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Semiconductor science and technology, 2005-01, Vol.20 (1), p.44-49
2005
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IEEE transactions on applied superconductivity, 2009-06, Vol.19 (3), p.1934-1937
2009
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Electronics letters, 2011-08, Vol.47 (17), p.986-988
2011
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IEEE transactions on applied superconductivity, 2011-06, Vol.21 (3), p.1294-1297
2011
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Electronics letters, 2011-01, Vol.47 (2), p.138-139
2011
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Electronics letters, 2009, Vol.45 (24), p.1245-1247
2009
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Solid-state electronics, 2011-09, Vol.63 (1), p.105-109
2011
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IEEE transactions on applied superconductivity, 2006-06, Vol.16 (2), p.687-690
2006
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Semiconductor science and technology, 2007-07, Vol.22 (7), p.687-690
2007
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Solid-state electronics, 2007-05, Vol.51 (5), p.757-761
2007
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Factory and Field Tests of a 220 kV/300 MVA Statured Iron-Core Superconducting Fault Current Limiter
2013
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Pattern recognition, 1996-08, Vol.29 (8), p.1335-1346
1996
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IEEE electron device letters, 2013-04, Vol.34 (4), p.487-489
2013
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Microelectronic engineering, 2008-03, Vol.85 (3), p.493-499
2008
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IEEE transactions on applied superconductivity, 2011-06, Vol.21 (3), p.2100-2103
2011
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IEEE microwave and wireless components letters, 2003-01, Vol.13 (1), p.24-26
2003
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Signal processing, 1994, Vol.39 (1), p.43-54
1994
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IEEE transactions on applied superconductivity, 2010-06, Vol.20 (3), p.764-768
2010
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Electronics letters, 1992, Vol.28 (3), p.213-214
1992
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IEEE transactions on vehicular technology, 2012-09, Vol.61 (7), p.3114-3124
2012
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Image and vision computing, 1993, Vol.11 (10), p.611-622
1993
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Microelectronic engineering, 1999, Vol.48 (1), p.283-286
1999
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IEEE transactions on wireless communications, 2012-04, Vol.11 (4), p.1488-1499
2012
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IEEE transactions on communications, 2013-03, Vol.61 (3), p.1028-1039
2013
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Pattern recognition, 1999-12, Vol.32 (12), p.2055-2061
1999
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