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Measuring grain boundary segregation: tomographic atom probe field ion microscopy (APFIM) vs. analytical scanning transmission electron microscopy (STEM)

Journal of physics. Conference series, 2019-05, Vol.1190 (1), p.12002

Walther, T

2019

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Defects, strain relaxation, and compositional grading in high indium content InGaN epilayers grown by molecular beam epitaxy

Journal of applied physics, 2015-10, Vol.118 (15)

2015

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X-ray mapping in a scanning transmission electron microscope of InGaAs quantum dots with embedded fractional monolayers of aluminium

Semiconductor science and technology, 2020-08, Vol.35 (8), p.84001

2020

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On the incorporation of iron into hexagonal barium titanate: II. Magnetic moment, electron paramagnetic resonance (EPR) and optical transmission

Journal of physics. Condensed matter, 2020-09, Vol.32 (38), p.385702

2020

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An improved approach to quantitative X-ray microanalysis in (S)TEM: Thickness dependent k-factors

Journal of physics. Conference series, 2010-07, Vol.241 (1), p.012016

Walther, T

2010

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On an ESFADOF edge-filter for a range resolved Brillouin-lidar: The high vapor density and high pump intensity regime

Applied physics. B, Lasers and optics, 2010-03, Vol.98 (4), p.667-675

2010

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Comparison of experimental and theoretical X-ray intensities from (In)GaAs specimens investigated by energy-dispersive X-ray spectroscopy in a transmission electron microscope

Journal of physics. Conference series, 2010-02, Vol.209 (1), p.012029

Walther, T

2010

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Defect properties of cobalt-doped hexagonal barium titanate ceramics

Journal of physics. Condensed matter, 2015-07, Vol.27 (29), p.295901-295901

2015

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Evidence of terbium and oxygen co-segregation in annealed AlN:Tb

Applied physics letters, 2017-05, Vol.110 (22)

2017

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Self-consistent absorption correction for quantitative energy- dispersive X-ray spectroscopy of InGaN layers in analytical transmission electron microscopy

Journal of physics. Conference series, 2015-10, Vol.644 (1), p.12006

2015

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Nature of the Stranski-Krastanow transition during epitaxy of InGaAs on GaAs

Physical review letters, 2001-03, Vol.86 (11), p.2381-2384

2001

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Dynamics of water-alcohol mixtures: insights from nuclear magnetic resonance, broadband dielectric spectroscopy, and triplet solvation dynamics

The Journal of chemical physics, 2014-03, Vol.140 (11), p.114503-114503

2014

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Quantification of carbon contamination under electron beam irradiation in a scanning transmission electron microscope and its suppression by plasma cleaning

Journal of physics. Conference series, 2010-07, Vol.241 (1), p.012017

2010

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Combination of electron energy-loss spectroscopy and energy dispersive x-ray spectroscopy to determine indium concentration in InGaN thin film structures

Semiconductor science and technology, 2015-11, Vol.30 (11), p.114011

2015

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Homogeneous Array of Nanowire-Embedded Quantum Light Emitters

Nano letters, 2013-03, Vol.13 (3), p.861-865

2013

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Similarity of Stranski-Krastanow growth of Ge/Si and SiGe/Si (001)

Journal of applied physics, 2014-01, Vol.115 (1)

2014

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A simple method to improve the quantification accuracy of energy-dispersive X-ray microanalysis

Journal of physics. Conference series, 2008-08, Vol.126 (1), p.012090, Article 012090

Walther, T

2008

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A comparison of transmission electron microscopy methods to measure wetting layer thicknesses to sub-monolayer precision

Journal of physics. Conference series, 2008-08, Vol.126 (1), p.012091

Walther, T

2008

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18th Microscopy of Semiconducting Materials Conference (MSM XVIII)

Journal of physics. Conference series, 2013-11, Vol.471 (1), p.11001

2013

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A high spectral brightness Fourier-transform limited nanosecond Yb-doped fiber amplifier

Applied physics. B, Lasers and optics, 2009-11, Vol.97 (3), p.591-597

2009

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Depth-resolved temperature measurements of water using the Brillouin lidar technique

Applied physics. B, Lasers and optics, 2009-12, Vol.97 (4), p.931-934

2009

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Nanostructure and strain properties of core-shell GaAs AlGaAs nanowires

Semiconductor science and technology, 2015-11, Vol.30 (11), p.114012

2015

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Epitaxial growth of relaxed germanium layers by reduced pressure chemical vapour deposition on (110) and (111) silicon substrates

Thin solid films, 2012-02, Vol.520 (8), p.3222-3226

2012

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Investigation of growth of thin layers of perovskite on native silicon dioxide by a combination of atomic force microscopy and transmission electron microscopy

Journal of physics. Conference series, 2013-01, Vol.471 (1), p.12037-4

2013

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Configuring a 300kV cold field-emission gun for optimum analytical performance

Journal of physics. Conference series, 2012-01, Vol.371 (1), p.12012-4

2012

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Measuring grain boundary segregation: tomographic atom probe field ion microscopy (APFIM) vs. analytical scanning transmission electron microscopy (STEM)

Defects, strain relaxation, and compositional grading in high indium content InGaN epilayers grown by molecular beam epitaxy

X-ray mapping in a scanning transmission electron microscope of InGaAs quantum dots with embedded fractional monolayers of aluminium

On the incorporation of iron into hexagonal barium titanate: II. Magnetic moment, electron paramagnetic resonance (EPR) and optical transmission

An improved approach to quantitative X-ray microanalysis in (S)TEM: Thickness dependent k-factors

On an ESFADOF edge-filter for a range resolved Brillouin-lidar: The high vapor density and high pump intensity regime

Comparison of experimental and theoretical X-ray intensities from (In)GaAs specimens investigated by energy-dispersive X-ray spectroscopy in a transmission electron microscope

Defect properties of cobalt-doped hexagonal barium titanate ceramics

Evidence of terbium and oxygen co-segregation in annealed AlN:Tb

Self-consistent absorption correction for quantitative energy- dispersive X-ray spectroscopy of InGaN layers in analytical transmission electron microscopy

Nature of the Stranski-Krastanow transition during epitaxy of InGaAs on GaAs

Dynamics of water-alcohol mixtures: insights from nuclear magnetic resonance, broadband dielectric spectroscopy, and triplet solvation dynamics

Quantification of carbon contamination under electron beam irradiation in a scanning transmission electron microscope and its suppression by plasma cleaning

Combination of electron energy-loss spectroscopy and energy dispersive x-ray spectroscopy to determine indium concentration in InGaN thin film structures

Homogeneous Array of Nanowire-Embedded Quantum Light Emitters

Similarity of Stranski-Krastanow growth of Ge/Si and SiGe/Si (001)

A simple method to improve the quantification accuracy of energy-dispersive X-ray microanalysis

A comparison of transmission electron microscopy methods to measure wetting layer thicknesses to sub-monolayer precision

18th Microscopy of Semiconducting Materials Conference (MSM XVIII)

A high spectral brightness Fourier-transform limited nanosecond Yb-doped fiber amplifier

Depth-resolved temperature measurements of water using the Brillouin lidar technique

Nanostructure and strain properties of core-shell GaAs AlGaAs nanowires

Epitaxial growth of relaxed germanium layers by reduced pressure chemical vapour deposition on (110) and (111) silicon substrates

Investigation of growth of thin layers of perovskite on native silicon dioxide by a combination of atomic force microscopy and transmission electron microscopy

Configuring a 300kV cold field-emission gun for optimum analytical performance

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