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Quantitative analysis of doped/undoped ZnO nanomaterials using laser assisted atom probe tomography: Influence of the analysis parameters

Journal of applied physics, 2015-12, Vol.118 (21)

2015

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Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field

Journal of physical chemistry. C, 2014-10, Vol.118 (41), p.24136-24151

2014

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Structural and optical characterization of pure Si-rich nitride thin films

Nanoscale research letters, 2013-01, Vol.8 (1), p.31-31, Article 31

2013

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Influence of Terbium Doping and Annealing on the Structural and Optical Characteristics of Sputtered Zinc Oxide Thin Films

Crystals (Basel), 2023-08, Vol.13 (8), p.1200

2023

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Tunneling Atomic Layer-Deposited Aluminum Oxide: a Correlated Structural/Electrical Performance Study for the Surface Passivation of Silicon Junctions

Nanoscale research letters, 2019-10, Vol.14 (1), p.1-8, Article 330

2019

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Infrared Spectroscopic Evidence of WS2 Morphology Change With Citric Acid Addition and Sulfidation Temperature

Frontiers in chemical engineering, 2022-01, Vol.3

2022

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Growth and characterization of pure and Pr3+-doped Cs4PbBr6 crystals

Journal of crystal growth, 2008-12, Vol.310 (24), p.5458-5463

2008

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Effect of the Nd content on the structural and photoluminescence properties of silicon-rich silicon dioxide thin films

Nanoscale research letters, 2011-02, Vol.6 (1), p.161-161, Article 161

2011

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Microstructure and optical properties of Pr3+-doped hafnium silicate films

Nanoscale research letters, 2013-01, Vol.8 (1), p.43-43, Article 43

2013

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CO–PROX reactions on copper Y2O3-ZrO2 catalysts prepared by a single step co-precipitation technique

Applied catalysis. B, Environmental, 2020-12, Vol.278, p.119258, Article 119258

2020

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Peculiarities of Thermally Activated Migration of Subvalent Impurities in Cu-Doped Y-Stabilized ZrO2 Nanopowders Produced From Zr Oxychlorides

Frontiers in materials, 2018-04, Vol.5

2018

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Thickness-dependent optimization of Er3+ light emission from silicon-rich silicon oxide thin films

Nanoscale research letters, 2011-05, Vol.6 (1), p.395-395, Article 395

2011

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Role of the oxidation conditions on the orientation of TiNxOy grown by atomic layer deposition: Impact on the optical and electrical properties

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2024-09, Vol.42 (5)

2024

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Corrigendum to “CO–PROX reactions on copper Y2O3-ZrO2 catalysts prepared by a single step co-precipitation technique” [Appl. Catal. B: Environ. 278 (1-12) (2020) 119258]

Applied catalysis. B, Environmental, 2021-02, Vol.281, p.119466, Article 119466

2021

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Formation and stability of CoMoS nanoclusters by the addition of citric acid: A study by high resolution STEM-HAADF microscopy

Catalysis today, 2021-10, Vol.377, p.127-134

2021

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Optical constants and thickness determination of La 2 / 3 Sr 1 / 3 MnO3 thin films on Nb:SrTiO3 substrates by spectro-ellipsometry: Combination of optical and X-ray techniques

Applied surface science, 2024-10, Vol.669, p.160489, Article 160489

2024

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Optical constants and thickness determination of La2/3Sr1/3MnO3 thin films on Nb:SrTiO3 substrates by spectro-ellipsometry: Combination of optical and X-ray techniques

Applied surface science, 2024-10, Vol.669, Article 160489

2024

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High-resolution STEM-HAADF microscopy on a γ -Al 2 O 3 supported MoS 2 catalyst—proof of the changes in dispersion and morphology of the slabs with the addition of citric acid

Nanotechnology, 2020-01, Vol.31 (3), p.35706

2020

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High Resolution STEM-HAADF microscopy on γ-Al2O3 supported MoS2 catalyst – Proof by image of the changes in dispersion and morphology of the slabs with addition of citric acid

Nanotechnology, 2019-09, Vol.31 (3)

2019

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Direct Evidence of the Role of Co or Pt, Co Single-Atom Promoters on the Performance of MoS2 Nanoclusters for the Hydrogen Evolution Reaction

ACS catalysis, 2023-01, Vol.13 (2), p.1221-1229

2023

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Sub-nanometer atomic layer deposited Al2O3 barrier layer for improving stability of nonfullerene organic solar cells

Organic electronics, 2021-12, Vol.99, p.106351, Article 106351

2021

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High-resolution STEM-HAADF microscopy on a γ-Al2O3 supported MoS2 catalyst-proof of the changes in dispersion and morphology of the slabs with the addition of citric acid

Nanotechnology, 2020-01, Vol.31 (3), p.035706-035706

2020

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Promoter Location on NiW/Al 2 O 3 Sulfide Catalysts: Parallel Study by IR/CO Spectroscopy and High-Resolution STEM-HAADF Microscopy

ACS catalysis, 2020-06, Vol.10 (11), p.6568-6578

2020

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Identification of (Tb,Eu)9.43(SiO4)6O2−δ Oxy-Apatite Structures as Nanometric Inclusions in Annealed (Eu,Tb)-Doped ZnO/Si Junctions: Combined Electron Diffraction and Chemical Contrast Imaging Studies

Inorganic chemistry, 2021-04, Vol.60 (7), p.4508-4516

2021

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Identification of (Tb,Eu) 9.43 (SiO 4 ) 6 O 2-δ Oxy-Apatite Structures as Nanometric Inclusions in Annealed (Eu,Tb)-Doped ZnO/Si Junctions: Combined Electron Diffraction and Chemical Contrast Imaging Studies

Inorganic chemistry, 2021-04, Vol.60 (7), p.4508-4516

2021

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Quantitative analysis of doped/undoped ZnO nanomaterials using laser assisted atom probe tomography: Influence of the analysis parameters

Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field

Structural and optical characterization of pure Si-rich nitride thin films

Influence of Terbium Doping and Annealing on the Structural and Optical Characteristics of Sputtered Zinc Oxide Thin Films

Tunneling Atomic Layer-Deposited Aluminum Oxide: a Correlated Structural/Electrical Performance Study for the Surface Passivation of Silicon Junctions

Infrared Spectroscopic Evidence of WS2 Morphology Change With Citric Acid Addition and Sulfidation Temperature

Growth and characterization of pure and Pr3+-doped Cs4PbBr6 crystals

Effect of the Nd content on the structural and photoluminescence properties of silicon-rich silicon dioxide thin films

Microstructure and optical properties of Pr3+-doped hafnium silicate films

CO–PROX reactions on copper Y2O3-ZrO2 catalysts prepared by a single step co-precipitation technique

Peculiarities of Thermally Activated Migration of Subvalent Impurities in Cu-Doped Y-Stabilized ZrO2 Nanopowders Produced From Zr Oxychlorides

Thickness-dependent optimization of Er3+ light emission from silicon-rich silicon oxide thin films

Role of the oxidation conditions on the orientation of TiNxOy grown by atomic layer deposition: Impact on the optical and electrical properties

Corrigendum to “CO–PROX reactions on copper Y2O3-ZrO2 catalysts prepared by a single step co-precipitation technique” [Appl. Catal. B: Environ. 278 (1-12) (2020) 119258]

Formation and stability of CoMoS nanoclusters by the addition of citric acid: A study by high resolution STEM-HAADF microscopy

Optical constants and thickness determination of La 2 / 3 Sr 1 / 3 MnO3 thin films on Nb:SrTiO3 substrates by spectro-ellipsometry: Combination of optical and X-ray techniques

Optical constants and thickness determination of La2/3Sr1/3MnO3 thin films on Nb:SrTiO3 substrates by spectro-ellipsometry: Combination of optical and X-ray techniques

High-resolution STEM-HAADF microscopy on a γ -Al 2 O 3 supported MoS 2 catalyst—proof of the changes in dispersion and morphology of the slabs with the addition of citric acid

High Resolution STEM-HAADF microscopy on γ-Al2O3 supported MoS2 catalyst – Proof by image of the changes in dispersion and morphology of the slabs with addition of citric acid

Direct Evidence of the Role of Co or Pt, Co Single-Atom Promoters on the Performance of MoS2 Nanoclusters for the Hydrogen Evolution Reaction

Sub-nanometer atomic layer deposited Al2O3 barrier layer for improving stability of nonfullerene organic solar cells

High-resolution STEM-HAADF microscopy on a γ-Al2O3 supported MoS2 catalyst-proof of the changes in dispersion and morphology of the slabs with the addition of citric acid

Promoter Location on NiW/Al 2 O 3 Sulfide Catalysts: Parallel Study by IR/CO Spectroscopy and High-Resolution STEM-HAADF Microscopy

Identification of (Tb,Eu)9.43(SiO4)6O2−δ Oxy-Apatite Structures as Nanometric Inclusions in Annealed (Eu,Tb)-Doped ZnO/Si Junctions: Combined Electron Diffraction and Chemical Contrast Imaging Studies

Identification of (Tb,Eu) 9.43 (SiO 4 ) 6 O 2-δ Oxy-Apatite Structures as Nanometric Inclusions in Annealed (Eu,Tb)-Doped ZnO/Si Junctions: Combined Electron Diffraction and Chemical Contrast Imaging Studies

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