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Analysis of the feasibility of CF 3I/CO2 used in C-GIS by partial discharge inception voltages in positive half cycle and breakdown voltages

IEEE transactions on dielectrics and electrical insulation, 2015-12, Vol.22 (6), p.3234

2015

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Mechanical and dielectric properties of epoxyaclay nanocomposites

Journal of materials science, 2014-02, Vol.49 (4), p.1574-1584

2014

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High-breakdown voltage and low on-resistance AlGaN/GaN on Si MOS-HEMTs employing an extended TaN gate on HfO sub( 2) gate insulator

Electronics letters, 2013-03, Vol.49 (6), p.1-1

2013

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Classification of Vacuum Breakdown During Conditioning Based on Deep Learning

IEEE transactions on dielectrics and electrical insulation, 2023-08, Vol.30 (4), p.1-1

2023

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Facts and Myths of Dielectric Breakdown Processes-Part II: Post-Breakdown and Variability

IEEE transactions on electron devices, 2019-11, Vol.66 (11), p.4535-4545

Wu, Ernest Y.

2019

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New Breakdown Diagnosis Method based on Electrical Measurement and Deep Learning Recognition for Multiple Electrodes in Vacuum

IEEE transactions on dielectrics and electrical insulation, 2024, p.1-1

2024

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Dielectric behavior and energy storage properties in BaO-SrO-Nb sub(2)O sub(5)-B sub(2)O sub(3) system glass-ceramics with Gd sub(2)O sub(3) addition

Journal of materials science. Materials in electronics, 2014-01, Vol.25 (1), p.349-354

2014

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Pre-breakdown Evolution of Field Emission Induced Breakdown under Impulse Voltage

IEEE transactions on dielectrics and electrical insulation, 2023-09, p.1-1

2023

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Evolutionary Multiobjective Blocking Lot-Streaming Flow Shop Scheduling With Machine Breakdowns

IEEE transactions on cybernetics, 2019-01, Vol.49 (1), p.184-197

2019

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Conditioning Saturation Diagnosis With Breakdown Electric Field and Breakdown Time in Vacuum

IEEE transactions on dielectrics and electrical insulation, 2023-04, Vol.30 (2), p.862-868

2023

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RDELAaa Delaunay-triangulation-based, location and covariance estimator with high breakdown point

Statistics and computing, 2013-11, Vol.23 (6), p.677-688

2013

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Lightening Impulse Breakdown of Vacuum Gaps in Series-Part I: Partial Breakdown

IEEE transactions on dielectrics and electrical insulation, 2022-08, Vol.29 (4), p.1365-1372

2022

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Breakdown Time Characteristics Under Uniform Electric Field in Vacuum

IEEE transactions on dielectrics and electrical insulation, 2022-02, Vol.29 (1), p.193-198

2022

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Erratum: “Dielectric breakdown at sub-critical fields” [Appl. Phys. Lett. 113, 112901 (2018)]

Applied physics letters, 2019-10, Vol.115 (17)

2019

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AC and Lightning Impulse Breakdown Voltages of Natural Ester Based Fullerene Nanofluids

IEEE transactions on dielectrics and electrical insulation, 2021-12, Vol.28 (6), p.1996-2003

2021

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Distribution Capacitor Health Monitoring Based on the Disturbances of Element Breakdown Faults

IEEE transactions on power delivery, 2022-10, Vol.37 (5), p.4064-4072

2022

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Adjustment Method of Optimum Breakdown Charge During Impulse Voltage Conditioning Process for Vacuum Interrupter

IEEE transactions on dielectrics and electrical insulation, 2024-06, Vol.31 (3), p.1463-1470

2024

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Field-Plated Lateral Ga2O3 MOSFETs With Polymer Passivation and 8.03 kV Breakdown Voltage

IEEE electron device letters, 2020-06, Vol.41 (6), p.836-839

2020

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Robust Breakdown Reliability and Improved Endurance in Hf0.5Zr0.5O2 Ferroelectric Using Grain Boundary Interruption

IEEE transactions on electron devices, 2022-01, Vol.69 (1), p.430-433

2022

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Improvement of Endurance in HZO-Based Ferroelectric Capacitor Using Ru Electrode

IEEE electron device letters, 2019-11, Vol.40 (11), p.1744-1747

2019

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Facts and Myths of Dielectric Breakdown Processes-Part I: Statistics, Experimental, and Physical Acceleration Models

IEEE transactions on electron devices, 2019-11, Vol.66 (11), p.4523-4534

Wu, Ernest Y.

2019

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A Study on Practically Unlimited Endurance of STT-MRAM

IEEE transactions on electron devices, 2017-09, Vol.64 (9), p.3639-3646

2017

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1.85 kV Breakdown Voltage in Lateral Field-Plated Ga2O3 MOSFETs

IEEE electron device letters, 2018-09, Vol.39 (9), p.1385-1388

2018

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Unveiling the Vulnerability of Oxide-Breakdown-Based PUF

IEEE electron device letters, 2024-05, Vol.45 (5), p.750-753

2024

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Heavy-Ion Radiation Effects in AlGaN/GaN High-Electron-Mobility Transistors

IEEE transactions on nuclear science, 2024-04, Vol.71 (4), p.902-911

2024

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