UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Measuring grain boundary segregation: tomographic atom probe field ion microscopy (APFIM) vs. analytical scanning transmission electron microscopy (STEM)

Journal of physics. Conference series, 2019-05, Vol.1190 (1), p.12002

Walther, T

2019

Volltextzugriff (PDF)

An improved approach to quantitative X-ray microanalysis in (S)TEM: Thickness dependent k-factors

Journal of physics. Conference series, 2010-07, Vol.241 (1), p.012016

Walther, T

2010

Volltextzugriff (PDF)

Comparison of experimental and theoretical X-ray intensities from (In)GaAs specimens investigated by energy-dispersive X-ray spectroscopy in a transmission electron microscope

Journal of physics. Conference series, 2010-02, Vol.209 (1), p.012029

Walther, T

2010

Volltextzugriff (PDF)

Self-consistent absorption correction for quantitative energy- dispersive X-ray spectroscopy of InGaN layers in analytical transmission electron microscopy

Journal of physics. Conference series, 2015-10, Vol.644 (1), p.12006

2015

Volltextzugriff (PDF)

Quantification of carbon contamination under electron beam irradiation in a scanning transmission electron microscope and its suppression by plasma cleaning

Journal of physics. Conference series, 2010-07, Vol.241 (1), p.012017

2010

Volltextzugriff (PDF)

A simple method to improve the quantification accuracy of energy-dispersive X-ray microanalysis

Journal of physics. Conference series, 2008-08, Vol.126 (1), p.012090, Article 012090

Walther, T

2008

Volltextzugriff (PDF)

A comparison of transmission electron microscopy methods to measure wetting layer thicknesses to sub-monolayer precision

Journal of physics. Conference series, 2008-08, Vol.126 (1), p.012091

Walther, T

2008

Volltextzugriff (PDF)

18th Microscopy of Semiconducting Materials Conference (MSM XVIII)

Journal of physics. Conference series, 2013-11, Vol.471 (1), p.11001

2013

Volltextzugriff (PDF)

Investigation of growth of thin layers of perovskite on native silicon dioxide by a combination of atomic force microscopy and transmission electron microscopy

Journal of physics. Conference series, 2013-01, Vol.471 (1), p.12037-4

2013

Volltextzugriff (PDF)

Configuring a 300kV cold field-emission gun for optimum analytical performance

Journal of physics. Conference series, 2012-01, Vol.371 (1), p.12012-4

2012

Volltextzugriff (PDF)

Study of site controlled quantum dot formation on focused ion beam patterned GaAs substrate

Journal of physics. Conference series, 2013-01, Vol.471 (1), p.12047-4

2013

Volltextzugriff (PDF)

The influence of emitter conditioning on the performance of a tungsten cold field emission gun operating at 300 kV

Journal of physics. Conference series, 2014-06, Vol.522 (1), p.12053

2014

Volltextzugriff (PDF)

Investigation of boron implantation into silicon by quantitative energy-filtered transmission electron microscopy

Journal of physics. Conference series, 2011-11, Vol.326 (1), p.012053-6

2011

Volltextzugriff (PDF)

Calibration of thickness-dependent k -factors for germanium X-ray lines to improve energy-dispersive X-ray spectroscopy of SiGe layers in analytical transmission electron microscopy

Journal of physics. Conference series, 2013-01, Vol.471 (1), p.12031-6

2013

Volltextzugriff (PDF)

Self-consistent absorption corrections for low-energy X-ray lines in energy-dispersive X-ray spectroscopy

Journal of physics. Conference series, 2012-01, Vol.371 (1), p.12063-4, Article 012063

2012

Volltextzugriff (PDF)

Quantification of series of X-ray spectra taken at different tilts in analytical transmission electron microscopy

Journal of physics. Conference series, 2011-11, Vol.326 (1), p.012037-4

2011

Volltextzugriff (PDF)

GaAsBi atomic surface order and interfacial roughness observed by STM and TEM

Journal of physics. Conference series, 2011-11, Vol.326 (1), p.012060-6

2011

Volltextzugriff (PDF)

Quantitative investigation of the onset of islanding in strained layer epitaxy of InAs/GaAs by X-ray mapping in STEM

Journal of physics. Conference series, 2010-02, Vol.209 (1), p.012035

2010

Volltextzugriff (PDF)

Nanoscale EELS analysis of elemental distribution and band-gap properties in AlGaN epitaxial layers

Journal of physics. Conference series, 2011-11, Vol.326 (1), p.012039-6

2011

Volltextzugriff (PDF)

Comparison of the contrast in conventional and lattice resolved ADF STEM images of InGaAs/GaAs structures using different camera lengths

Journal of physics. Conference series, 2011-11, Vol.326 (1), p.012041-4

2011

Volltextzugriff (PDF)

Probe position recovery for ptychographical imaging

Journal of physics. Conference series, 2010-07, Vol.241 (1), p.012004

2010

Volltextzugriff (PDF)

Measuring the contrast in annular dark field STEM images as a function of camera length

Journal of physics. Conference series, 2010-07, Vol.241 (1), p.012068

2010

Volltextzugriff (PDF)

Characterization of thickness, elemental distribution and band-gap properties in AlGaN/GaN quantum wells by aberration-corrected TEM/STEM

Journal of physics. Conference series, 2012-01, Vol.371 (1), p.12014-4

2012

Volltextzugriff (PDF)

STEM imaging of InP/AlGaInP quantum dots

Journal of physics. Conference series, 2010-09, Vol.245 (1), p.012087, Article 012087

2010

Volltextzugriff (PDF)

Analysis of partially oxidised epitaxial silicon mono-layers on germanium virtual substrates using aberration corrected scanning transmission electron microscopy

Journal of physics. Conference series, 2011-11, Vol.326 (1), p.012050-4

2011

Volltextzugriff (PDF)

1 – 25 von 258

Suche als RSS-Feed

Aktive Filter

KollektionJournals@Ovid Full Text

KollektioneBooks on EBSCOhost

SprachePolnisch

Zeitschrift / SerieJournal Of Physics. Conference Series

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(258)
Mit Volltextzugriff
(258)

Publikationsform

Artikel
(258)

Sprache

Englisch
(258)

Erscheinungsjahr

n.n

Thema

Physics
(253)
Science & Technology
(242)
Technology
(237)
Microscopy
(234)
Physical Sciences
(233)
Physics, Applied
(168)
Physics, Multidisciplinary
(136)
Scanning Transmission Electron Microscopy
(48)
Transmission Electron Microscopy
(42)
Nanostructure
(37)
Epitaxial Growth
(33)
Gallium Nitrides
(31)
Electrons
(29)
Morphology
(26)
Scanning Electron Microscopy
(26)
Substrates
(25)
Semiconductors
(23)
Spatial Resolution
(23)
Ion Beams
(22)
Spectrum Analysis
(21)

15 weitere anzeigen...

Weniger anzeigen...

Kollektion

Menü

Weitere Dienste

Einstellungen

Measuring grain boundary segregation: tomographic atom probe field ion microscopy (APFIM) vs. analytical scanning transmission electron microscopy (STEM)

An improved approach to quantitative X-ray microanalysis in (S)TEM: Thickness dependent k-factors

Comparison of experimental and theoretical X-ray intensities from (In)GaAs specimens investigated by energy-dispersive X-ray spectroscopy in a transmission electron microscope

Self-consistent absorption correction for quantitative energy- dispersive X-ray spectroscopy of InGaN layers in analytical transmission electron microscopy

Quantification of carbon contamination under electron beam irradiation in a scanning transmission electron microscope and its suppression by plasma cleaning

A simple method to improve the quantification accuracy of energy-dispersive X-ray microanalysis

A comparison of transmission electron microscopy methods to measure wetting layer thicknesses to sub-monolayer precision

18th Microscopy of Semiconducting Materials Conference (MSM XVIII)

Investigation of growth of thin layers of perovskite on native silicon dioxide by a combination of atomic force microscopy and transmission electron microscopy

Configuring a 300kV cold field-emission gun for optimum analytical performance

Study of site controlled quantum dot formation on focused ion beam patterned GaAs substrate

The influence of emitter conditioning on the performance of a tungsten cold field emission gun operating at 300 kV

Investigation of boron implantation into silicon by quantitative energy-filtered transmission electron microscopy

Calibration of thickness-dependent k -factors for germanium X-ray lines to improve energy-dispersive X-ray spectroscopy of SiGe layers in analytical transmission electron microscopy

Self-consistent absorption corrections for low-energy X-ray lines in energy-dispersive X-ray spectroscopy

Quantification of series of X-ray spectra taken at different tilts in analytical transmission electron microscopy

GaAsBi atomic surface order and interfacial roughness observed by STM and TEM

Quantitative investigation of the onset of islanding in strained layer epitaxy of InAs/GaAs by X-ray mapping in STEM

Nanoscale EELS analysis of elemental distribution and band-gap properties in AlGaN epitaxial layers

Comparison of the contrast in conventional and lattice resolved ADF STEM images of InGaAs/GaAs structures using different camera lengths

Probe position recovery for ptychographical imaging

Measuring the contrast in annular dark field STEM images as a function of camera length

Characterization of thickness, elemental distribution and band-gap properties in AlGaN/GaN quantum wells by aberration-corrected TEM/STEM

STEM imaging of InP/AlGaInP quantum dots

Analysis of partially oxidised epitaxial silicon mono-layers on germanium virtual substrates using aberration corrected scanning transmission electron microscopy

Aktive Filter

Suchergebnisse filtern