugriff (PDF)

You-Only-Look-Once Multiple-Strategy Printed Circuit Board Defect Detection Model

IEEE multimedia, 2024-01, Vol.31 (1), p.76-87

2024

Volltextzugriff (PDF)

On the Distribution of Single Defect Threshold Voltage Shifts in SiON Transistors

IEEE transactions on device and materials reliability, 2021-06, Vol.21 (2), p.199-206

2021

Volltextzugriff (PDF)

1 – 25 von 537

Suche als RSS-Feed

Aktive Filter

KollektionOxford Journals

Publikationsformmagazinearticle

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(97)
Mit Volltextzugriff
(371)

Sprache

Erscheinungsjahr

n.n

Thema

Science & Technology
(345)
Technology
(343)
Defects
(338)
Engineering
(322)
Engineering, Electrical & Electronic
(198)
Physics
(147)
Physical Sciences
(141)
Physics, Applied
(136)
Software
(70)
Computer Science
(56)
Manufacturing
(54)
Physics, Condensed Matter
(48)
Quality Control
(47)
Inspections
(46)
Computer Science, Software Engineering
(45)
Semiconductors
(44)
Exact Sciences And Technology
(40)
Computer Science, Hardware & Architecture
(39)
Engineering, Mechanical
(38)
Software And Its Engineering
(38)

15 weitere anzeigen...

Weniger anzeigen...

Kollektion

12 weitere anzeigen...

Weniger anzeigen...

Zeitschrift / Serie

5 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

When Should a Black Box Be Transparent?: When is a replacement not a replacement?

The Fun in Fuzzing: The debugging technique comes into its own

Taking Flight with Copilot: Early insights and opportunities of AI-powered pair-programming tools

Getting Off the Mad Path: Debuggers and assertions

Improving Testing of Deep-learning Systems: A combination of differential and mutation testing results in better test data

Divide and Conquer: The use and limits of bisection

Debugging Incidents in Google’s Distributed Systems: How experts debug production issues in complex distributed systems

To Catch a Failure: The Record-and-Replay Approach to Debugging: A discussion with Robert O’Callahan, Kyle Huey, Devon O’Dell, and Terry Coatta

EngageCSEduAssignments: to re-use or not re-use? That is the question

Writing an online debugging program for the experienced user

Ultra-Low Noise Defect Probing Instrument for Defect Spectroscopy of MOS Transistors

Aging and Sintered Layer Defect Detection of Discrete MOSFETs Using Frequency Domain Reflectometry Associated With Parasitic Resistance

Machine Learning Approach for Prediction of Point Defect Effect in FinFET

An automated cucumber inspection system based on neural network

Extraction of Charge Trapping Kinetics of Defects From Single-Defect Measurements

Visual Exploration and Analysis of Simulation and Testing Data in Motor Engineering

Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO2Transistors

LCHC-DFT: A Low-Cost High-Coverage Design-for-Testability Technique to Detect Hard-to-Detect Faults in STT-MRAMs in the Presence of Process Variations

A deep reinforcement learning‐based maintenance optimization for vacuum packaging machines considering product quality degradation

Assessing AMS-RF Test Quality by Defect Simulation

CD-DFT: A Current-Difference Design-for-Testability to Detect Short Defects of STT-MRAM Under Process Variations

Extraction of Statistical Gate Oxide Parameters From Large MOSFET Arrays

Universal Dielectric Breakdown Modeling Under Off-State TDDB for Ultra-Scaled Device From 130nm to 28nm Nodes and Beyond

You-Only-Look-Once Multiple-Strategy Printed Circuit Board Defect Detection Model

On the Distribution of Single Defect Threshold Voltage Shifts in SiON Transistors

Aktive Filter

Suchergebnisse filtern