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In depth study of molybdenum silicon compound formation at buried interfaces

Journal of applied physics, 2016-09, Vol.120 (11)

2016

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Nanoscale piezoelectric surface modulation for adaptive extreme ultraviolet and soft x-ray optics

Optics letters, 2019-10, Vol.44 (20), p.5104-5107

2019

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Bifunctional catalytic effect of Mo2C/oxide interface on multi-layer graphene growth

Scientific reports, 2021-07, Vol.11 (1), p.15377-15377, Article 15377

2021

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Tuning of large piezoelectric response in nanosheet-buffered lead zirconate titanate films on glass substrates

Scientific reports, 2017-03, Vol.7 (1), p.251-251, Article 251

2017

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Polarization recovery in lead zirconate titanate thin films deposited on nanosheets-buffered Si (001)

AIP advances, 2016-12, Vol.6 (12), p.125209-125209-6

2016

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In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers

Applied surface science, 2011-10, Vol.258 (1), p.7-12

2011

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Detection and characterization of carbon contamination on EUV multilayer mirrors

Optics express, 2009-09, Vol.17 (19), p.16969-16979

2009

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Carbon-induced extreme ultraviolet reflectance loss characterized using visible-light ellipsometry

Measurement science & technology, 2011-10, Vol.22 (10), p.105705

2011

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Spectral tailoring of nanoscale EUV and soft x-ray multilayer optics

Applied physics reviews, 2017-03, Vol.4 (1)

2017

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Single-order operation of lamellar multilayer gratings in the soft x-ray spectral range

AIP advances, 2013-01, Vol.3 (1), p.012103-012103

2013

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Fracture Toughness of Free-Standing ZrSi x Thin Films Measured Using Crack-on-a-Chip Method

Journal of microelectromechanical systems, 2022-02, Vol.31 (1), p.63-73

2022

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Sputtering and nitridation of transition metal surfaces under low energy, steady state nitrogen ion bombardment

Applied surface science, 2020-03, Vol.505, p.144529, Article 144529

2020

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Double matrix effect in Low Energy Ion Scattering from La surfaces

Applied surface science, 2018-05, Vol.440, p.570-579

2018

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Nanoscale piezoelectric surface modulation for adaptive extreme ultraviolet and soft x-ray optics

Optics letters, 2019-10, Vol.44 (20), p.5104

2019

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Fracture Toughness of Free-Standing ZrSix Thin Films Measured Using Crack-on-a-Chip Method

Journal of microelectromechanical systems, 2022-02, Vol.31 (1), p.63-73

2022

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Corrigendum to “In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers” [Appl. Surf. Sci. 258(1) (2011) 7–12]

Applied surface science, 2023-05, Vol.618, p.155765, Article 155765

2023

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Linearity of P–N junction photodiodes under pulsed irradiation

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2002-08, Vol.489 (1), p.370-378

2002

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Hysteresis, Loss and Nonlinearity in Epitaxial PbZr 0.55 Ti 0.45 O 3 Films: A Polarization Rotation Model

Advanced functional materials, 2020-12, Vol.30 (52)

2020

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Modeling of XUV-induced damage in Ru films: the role of model parameters

Journal of the Optical Society of America. B, Optical physics, 2018-10, Vol.35 (10), p.B43

2018

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Planar refractive lenses made of SiC for high intensity nanofocusing

Optics express, 2021-04, Vol.29 (9), p.14025-14032

2021

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Controlled growth of PbZr0.52Ti0.48O3 using nanosheet coated Si (001)

Thin solid films, 2015-08, Vol.589, p.13-16

2015

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Hysteresis, Loss and Nonlinearity in Epitaxial PbZr0.55Ti0.45O3 Films: A Polarization Rotation Model

Advanced functional materials, 2020-12, Vol.30 (52), p.n/a

2020

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Sputter yields of monoatomic solids by Ar and Ne ions near the threshold: A Bayesian analysis of the Yamamura Model

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2022-06, Vol.520, p.29-39

2022

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Wavefront correction in the extreme ultraviolet wavelength range using piezoelectric thin films

Optics express, 2014-12, Vol.22 (25), p.30623-30632

2014

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Near-threshold, steady state interaction of oxygen ions with transition metals: Sputtering and radiation enhanced diffusion

Applied surface science, 2020-07, Vol.518, p.146143, Article 146143

2020

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In depth study of molybdenum silicon compound formation at buried interfaces

Nanoscale piezoelectric surface modulation for adaptive extreme ultraviolet and soft x-ray optics

Bifunctional catalytic effect of Mo2C/oxide interface on multi-layer graphene growth

Tuning of large piezoelectric response in nanosheet-buffered lead zirconate titanate films on glass substrates

Polarization recovery in lead zirconate titanate thin films deposited on nanosheets-buffered Si (001)

In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers

Detection and characterization of carbon contamination on EUV multilayer mirrors

Carbon-induced extreme ultraviolet reflectance loss characterized using visible-light ellipsometry

Spectral tailoring of nanoscale EUV and soft x-ray multilayer optics

Single-order operation of lamellar multilayer gratings in the soft x-ray spectral range

Fracture Toughness of Free-Standing ZrSi x Thin Films Measured Using Crack-on-a-Chip Method

Sputtering and nitridation of transition metal surfaces under low energy, steady state nitrogen ion bombardment

Double matrix effect in Low Energy Ion Scattering from La surfaces

Nanoscale piezoelectric surface modulation for adaptive extreme ultraviolet and soft x-ray optics

Fracture Toughness of Free-Standing ZrSix Thin Films Measured Using Crack-on-a-Chip Method

Corrigendum to “In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers” [Appl. Surf. Sci. 258(1) (2011) 7–12]

Linearity of P–N junction photodiodes under pulsed irradiation

Hysteresis, Loss and Nonlinearity in Epitaxial PbZr 0.55 Ti 0.45 O 3 Films: A Polarization Rotation Model

Modeling of XUV-induced damage in Ru films: the role of model parameters

Planar refractive lenses made of SiC for high intensity nanofocusing

Controlled growth of PbZr0.52Ti0.48O3 using nanosheet coated Si (001)

Hysteresis, Loss and Nonlinearity in Epitaxial PbZr0.55Ti0.45O3 Films: A Polarization Rotation Model

Sputter yields of monoatomic solids by Ar and Ne ions near the threshold: A Bayesian analysis of the Yamamura Model

Wavefront correction in the extreme ultraviolet wavelength range using piezoelectric thin films

Near-threshold, steady state interaction of oxygen ions with transition metals: Sputtering and radiation enhanced diffusion

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