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X-ray mapping in a scanning transmission electron microscope of InGaAs quantum dots with embedded fractional monolayers of aluminium

Semiconductor science and technology, 2020-08, Vol.35 (8), p.84001

2020

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An improved approach to quantitative X-ray microanalysis in (S)TEM: Thickness dependent k-factors

Journal of physics. Conference series, 2010-07, Vol.241 (1), p.012016

Walther, T

2010

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Automatic Aorta Segmentation and Valve Landmark Detection in C-Arm CT for Transcatheter Aortic Valve Implantation

IEEE transactions on medical imaging, 2012-12, Vol.31 (12), p.2307-2321

2012

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Comparison of experimental and theoretical X-ray intensities from (In)GaAs specimens investigated by energy-dispersive X-ray spectroscopy in a transmission electron microscope

Journal of physics. Conference series, 2010-02, Vol.209 (1), p.012029

Walther, T

2010

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Self-consistent absorption correction for quantitative energy- dispersive X-ray spectroscopy of InGaN layers in analytical transmission electron microscopy

Journal of physics. Conference series, 2015-10, Vol.644 (1), p.12006

2015

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Electron energy-loss spectroscopic profiling of thin film structures: 0.39 nm line resolution and 0.04 eV precision measurement of near-edge structure shifts at interfaces

Ultramicroscopy, 2003-09, Vol.96 (3), p.401-411

Walther, T.

2003

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Defect properties of vanadium doped barium titanate ceramics

Materials research express, 2019-11, Vol.6 (11), p.115210

2019

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Quantification of carbon contamination under electron beam irradiation in a scanning transmission electron microscope and its suppression by plasma cleaning

Journal of physics. Conference series, 2010-07, Vol.241 (1), p.012017

2010

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Combination of electron energy-loss spectroscopy and energy dispersive x-ray spectroscopy to determine indium concentration in InGaN thin film structures

Semiconductor science and technology, 2015-11, Vol.30 (11), p.114011

2015

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Homogeneous Array of Nanowire-Embedded Quantum Light Emitters

Nano letters, 2013-03, Vol.13 (3), p.861-865

2013

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A simple method to improve the quantification accuracy of energy-dispersive X-ray microanalysis

Journal of physics. Conference series, 2008-08, Vol.126 (1), p.012090, Article 012090

Walther, T

2008

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A comparison of transmission electron microscopy methods to measure wetting layer thicknesses to sub-monolayer precision

Journal of physics. Conference series, 2008-08, Vol.126 (1), p.012091

Walther, T

2008

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Influence of thick crystal effects on ptychographic image reconstruction with moveable illumination

Ultramicroscopy, 2009-09, Vol.109 (10), p.1263-1275

2009

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Nanostructure and strain properties of core-shell GaAs AlGaAs nanowires

Semiconductor science and technology, 2015-11, Vol.30 (11), p.114012

2015

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Epitaxial growth of relaxed germanium layers by reduced pressure chemical vapour deposition on (110) and (111) silicon substrates

Thin solid films, 2012-02, Vol.520 (8), p.3222-3226

2012

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Investigation of growth of thin layers of perovskite on native silicon dioxide by a combination of atomic force microscopy and transmission electron microscopy

Journal of physics. Conference series, 2013-01, Vol.471 (1), p.12037-4

2013

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Configuring a 300kV cold field-emission gun for optimum analytical performance

Journal of physics. Conference series, 2012-01, Vol.371 (1), p.12012-4

2012

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Study of site controlled quantum dot formation on focused ion beam patterned GaAs substrate

Journal of physics. Conference series, 2013-01, Vol.471 (1), p.12047-4

2013

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Investigation of boron implantation into silicon by quantitative energy-filtered transmission electron microscopy

Journal of physics. Conference series, 2011-11, Vol.326 (1), p.012053-6

2011

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Calibration of thickness-dependent k -factors for germanium X-ray lines to improve energy-dispersive X-ray spectroscopy of SiGe layers in analytical transmission electron microscopy

Journal of physics. Conference series, 2013-01, Vol.471 (1), p.12031-6

2013

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Self-consistent absorption corrections for low-energy X-ray lines in energy-dispersive X-ray spectroscopy

Journal of physics. Conference series, 2012-01, Vol.371 (1), p.12063-4, Article 012063

2012

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Quantification of series of X-ray spectra taken at different tilts in analytical transmission electron microscopy

Journal of physics. Conference series, 2011-11, Vol.326 (1), p.012037-4

2011

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GaAsBi atomic surface order and interfacial roughness observed by STM and TEM

Journal of physics. Conference series, 2011-11, Vol.326 (1), p.012060-6

2011

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GaN-based radial heterostructure nanowires grown by MBE and ALD

Journal of physics. Conference series, 2013, Vol.471 (1), p.12039

2013

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Quantitative investigation of the onset of islanding in strained layer epitaxy of InAs/GaAs by X-ray mapping in STEM

Journal of physics. Conference series, 2010-02, Vol.209 (1), p.012035

2010

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X-ray mapping in a scanning transmission electron microscope of InGaAs quantum dots with embedded fractional monolayers of aluminium

An improved approach to quantitative X-ray microanalysis in (S)TEM: Thickness dependent k-factors

Automatic Aorta Segmentation and Valve Landmark Detection in C-Arm CT for Transcatheter Aortic Valve Implantation

Comparison of experimental and theoretical X-ray intensities from (In)GaAs specimens investigated by energy-dispersive X-ray spectroscopy in a transmission electron microscope

Self-consistent absorption correction for quantitative energy- dispersive X-ray spectroscopy of InGaN layers in analytical transmission electron microscopy

Electron energy-loss spectroscopic profiling of thin film structures: 0.39 nm line resolution and 0.04 eV precision measurement of near-edge structure shifts at interfaces

Defect properties of vanadium doped barium titanate ceramics

Quantification of carbon contamination under electron beam irradiation in a scanning transmission electron microscope and its suppression by plasma cleaning

Combination of electron energy-loss spectroscopy and energy dispersive x-ray spectroscopy to determine indium concentration in InGaN thin film structures

Homogeneous Array of Nanowire-Embedded Quantum Light Emitters

A simple method to improve the quantification accuracy of energy-dispersive X-ray microanalysis

A comparison of transmission electron microscopy methods to measure wetting layer thicknesses to sub-monolayer precision

Influence of thick crystal effects on ptychographic image reconstruction with moveable illumination

Nanostructure and strain properties of core-shell GaAs AlGaAs nanowires

Epitaxial growth of relaxed germanium layers by reduced pressure chemical vapour deposition on (110) and (111) silicon substrates

Investigation of growth of thin layers of perovskite on native silicon dioxide by a combination of atomic force microscopy and transmission electron microscopy

Configuring a 300kV cold field-emission gun for optimum analytical performance

Study of site controlled quantum dot formation on focused ion beam patterned GaAs substrate

Investigation of boron implantation into silicon by quantitative energy-filtered transmission electron microscopy

Calibration of thickness-dependent k -factors for germanium X-ray lines to improve energy-dispersive X-ray spectroscopy of SiGe layers in analytical transmission electron microscopy

Self-consistent absorption corrections for low-energy X-ray lines in energy-dispersive X-ray spectroscopy

Quantification of series of X-ray spectra taken at different tilts in analytical transmission electron microscopy

GaAsBi atomic surface order and interfacial roughness observed by STM and TEM

GaN-based radial heterostructure nanowires grown by MBE and ALD

Quantitative investigation of the onset of islanding in strained layer epitaxy of InAs/GaAs by X-ray mapping in STEM

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