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Growth morphology and the equilibrium shape : the role of «surfactants» in Ge/Si island formation

Physical review letters, 1993-02, Vol.70 (7), p.966-969

1993

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Direct imaging of a novel silicon surface reconstruction

Physical review letters, 1985-10, Vol.55 (17), p.1765-1767

1985

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Specular boundary scattering and electrical transport in single-crystal thin films of CoSi2

Physical review letters, 1985-04, Vol.54 (16), p.1840-1843

1985

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Dependence of the structural and electrical properties of ultrathin cobalt silicide films on formation conditions

Journal of materials research, 1989-02, Vol.4 (1), p.144-155

1989

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Origin of A- or B-type NiSii2 determined by in in situ transmission electron microscopy and diffraction during growth

Physical review letters, 1988-03, Vol.60 (12), p.1158-1161

1988

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Dopant electrical activity and majority-carrier mobility in B- and Sb-δ-doped Si thin films

Physical review. B, Condensed matter, 1993-05, Vol.47 (19), p.12618-12624

1993

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Distribution of point defects in Si(100)/Si grown by low-temperature molecular-beam epitaxy and solid-phase epitaxy

Physical review. B, Condensed matter, 1993-08, Vol.48 (8), p.5345-5353

1993

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Origin of A - or B -type NiSi i 2 determined by in in situ transmission electron microscopy and diffraction during growth

Physical review letters, 1988-03, Vol.60 (12), p.1158-1161

1988

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Origin of A- or B-type NiSi2 determined by In Situ transmission electron microscopy and diffraction during growth

Physical review letters, 1988, Vol.60 (12), p.1158-1161

1988

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Measuring Vacancy Diffusivity and Vacancy Assisted Clustering by Nitridation Enhanced Diffusion of Sb IN Si(100) Doping Superlattices

MRS proceedings, 1994, Vol.355, Article 157

1994

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Transport studies in single-crystal films of CoSi2 and NiSi2; A new class of quasi-two-dimensional metals

Surface science, 1984-07, Vol.142 (1-3), p.37-42

1984

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Specular Boundary Scattering and Electrical Transport in Single-Crystal Thin Films of Co Si 2

Physical review letters, 1985-04, Vol.54 (16), p.1840-1843

1985

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Si MBE on H-Passivated Si(100)

MRS proceedings, 1992, Vol.259, Article 439

1992

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Electrical Transport in Ultrathin Films of CoSi 2 on Si(111)

MRS proceedings, 1987, Vol.91, Article 427

1987

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The Effect of Formation Conditions on the Structural and Electrical Properties of Ultrathin Cobalt Silicide Films

MRS proceedings, 1987, Vol.102, Article 389

1987

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Electrical Transport in Ultrathin Films of CoSi2 on Si(111)

MRS proceedings, 1987, Vol.91

1987

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Electrical Transport and In-Situ X-Ray Studies of the Formation of TiSi 2 Thin Films on Si

MRS proceedings, 1986, Vol.77, Article 737

1986

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Electrical Transport and In-Situ X-Ray Studies of the Formation of TiSi2 Thin Films on Si

MRS proceedings, 1986, Vol.77

1986

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Specular Scattering in Electrical Transport in the Thin Tilm System CoSi2/Si

MRS proceedings, 1984, Vol.37

1984

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Specular Scattering in Electrical Transport in the Thin Tilm System CoSi 2 /Si

MRS proceedings, 1984, Vol.37, Article 355

1984

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Transport Studies in Single-Crystal Films of Cosi2 and Nisi2

MRS proceedings, 1983, Vol.25

1983

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Transport Studies in Single-Crystal Films of Cosi 2 and Nisi 2

MRS proceedings, 1983, Vol.25, Article 575

1983

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Adjusting Poles and Zeros of Dielectric Dispersion to Fit Reststrahlen of Pr Cl 3 and La Cl 3

Physical review, 1968-10, Vol.174 (3), p.791-799

1968

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SINGULAR EFFECTS IN PHONON FOCUSING ; FORMATION OF PHONON FOCUSINGCAUSTICS

Le Journal de Physique Colloques, 1981-12, Vol.42 (C6), p.C6-C6-214

1981

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Novel C-1 substituted cocaine analogs unlike cocaine or benztropine

The Journal of pharmacology and experimental therapeutics, 2012-11, Vol.343 (2), p.413-425

2012

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Growth morphology and the equilibrium shape : the role of «surfactants» in Ge/Si island formation

Direct imaging of a novel silicon surface reconstruction

Specular boundary scattering and electrical transport in single-crystal thin films of CoSi2

Dependence of the structural and electrical properties of ultrathin cobalt silicide films on formation conditions

Origin of A- or B-type NiSii2 determined by in in situ transmission electron microscopy and diffraction during growth

Dopant electrical activity and majority-carrier mobility in B- and Sb-δ-doped Si thin films

Distribution of point defects in Si(100)/Si grown by low-temperature molecular-beam epitaxy and solid-phase epitaxy

Origin of A - or B -type NiSi i 2 determined by in in situ transmission electron microscopy and diffraction during growth

Origin of A- or B-type NiSi2 determined by In Situ transmission electron microscopy and diffraction during growth

Measuring Vacancy Diffusivity and Vacancy Assisted Clustering by Nitridation Enhanced Diffusion of Sb IN Si(100) Doping Superlattices

Transport studies in single-crystal films of CoSi2 and NiSi2; A new class of quasi-two-dimensional metals

Specular Boundary Scattering and Electrical Transport in Single-Crystal Thin Films of Co Si 2

Si MBE on H-Passivated Si(100)

Electrical Transport in Ultrathin Films of CoSi 2 on Si(111)

The Effect of Formation Conditions on the Structural and Electrical Properties of Ultrathin Cobalt Silicide Films

Electrical Transport in Ultrathin Films of CoSi2 on Si(111)

Electrical Transport and In-Situ X-Ray Studies of the Formation of TiSi 2 Thin Films on Si

Electrical Transport and In-Situ X-Ray Studies of the Formation of TiSi2 Thin Films on Si

Specular Scattering in Electrical Transport in the Thin Tilm System CoSi2/Si

Specular Scattering in Electrical Transport in the Thin Tilm System CoSi 2 /Si

Transport Studies in Single-Crystal Films of Cosi2 and Nisi2

Transport Studies in Single-Crystal Films of Cosi 2 and Nisi 2

Adjusting Poles and Zeros of Dielectric Dispersion to Fit Reststrahlen of Pr Cl 3 and La Cl 3

SINGULAR EFFECTS IN PHONON FOCUSING ; FORMATION OF PHONON FOCUSINGCAUSTICS

Novel C-1 substituted cocaine analogs unlike cocaine or benztropine

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