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Kinetic model for dependence of thin film stress on growth rate, temperature, and microstructure

Journal of applied physics, 2012-04, Vol.111 (8), p.083520-083520-9

2012

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Growth of patterned island arrays to identify origins of thin film stress

Journal of applied physics, 2014-03, Vol.115 (12)

2014

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Model for stress generated upon contact of neighboring islands on the surface of a substrate

Journal of applied physics, 2001-05, Vol.89 (9), p.4866-4873

2001

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A lower bound on implant density to induce wafer splitting in forming compliant substrate structures

Applied physics letters, 1997-06, Vol.70 (26), p.3519-3521

Freund, L. B.

1997

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A criterion for arrest of a threading dislocation in a strained epitaxial layer due to an interface misfit dislocation in its path

Journal of applied physics, 1990-09, Vol.68 (5), p.2073-2080

Freund, L. B.

1990

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Finite element analysis of strain effects on electronic and transport properties in quantum dots and wires

Journal of applied physics, 1998-10, Vol.84 (7), p.3714-3725

1998

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Extensions of the Stoney formula for substrate curvature to configurations with thin substrates or large deformations

Applied physics letters, 1999-04, Vol.74 (14), p.1987-1989

1999

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Limits of strain relaxation in InGaAs∕GaAs probed in real time by in situ wafer curvature measurement

Journal of applied physics, 2005-10, Vol.98 (7)

2005

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Mechanics of coherent and dislocated island morphologies in strained epitaxial material systems

Journal of applied physics, 1997-05, Vol.81 (9), p.6081-6090

1997

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Analysis of stress-induced void growth mechanisms in passivated interconnect lines

Journal of applied physics, 1993-09, Vol.74 (6), p.3855-3868

1993

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Study of vibrational modes of gold nanostructures by picosecond ultrasonics

Journal of applied physics, 1993, Vol.73 (1), p.37-45

1993

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Role of dislocation blocking in limiting strain relaxation in heteroepitaxial films

Journal of applied physics, 1994-12, Vol.76 (11), p.7280-7287

1994

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Strain induced stabilization of stepped Si and Ge surfaces near (001)

Applied physics letters, 2002-07, Vol.81 (2), p.364-366

2002

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A critical thickness condition for a strained compliant substrate/epitaxial film system

Applied physics letters, 1996-07, Vol.69 (2), p.173-175

1996

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Full-field optical measurement of curvatures in ultra-thin-film–substrate systems in the range of geometrically nonlinear deformations

Journal of applied physics, 2001-06, Vol.89 (11), p.6116-6129

2001

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On the Dodson-Tsao excess stress for glide of a threading dislocation in a strained epitaxial layer

Journal of applied physics, 1992-02, Vol.71 (4), p.2054-2056

1992

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Dynamic self-organization of strained islands during SiGe epitaxial growth

Applied physics letters, 1998-08, Vol.73 (7), p.951-953

1998

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Critical thickness condition for growth of strained quantum wires in substrate V-grooves

Applied physics letters, 1995-05, Vol.66 (21), p.2822-2824

1995

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Inhomogeneous strain in individual quantum dots probed by transport measurements

Applied physics letters, 1998-04, Vol.72 (14), p.1739-1741

1998

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Limits of strain relaxation in In Ga As ∕ Ga As probed in real timeby in situ wafer curvature measurement

Journal of applied physics, 2005-10, Vol.98 (7), p.073532-073532-7

2005

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A criterion for arrest of a threading dislocation in a stained epitaxial layer due to and interface misfit dislocation in its path

Journal of applied physics, 1990, Vol.68 (5), p.2073-2080

FREUND, L. B

1990

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An integral-equation approach to dispersion relations for guided elastic surface waves

The Journal of the Acoustical Society of America, 1973-01, Vol.54 (1), p.40-45

1973

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Near-Front Stress Singularity for Impact on an Elastic Quarter-Space

The Journal of the Acoustical Society of America, 1970-01, Vol.47 (3B), p.942-943

1970

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Cryogenic cooling of monochromators

Review of Scientific Instruments, 1992-01, Vol.63 (1), p.477-480

1992

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Performance of very thin silicon single‐crystal foils under high x‐ray power density

Review of Scientific Instruments, 1992-01, Vol.63 (1), p.442-445

1992

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Kinetic model for dependence of thin film stress on growth rate, temperature, and microstructure

Growth of patterned island arrays to identify origins of thin film stress

Model for stress generated upon contact of neighboring islands on the surface of a substrate

A lower bound on implant density to induce wafer splitting in forming compliant substrate structures

A criterion for arrest of a threading dislocation in a strained epitaxial layer due to an interface misfit dislocation in its path

Finite element analysis of strain effects on electronic and transport properties in quantum dots and wires

Extensions of the Stoney formula for substrate curvature to configurations with thin substrates or large deformations

Limits of strain relaxation in InGaAs∕GaAs probed in real time by in situ wafer curvature measurement

Mechanics of coherent and dislocated island morphologies in strained epitaxial material systems

Analysis of stress-induced void growth mechanisms in passivated interconnect lines

Study of vibrational modes of gold nanostructures by picosecond ultrasonics

Role of dislocation blocking in limiting strain relaxation in heteroepitaxial films

Strain induced stabilization of stepped Si and Ge surfaces near (001)

A critical thickness condition for a strained compliant substrate/epitaxial film system

Full-field optical measurement of curvatures in ultra-thin-film–substrate systems in the range of geometrically nonlinear deformations

On the Dodson-Tsao excess stress for glide of a threading dislocation in a strained epitaxial layer

Dynamic self-organization of strained islands during SiGe epitaxial growth

Critical thickness condition for growth of strained quantum wires in substrate V-grooves

Inhomogeneous strain in individual quantum dots probed by transport measurements

Limits of strain relaxation in In Ga As ∕ Ga As probed in real timeby in situ wafer curvature measurement

A criterion for arrest of a threading dislocation in a stained epitaxial layer due to and interface misfit dislocation in its path

An integral-equation approach to dispersion relations for guided elastic surface waves

Near-Front Stress Singularity for Impact on an Elastic Quarter-Space

Cryogenic cooling of monochromators

Performance of very thin silicon single‐crystal foils under high x‐ray power density

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