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An atomic force microscope tip designed to measure time-varying nanomechanical forces

Nature nanotechnology, 2007-08, Vol.2 (8), p.507-514

2007

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An atomic force microscope tip designed to measure time-varying nanomechanical forces

Nature nanotechnology, 2007-07, Vol.2 (8), p.507-514

2007

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Revealing the Hidden Atom in Graphite by Low-Temperature Atomic Force Microscopy

Proceedings of the National Academy of Sciences - PNAS, 2003-10, Vol.100 (22), p.12539-12542

2003

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Exploring the nanoworld with atomic force microscopy

Physics today, 2006-12, Vol.59 (12), p.44-50

2006

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Process compatible polysilicon-based electrical through-wafer interconnects in silicon substrates

Journal of microelectromechanical systems, 2002-12, Vol.11 (6), p.631-640

2002

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Surface Characterization and Electrochemical Properties of Alkyl, Fluorinated Alkyl, and Alkoxy Monolayers on Silicon

Langmuir, 2001-05, Vol.17 (11), p.3460-3465

2001

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Integrated nanotube circuits: Controlled growth and ohmic contacting of single-walled carbon nanotubes

Applied physics letters, 1999-08, Vol.75 (5), p.627-629

1999

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Microoptical characterization of piezoelectric vibratory microinjections in drosophila embryos for genome-wide RNAi screen

Journal of microelectromechanical systems, 2006-04, Vol.15 (2), p.277-286

2006

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Synthesis and Preparation of Ionically Bound Dendrimer Monolayers and Application toward Scanning Probe Lithography

Chemistry of materials, 1999-10, Vol.11 (10), p.2892-2898

1999

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Ultralow biased field emitter using single-wall carbon nanotube directly grown onto silicon tip by thermal chemical vapor deposition

Applied physics letters, 2001-01, Vol.78 (4), p.539-540

2001

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Silicon nitride cantilevers with oxidation-sharpened silicon tips for atomic force microscopy

Journal of microelectromechanical systems, 2002-08, Vol.11 (4), p.317-321

2002

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Microfabricated silicon solid immersion lens

Journal of microelectromechanical systems, 2001-09, Vol.10 (3), p.450-459

2001

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Scanning Probes as the Gateway to Nanotechnology

Japanese Journal of Applied Physics, 2003, Vol.42 (Part 1, No. 7B), p.4777-4779

Quate, Calvin F.

2003

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Vacuum Tunneling: A New Technique for Microscopy

Physics today, 1986-08, Vol.39 (8), p.26-33

Quate, Calvin F.

1986

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Noncontact nanolithography using the atomic force microscope

Applied physics letters, 1998-10, Vol.73 (17), p.2527-2529

1998

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Resonant harmonic response in tapping-mode atomic force microscopy

Physical review. B, Condensed matter and materials physics, 2004-04, Vol.69 (16), Article 165416

2004

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Single-Molecule Recognition Imaging Microscopy

Proceedings of the National Academy of Sciences - PNAS, 2004-08, Vol.101 (34), p.12503-12507

2004

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Nanoscience and Engineering: The Next Five Years

Journal of nanoparticle research : an interdisciplinary forum for nanoscale science and technology, 1999-03, Vol.1 (1), p.131

Quate, Calvin F

1999

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Micromachined silicon nitride solid immersion lens

Journal of microelectromechanical systems, 2002-10, Vol.11 (5), p.470-478

2002

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Nanometer-scale patterning and individual current-controlled lithography using multiple scanning probes

Review of scientific instruments, 1999-06, Vol.70 (6), p.2822-2827

1999

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Nanoscale Visualization and Characterization of Myxococcus xanthus Cells with Atomic Force Microscopy

Proceedings of the National Academy of Sciences - PNAS, 2005-05, Vol.102 (18), p.6484-6489

2005

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Ultra-Low Resistance, Through-Wafer Via (TWV) Technology and Its Applications in Three Dimensional Structures on Silicon

Japanese Journal of Applied Physics, 1999-04, Vol.38 (4S), p.2393

1999

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Dendrimer-Based Self-Assembled Monolayers as Resists for Scanning Probe Lithography

Advanced materials (Weinheim), 1999-03, Vol.11 (4), p.314-318

1999

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Single-Chip Mechatronic Microsystem for Surface Imaging and Force Response Studies

Proceedings of the National Academy of Sciences - PNAS, 2004-12, Vol.101 (49), p.17011-17015

2004

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Preparation of STM tips for in‐situ characterization of electrode surfaces

Journal of microscopy (Oxford), 1988-12, Vol.152 (3), p.651-661

1988

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An atomic force microscope tip designed to measure time-varying nanomechanical forces

An atomic force microscope tip designed to measure time-varying nanomechanical forces

Revealing the Hidden Atom in Graphite by Low-Temperature Atomic Force Microscopy

Exploring the nanoworld with atomic force microscopy

Process compatible polysilicon-based electrical through-wafer interconnects in silicon substrates

Surface Characterization and Electrochemical Properties of Alkyl, Fluorinated Alkyl, and Alkoxy Monolayers on Silicon

Integrated nanotube circuits: Controlled growth and ohmic contacting of single-walled carbon nanotubes

Microoptical characterization of piezoelectric vibratory microinjections in drosophila embryos for genome-wide RNAi screen

Synthesis and Preparation of Ionically Bound Dendrimer Monolayers and Application toward Scanning Probe Lithography

Ultralow biased field emitter using single-wall carbon nanotube directly grown onto silicon tip by thermal chemical vapor deposition

Silicon nitride cantilevers with oxidation-sharpened silicon tips for atomic force microscopy

Microfabricated silicon solid immersion lens

Scanning Probes as the Gateway to Nanotechnology

Vacuum Tunneling: A New Technique for Microscopy

Noncontact nanolithography using the atomic force microscope

Resonant harmonic response in tapping-mode atomic force microscopy

Single-Molecule Recognition Imaging Microscopy

Nanoscience and Engineering: The Next Five Years

Micromachined silicon nitride solid immersion lens

Nanometer-scale patterning and individual current-controlled lithography using multiple scanning probes

Nanoscale Visualization and Characterization of Myxococcus xanthus Cells with Atomic Force Microscopy

Ultra-Low Resistance, Through-Wafer Via (TWV) Technology and Its Applications in Three Dimensional Structures on Silicon

Dendrimer-Based Self-Assembled Monolayers as Resists for Scanning Probe Lithography

Single-Chip Mechatronic Microsystem for Surface Imaging and Force Response Studies

Preparation of STM tips for in‐situ characterization of electrode surfaces

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