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Cathodoluminescence Studies of the Inhomogeneities in Sn-doped Ga2O3 Nanowires

Nano letters, 2009-09, Vol.9 (9), p.3245-3251

2009

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Application of CL/EBIC-SEM Techniques for Characterization of Radiation Effects in Multijunction Solar Cells

IEEE transactions on nuclear science, 2010-12, Vol.57 (6), p.3095-3100

2010

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Radiation response of multi-quantum well solar cells: Electron-beam-induced current analysis

Journal of applied physics, 2015-12, Vol.118 (24)

2015

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Stacking fault nucleation sites in diffused 4H-SiC p - i - n diodes

Journal of applied physics, 2005-04, Vol.97 (7), p.074501-074501-6

2005

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Thin GaAs Solar Cells For High Irradiation Levels

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC), 2019, p.2814-2817

2019

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Observation of dislocations in diffused 4H–SiC p-i-n diodes by electron-beam induced current

Journal of applied physics, 2005-01, Vol.97 (1)

2005

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Electron Channeling Contrast Imaging for Non-Destructive Analysis of Extended Defects in Semiconductor Thin Films and Device Structures

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.1064-1065

2014

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Electron-beam-induced current observed for dislocations in diffused 4H-SiC P–N diodes

Applied physics letters, 2004-03, Vol.84 (9), p.1576-1578

2004

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Effect of threading screw and edge dislocations on transport properties of 4H–SiC homoepitaxial layers

Journal of applied physics, 2010-07, Vol.108 (1)

2010

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Effect of basal plane dislocations on characteristics of diffused 4H-SiC p-i-n diodes

IEEE transactions on electron devices, 2005-12, Vol.52 (12), p.2546-2551

2005

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FIB/TEM Investigation of crystallographic defects in type-II superlattice based infrared detectors

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.1806-1807

2012

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CL/EBIC-SEM Techniques for Evaluation of Impact of Crystallographic Defects on Carrier Lifetime in 4H-SiC Epitaxial Layers

Materials science forum, 2010-04, Vol.645-648, p.211-214

2010

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Evolution of Deep Defect Centers in Semi-Insulating 4H-SiC Substrates under High-Temperature Annealing

Journal of electronic materials, 2009-04, Vol.38 (4), p.551-556, Article 551

2009

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Towards high efficiency multi-junction solar cells grown on InP Substrates

2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 2013, p.0145-0148

2013

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The distribution function of the variance of Allan: theory and practice

Izmeritel`naya Tekhnika, 2018 (6), p.20-25

MAXIMENKO, S. G.

2018

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Open Core Dislocations and Surface Energy of SiC

Materials science forum, 2006-10, Vol.527-529, p.439-442

2006

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Propagation of stacking faults from surface damage in SiC PiN diodes

Applied physics letters, 2006-02, Vol.88 (6), p.062101-062101-3

2006

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Evolution of D1-Defect Center in 4H-SiC during High Temperature Annealing

Materials science forum, 2009, Vol.600-603, p.429-432

2009

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Structure and Orientation Determination of Metal-Oxide Nanostructures by Electron Backscatter Diffraction

Microscopy and microanalysis, 2009-07, Vol.15 (S2), p.402-403

2009

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Mapping of Defects in Large-Area Silicon Carbide Wafers via Photoluminescence and its Correlation with Synchrotron White Beam X-Ray Topography

Materials science forum, 2009-01, Vol.600-603, p.549-552

2009

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Recombination Behaviour of Stacking Faults in SiC p-i-n Diodes

Materials science forum, 2006-10, Vol.527-529, p.367-370

2006

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Performance of Silicon Carbide PiN Diodes Fabricated on Basal Plane Dislocation-Free Epilayers

Materials science forum, 2006-10, Vol.527-529, p.371-374

2006

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Characterization of high fluence irradiations on advanced triple junction solar cells

2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 2013, p.2797-2800

2013

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Application of CL/EBIC-SEM techniques for characterization of irradiation induced defects in triple junction solar cells

2010 35th IEEE Photovoltaic Specialists Conference, 2010, p.001753-001758

2010

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Crystallinity Control in Low-Temperature Growth of Poly-Crystalline Ge by Ion Beam Deposition

2017 IEEE 44th Photovoltaic Specialist Conference (PVSC), 2017, p.845-848

2017

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Cathodoluminescence Studies of the Inhomogeneities in Sn-doped Ga2O3 Nanowires

Application of CL/EBIC-SEM Techniques for Characterization of Radiation Effects in Multijunction Solar Cells

Radiation response of multi-quantum well solar cells: Electron-beam-induced current analysis

Stacking fault nucleation sites in diffused 4H-SiC p - i - n diodes

Thin GaAs Solar Cells For High Irradiation Levels

Observation of dislocations in diffused 4H–SiC p-i-n diodes by electron-beam induced current

Electron Channeling Contrast Imaging for Non-Destructive Analysis of Extended Defects in Semiconductor Thin Films and Device Structures

Electron-beam-induced current observed for dislocations in diffused 4H-SiC P–N diodes

Effect of threading screw and edge dislocations on transport properties of 4H–SiC homoepitaxial layers

Effect of basal plane dislocations on characteristics of diffused 4H-SiC p-i-n diodes

FIB/TEM Investigation of crystallographic defects in type-II superlattice based infrared detectors

CL/EBIC-SEM Techniques for Evaluation of Impact of Crystallographic Defects on Carrier Lifetime in 4H-SiC Epitaxial Layers

Evolution of Deep Defect Centers in Semi-Insulating 4H-SiC Substrates under High-Temperature Annealing

Towards high efficiency multi-junction solar cells grown on InP Substrates

The distribution function of the variance of Allan: theory and practice

Open Core Dislocations and Surface Energy of SiC

Propagation of stacking faults from surface damage in SiC PiN diodes

Evolution of D1-Defect Center in 4H-SiC during High Temperature Annealing

Structure and Orientation Determination of Metal-Oxide Nanostructures by Electron Backscatter Diffraction

Mapping of Defects in Large-Area Silicon Carbide Wafers via Photoluminescence and its Correlation with Synchrotron White Beam X-Ray Topography

Recombination Behaviour of Stacking Faults in SiC p-i-n Diodes

Performance of Silicon Carbide PiN Diodes Fabricated on Basal Plane Dislocation-Free Epilayers

Characterization of high fluence irradiations on advanced triple junction solar cells

Application of CL/EBIC-SEM techniques for characterization of irradiation induced defects in triple junction solar cells

Crystallinity Control in Low-Temperature Growth of Poly-Crystalline Ge by Ion Beam Deposition

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