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Measuring grain boundary segregation: tomographic atom probe field ion microscopy (APFIM) vs. analytical scanning transmission electron microscopy (STEM)

Journal of physics. Conference series, 2019-05, Vol.1190 (1), p.12002

Walther, T

2019

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Defects, strain relaxation, and compositional grading in high indium content InGaN epilayers grown by molecular beam epitaxy

Journal of applied physics, 2015-10, Vol.118 (15)

2015

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Scaffolds in a shell-a new approach combining one-photon and two-photon polymerization

Optics express, 2018-11, Vol.26 (23), p.29659-29668

2018

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X-ray mapping in a scanning transmission electron microscope of InGaAs quantum dots with embedded fractional monolayers of aluminium

Semiconductor science and technology, 2020-08, Vol.35 (8), p.84001

2020

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139 INVITED High Resolution Mass Spectrometry-Based Proteomics for Metabolism and Cancer Research

European journal of cancer (1990), 2011, Vol.47, p.S34-S34

Walther, T

2011

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On the incorporation of iron into hexagonal barium titanate: II. Magnetic moment, electron paramagnetic resonance (EPR) and optical transmission

Journal of physics. Condensed matter, 2020-09, Vol.32 (38), p.385702

2020

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An improved approach to quantitative X-ray microanalysis in (S)TEM: Thickness dependent k-factors

Journal of physics. Conference series, 2010-07, Vol.241 (1), p.012016

Walther, T

2010

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On an ESFADOF edge-filter for a range resolved Brillouin-lidar: The high vapor density and high pump intensity regime

Applied physics. B, Lasers and optics, 2010-03, Vol.98 (4), p.667-675

2010

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Microscopy of Semiconducting Materials 2015

Semiconductor science and technology, 2015-11, Vol.30 (11), p.110301

2015

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Single step Production of graphite from organic Samples for Radiocarbon Measurements

Radiocarbon, 2019-12, Vol.61 (6), p.1843-1854

2019

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Comparison of experimental and theoretical X-ray intensities from (In)GaAs specimens investigated by energy-dispersive X-ray spectroscopy in a transmission electron microscope

Journal of physics. Conference series, 2010-02, Vol.209 (1), p.012029

Walther, T

2010

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Defect properties of cobalt-doped hexagonal barium titanate ceramics

Journal of physics. Condensed matter, 2015-07, Vol.27 (29), p.295901-295901

2015

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Evidence of terbium and oxygen co-segregation in annealed AlN:Tb

Applied physics letters, 2017-05, Vol.110 (22)

2017

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Self-consistent absorption correction for quantitative energy- dispersive X-ray spectroscopy of InGaN layers in analytical transmission electron microscopy

Journal of physics. Conference series, 2015-10, Vol.644 (1), p.12006

2015

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Nature of the Stranski-Krastanow transition during epitaxy of InGaAs on GaAs

Physical review letters, 2001-03, Vol.86 (11), p.2381-2384

2001

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Dynamics of water-alcohol mixtures: insights from nuclear magnetic resonance, broadband dielectric spectroscopy, and triplet solvation dynamics

The Journal of chemical physics, 2014-03, Vol.140 (11), p.114503-114503

2014

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Electron energy-loss spectroscopic profiling of thin film structures: 0.39 nm line resolution and 0.04 eV precision measurement of near-edge structure shifts at interfaces

Ultramicroscopy, 2003-09, Vol.96 (3), p.401-411

Walther, T.

2003

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Defect properties of vanadium doped barium titanate ceramics

Materials research express, 2019-11, Vol.6 (11), p.115210

2019

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RNA Sequencing Reveals Differentially Expressed Genes in Left Ventricular Biopsies from Ischemic and Dilated Cardiomyopathy Patients

The Journal of heart and lung transplantation, 2020-04, Vol.39 (4), p.S152-S152

2020

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Quantification of carbon contamination under electron beam irradiation in a scanning transmission electron microscope and its suppression by plasma cleaning

Journal of physics. Conference series, 2010-07, Vol.241 (1), p.012017

2010

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Combination of electron energy-loss spectroscopy and energy dispersive x-ray spectroscopy to determine indium concentration in InGaN thin film structures

Semiconductor science and technology, 2015-11, Vol.30 (11), p.114011

2015

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Homogeneous Array of Nanowire-Embedded Quantum Light Emitters

Nano letters, 2013-03, Vol.13 (3), p.861-865

2013

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Similarity of Stranski-Krastanow growth of Ge/Si and SiGe/Si (001)

Journal of applied physics, 2014-01, Vol.115 (1)

2014

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A simple method to improve the quantification accuracy of energy-dispersive X-ray microanalysis

Journal of physics. Conference series, 2008-08, Vol.126 (1), p.012090, Article 012090

Walther, T

2008

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A comparison of transmission electron microscopy methods to measure wetting layer thicknesses to sub-monolayer precision

Journal of physics. Conference series, 2008-08, Vol.126 (1), p.012091

Walther, T

2008

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Measuring grain boundary segregation: tomographic atom probe field ion microscopy (APFIM) vs. analytical scanning transmission electron microscopy (STEM)

Defects, strain relaxation, and compositional grading in high indium content InGaN epilayers grown by molecular beam epitaxy

Scaffolds in a shell-a new approach combining one-photon and two-photon polymerization

X-ray mapping in a scanning transmission electron microscope of InGaAs quantum dots with embedded fractional monolayers of aluminium

139 INVITED High Resolution Mass Spectrometry-Based Proteomics for Metabolism and Cancer Research

On the incorporation of iron into hexagonal barium titanate: II. Magnetic moment, electron paramagnetic resonance (EPR) and optical transmission

An improved approach to quantitative X-ray microanalysis in (S)TEM: Thickness dependent k-factors

On an ESFADOF edge-filter for a range resolved Brillouin-lidar: The high vapor density and high pump intensity regime

Microscopy of Semiconducting Materials 2015

Single step Production of graphite from organic Samples for Radiocarbon Measurements

Comparison of experimental and theoretical X-ray intensities from (In)GaAs specimens investigated by energy-dispersive X-ray spectroscopy in a transmission electron microscope

Defect properties of cobalt-doped hexagonal barium titanate ceramics

Evidence of terbium and oxygen co-segregation in annealed AlN:Tb

Self-consistent absorption correction for quantitative energy- dispersive X-ray spectroscopy of InGaN layers in analytical transmission electron microscopy

Nature of the Stranski-Krastanow transition during epitaxy of InGaAs on GaAs

Dynamics of water-alcohol mixtures: insights from nuclear magnetic resonance, broadband dielectric spectroscopy, and triplet solvation dynamics

Electron energy-loss spectroscopic profiling of thin film structures: 0.39 nm line resolution and 0.04 eV precision measurement of near-edge structure shifts at interfaces

Defect properties of vanadium doped barium titanate ceramics

RNA Sequencing Reveals Differentially Expressed Genes in Left Ventricular Biopsies from Ischemic and Dilated Cardiomyopathy Patients

Quantification of carbon contamination under electron beam irradiation in a scanning transmission electron microscope and its suppression by plasma cleaning

Combination of electron energy-loss spectroscopy and energy dispersive x-ray spectroscopy to determine indium concentration in InGaN thin film structures

Homogeneous Array of Nanowire-Embedded Quantum Light Emitters

Similarity of Stranski-Krastanow growth of Ge/Si and SiGe/Si (001)

A simple method to improve the quantification accuracy of energy-dispersive X-ray microanalysis

A comparison of transmission electron microscopy methods to measure wetting layer thicknesses to sub-monolayer precision

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