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Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.2738-2740
2022
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Ultramicroscopy, 2003-09, Vol.96 (3), p.239-249
2003
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Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.412-413
2018
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Acta materialia, 1996-04, Vol.44 (4), p.1637-1645
1996
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Conduction bandstructure in strained silicon by spatially resolved electron energy loss spectroscopy
1995
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Science (American Association for the Advancement of Science), 2006-06, Vol.312 (5778), p.1354-1354
2006
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Ultramicroscopy, 2006-10, Vol.106 (11), p.1104-1114
2006
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Nature (London), 1993-12, Vol.366 (6457), p.727-728
1993
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Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.66-67
2014
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Journal of materials research, 1994-10, Vol.9 (10), p.2566-2573
1994
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Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.330-331
2012
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Microscopy and microanalysis, 2013-08, Vol.19 (S2), p.1124-1125
2013
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Ultramicroscopy, 1999-06, Vol.78 (1), p.33-42
1999
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Ultramicroscopy, 1982, Vol.9 (3), p.277-282
1982
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Advances in Imaging and Electron Physics, 2008, Vol.153, p.163-194
2008
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Microscopy and microanalysis, 2003-08, Vol.9 (S02), p.836-837
2003
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Ultramicroscopy, 1993, Vol.50 (1), p.1-12
1993
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Physica. B, Condensed matter, 1999-12, Vol.273-274, p.593-597
1999
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Journal of crystal growth, 1987-03, Vol.82 (3), p.289-294
1987
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Microscopy and microanalysis, 2002-08, Vol.8 (S02), p.14-15
2002
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Microscopy and microanalysis, 2001-08, Vol.7 (S2), p.896-897
2001
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Microscopy and microanalysis, 1998-07, Vol.4 (S2), p.794-795
1998
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Ultramicroscopy, 1993-05, Vol.50 (1), p.1-12
1993
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Microscopy and microanalysis, 1997-08, Vol.3 (S2), p.645-646
1997
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Ultramicroscopy, 1992, Vol.47 (1), p.133-144
1992
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