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The Journal of chemical physics, 2005-06, Vol.122 (24), p.244707-244707
2005
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The Journal of chemical physics, 2002-12, Vol.117 (23), p.10715-10725
2002
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The Journal of chemical physics, 2004-03, Vol.120 (12), p.5536-5542
2004
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Journal of applied physics, 2002-01, Vol.91 (2), p.551-564
2002
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Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2004-05, Vol.22 (3), p.1565-1569
2004
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Journal of applied physics, 2002-01, Vol.91 (1), p.171-177
2002
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Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2005-05, Vol.23 (3), p.1262-1266
2005
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Applied physics letters, 2001-10, Vol.79 (18), p.2982-2984
2001
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Applied physics letters, 1999-11, Vol.75 (20), p.3207-3209
1999
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Applied physics letters, 2001-03, Vol.78 (13), p.1879-1881
2001
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Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2001-07, Vol.19 (4), p.1510-1514
2001
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The Journal of chemical physics, 2000-01, Vol.112 (4), p.1757-1762
2000
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The Journal of chemical physics, 1999-07, Vol.111 (1), p.216-226
1999
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Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2002-05, Vol.20 (3), p.1200-1204
2002
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Journal of applied physics, 1998-07, Vol.84 (1), p.205-208
1998
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The Journal of chemical physics, 1999-02, Vol.110 (8), p.3823-3834
1999
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Journal of applied physics, 1997-02, Vol.81 (4), p.1708-1714
1997
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The Journal of chemical physics, 1997-04, Vol.106 (14), p.5920-5927
1997
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Determination of interface layer strain of Si/SiO2 interfaces by reflectance difference spectroscopy
1997
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Applied physics letters, 1995-09, Vol.67 (12), p.1695-1697
1995
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Applied physics letters, 1991-12, Vol.59 (26), p.3419-3421
1991
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Applied physics letters, 1995-09, Vol.67 (13), p.1891-1893
1995
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Applied physics letters, 1992-05, Vol.60 (18), p.2255-2257
1992
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Applied physics letters, 1992-01, Vol.60 (1), p.56-58
1992
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The Journal of chemical physics, 1978-01, Vol.69 (8), p.3622-3631
1978
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- Applied Physics Letters
- Journal Of Applied Physics
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- Journal Of Vacuum Science & Technology. B, Microelectronics And Nanometer Structures Processing, Measurement And Phenomena
- Journal Of Vacuum Science & Technology B: Microelectronics And Nanometer Structures
- Journal Of Vacuum Science And Technology. B, Nanotechnology & Microelectronics
- Journal Of Vacuum Science & Technology B: Microelectronics And Nanometer Structures Processing, Measurement, And Phenomena
- Review Of Scientific Instruments
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- Journal Of Vacuum Science & Technology. A, Vacuum, Surfaces, And Films