UB Paderborn / Katalog / Suche / in CDI

Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2000-01, Vol.18 (1), p.25-31

2000

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Effect of various sputtering parameters on Ta phase formation using an I-Optimal experimental design

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2000-11, Vol.18 (6), p.2842-2847

Whitman, Charles S.

2000

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Calibrated scanning capacitance microscopy investigations on p-doped Si multilayers

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2001-09, Vol.19 (5), p.1808-1812

2001

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Atom-by-atom analysis of diamond, graphite, and vitreous carbon by the scanning atom probe

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2000-03, Vol.18 (2), p.653-660

2000

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Magnetoresistance characteristics of NiFe/Cu/CoFe/IrMn spin valves at elevated temperature

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2001-03, Vol.19 (2), p.563-566

2001

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Stoichiometry‐related defects in GaAs grown by molecular‐beam epitaxy at low temperatures

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1989-07, Vol.7 (4), p.710-713

1989

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Carrier concentrations and deep trap concentrations in high temperature GaAs

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2002-03, Vol.20 (2), p.685-689

2002

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Induced crystallization as a nonlithographic pattern transfer technique for nanofabrication

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2001-11, Vol.19 (6), p.2793-2796

2001

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The thermal and ion‐assisted reactions of GaAs(100) with molecular chlorine

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1986-07, Vol.4 (4), p.794-805

1986

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Defect study in GaAs bombarded by low‐energy focused ion beams

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1988-11, Vol.6 (6), p.2124-2127

1988

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Optimum 7 MW HTS direct-drive wind turbine synchronous generator designs with different rotor and stator iron topologies

Reliability and mechanical durability tests of flexible OLED with ALD coating

The research on temperature rising model and design optimization of heater in cell device

The effect of the crystallization of indium tin oxide on indium tin oxide wet etching based on gate line with the structure of copper/indium tin oxide

Analyzing the effect of temperature on optical performance of dual‐layer liquid crystal displays

Backside bonding for extremely narrow bezel at the bottom of flexible displays

Invited Paper: New technology for HTPS-LCD panels for projection systems

Lifetime prediction model of electrophoretic display based on high temperature and high humidity test

Multioutputs single‐stage gate driver on array with wide temperature operable thin‐film‐transistor liquid‐crystal display for high resolution application

High‐temperature thin‐film barriers for foldable AMOLED displays

Carrier mobilities and process stability of strained Si n- and p-MOSFETs on SiGe virtual substrates

Ultrasonic-based gas flowmeter for harsh environmental conditions

Edge transistor elimination in oxide trench isolated N-channel metal–oxide–semiconductor field effect transistors

Influence of the Si evaporation source on the incorporation of In during Si molecular‐beam epitaxy growth: A comparative study of magnetically and electrostatically‐focused electron‐gun evaporators

Growth of wide band gap polycrystalline semi‐insulating polycrystalline silicon

Fabrication and transport measurements of YBa2Cu3O7−x nanostructures

Effect of various sputtering parameters on Ta phase formation using an I-Optimal experimental design

Calibrated scanning capacitance microscopy investigations on p-doped Si multilayers

Atom-by-atom analysis of diamond, graphite, and vitreous carbon by the scanning atom probe

Magnetoresistance characteristics of NiFe/Cu/CoFe/IrMn spin valves at elevated temperature

Stoichiometry‐related defects in GaAs grown by molecular‐beam epitaxy at low temperatures

Carrier concentrations and deep trap concentrations in high temperature GaAs

Induced crystallization as a nonlithographic pattern transfer technique for nanofabrication

The thermal and ion‐assisted reactions of GaAs(100) with molecular chlorine

Defect study in GaAs bombarded by low‐energy focused ion beams

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