Sie befinden Sich nicht im Netzwerk der Universität Paderborn. Der Zugriff auf elektronische Ressourcen ist gegebenenfalls nur via VPN oder Shibboleth (DFN-AAI) möglich. mehr Informationen...
Sortiert nach
    Datensatz exportieren als...
  • BibTeX
IEC/IEEE Behavioural Languages - Part 5: VITAL ASIC (Application Specific Integrated Circuit) Modeling Specification (Adoption of IEEE Std 1076.4-2000)
IEC 61691-5 First edition 2004-10; IEEE 1076.4, 2004, p.0_1-434
2004
Link zum Volltext
Verfügbarkeit prüfen
    Datensatz exportieren als...
  • BibTeX
IEC/IEEE International Standard - Behavioral Languages - Part 5: Standard VITAL ASIC (Application Specific Integrated Circuit) Modeling Specification
IEEE 1076.4 IEC 61691-5 First edition 2004-10, 2004, p.1-429
2004
    Datensatz exportieren als...
  • BibTeX
IEC/IEEE International Standard - VHDL Register Transfer Level (RTL) Synthesis
IEC 62050 Ed. 1 (IEEE Std 1076.6-2004), 2005, p.1-128
2005
    Datensatz exportieren als...
  • BibTeX
IEC/IEEE Standard for Advanced Library Format (ALF) describing integrated circuit (IC) technology, cells, and blocks (Adoption of IEEE Std 1603-2003)
IEC 62265-2005 First edition 2005-07 IEEE Std 1603, 2005, p.1-300
2005
Link zum Volltext
Verfügbarkeit prüfen
    Datensatz exportieren als...
  • BibTeX
IEC/IEEE Standard for Advanced Library Format (ALF) describing integrated circuit (IC) technology, cells, and blocks (Adoption of IEEE Std 1603-2003)
IEC 62265-2005 First edition 2005-07 IEEE Std 1603, 2005, p.1-300
2005
Link zum Volltext
Verfügbarkeit prüfen
    Datensatz exportieren als...
  • BibTeX
IEEE Draft Standard for Static Component Interconnection Test Protocol and Architecture
IEEE P1581/D1.37, January 2011, 2011, p.1-63
2011
    Datensatz exportieren als...
  • BibTeX
IEEE Draft Standard for Static Component Interconnection Test Protocol and Architecture
IEEE P1581/D1.33, September 2010, 2010, p.1-62
2010
    Datensatz exportieren als...
  • BibTeX
IEEE/IEC International Standard--Delay and power calculation standards--Part 1: Integrated Circuit (IC) Open Library Architecture (OLA)
IEC 61523-1:2023-10 (IEEE Std 1481-2019), 2023, p.1-646
2023
    Datensatz exportieren als...
  • BibTeX
IEEE/IEC International Standard - Design and Verification of Low-Power Integrated Circuits
IEC 61523-4 Edition 1.0 2015-03 (IEEE Std 1801-2013), 2015, p.1-351
2015
    Datensatz exportieren als...
  • BibTeX
IEEE/IEC International Standard - Design and Verification of Low-Power Integrated Circuits
IEC 61523-4 Edition 1.0 2015-03 (IEEE Std 1801-2013), 2015, p.1-351
2015
    Datensatz exportieren als...
  • BibTeX
IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated-Circuit Process Characterization
IEEE Std 1181-1991, 1991, p.0_1
1991
    Datensatz exportieren als...
  • BibTeX
IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated-Circuit Process Characterization
IEEE Std 1181-1991, 1991, p.0_1
1991
    Datensatz exportieren als...
  • BibTeX
IEEE Standard for a Chip and Module Interconnect Bus: SBus
IEEE Std 1496-1993, 1993, p.1-88
1993
Link zum Volltext
Verfügbarkeit prüfen
    Datensatz exportieren als...
  • BibTeX
IEEE Standard for a Mixed-Signal Test Bus
IEEE Std 1149.4-1999, 2000, p.1-84
2000
    Datensatz exportieren als...
  • BibTeX
IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components
IEEE Std 1149.8.1-2012, 2012, p.1-95
2012
    Datensatz exportieren als...
  • BibTeX
IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components
IEEE Std 1149.8.1-2012, 2012, p.1-95
2012
    Datensatz exportieren als...
  • BibTeX
IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
IEEE Std 1149.6-2015 (Revision of IEEE Std 1149.6-2003), 2016, p.1-230
2016
    Datensatz exportieren als...
  • BibTeX
IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
IEEE Std 1149.6-2003, 2003, p.1-140
2003
    Datensatz exportieren als...
  • BibTeX
IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
IEEE Std 1149.6-2015 (Revision of IEEE Std 1149.6-2003), 2016, p.1-230
2016
    Datensatz exportieren als...
  • BibTeX
IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks - Redline
IEEE Std 1149.6-2015 (Revision of IEEE Std 1149.6-2003) - Redline, 2016, p.1-441
2016
Link zum Volltext
Verfügbarkeit prüfen
    Datensatz exportieren als...
  • BibTeX
IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks - Redline
IEEE Std 1149.6-2015 (Revision of IEEE Std 1149.6-2003) - Redline, 2016, p.1-441
2016
Link zum Volltext
Verfügbarkeit prüfen
    Datensatz exportieren als...
  • BibTeX
IEEE Standard for Communicating Among Processors and Peripherals Using Shared Memory (Direct Memory Access - DMA)
IEEE Std 1212.1-1993, 1993, p.1-134
1993
    Datensatz exportieren als...
  • BibTeX
IEEE Standard for Design and Verification of Low Power Integrated Circuits
IEEE Std 1801-2009, 2009, p.1-218
2009
    Datensatz exportieren als...
  • BibTeX
IEEE Standard for Design and Verification of Low-Power Integrated Circuits
IEEE Std 1801-2013 (Revision of IEEE Std 1801-2009), 2013, p.1-736
2013
    Datensatz exportieren als...
  • BibTeX
IEEE Standard for Design and Verification of Low-Power Integrated Circuits - Redline
IEEE Std 1801-2013 (Revision of IEEE Std 1801-2009) - Redline, 2013, p.1-736
2013
1 – 25 von 60
Suche als RSS-Feed
Aktive Filter
KollektionElsevier ScienceDirect Journals Complete
ThemaTechnology
PublikationsformNormen
Suchergebnisse filtern
Filter anzeigen