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Image Analysis and Processing - ICIAP 2023 Workshops, p.170-178
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2015 IEEE Radiation Effects Data Workshop (REDW), 2015, p.1-5
2015
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2010 IEEE International Reliability Physics Symposium, 2010, p.400-406
2010
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2011 International Reliability Physics Symposium, 2011, p.EX.1.1-EX.1.5
2011
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Proceedings Design, Automation and Test in Europe Conference and Exhibition, 2004, Vol.1, p.584-589 Vol.1
2004
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2010 IEEE International Reliability Physics Symposium, 2010, p.246-251
2010
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2009 27th IEEE VLSI Test Symposium, 2009, p.276-281
2009
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2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual, 2003, p.189-195
2003
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20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005, p.275-283
2005
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2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD), 2018, p.92-95
2018
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2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005, 2005, p.29-32
2005
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2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011, p.18-24
2011
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Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005, 2005, p.403-406
2005
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2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual, 2005, p.84-90
2005
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2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual, 2005, p.275-279
2005
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ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003, 2003, p.83-86
2003
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2012 IEEE International Reliability Physics Symposium (IRPS), 2012, p.3C.2.1-3C.2.7
2012
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2015 XVIII AISEM Annual Conference, 2015, p.1-4
2015
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2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005, 2005, p.139-142
2005
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2015 6th International Workshop on Advances in Sensors and Interfaces (IWASI), 2015, p.49-54
- Demaria, N.
- Dellacasa, G.
- Mazza, G.
- Rivetti, A.
- Da Rocha Rolo, M. D.
- Monteil, E.
- Pacher, L.
- Ciciriello, F.
- Corsi, F.
- Marzocca, C.
- De Roberts, G.
- Loddo, F.
- Tamma, C.
- Bagatin, M.
- Bisello, D.
- Gerardin, S.
- Mattiazzo, S.
- Ding, L.
- Giubilato, P.
- Paccagnella, A.
- De Canio, F.
- Gaioni, L.
- Manghisoni, M.
- Re, V.
- Traversi, G.
- Riceputi, E.
- Ratti, L.
- Vacchi, C.
- Beccherle, R.
- Magazzu, G.
- Minuti, M.
- Morsani, F.
- Palla, F.
- Liberali, V.
- Shojaii, S.
- Stabile, A.
- Bilei, G. M.
- Menichelli, M.
- Conti, E.
- Marconi, S.
- Passen, D.
- Placidi, P.
2015
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2016 IEEE International Reliability Physics Symposium (IRPS), 2016, p.5C-1-1-5C-1-5
2016
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2014 IEEE International Reliability Physics Symposium, 2014, p.5F.3.1-5F.3.6
2014
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ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003, 2003, p.283-286
2003
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2014 IEEE International Reliability Physics Symposium, 2014, p.2B.3.1-2B.3.6
2014
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2008 IEEE Radiation Effects Data Workshop, 2008, p.94-97
2008
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