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19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings, 2004, p.174-182
2004

30th Annual Conference of IEEE Industrial Electronics Society, 2004. IECON 2004, 2004, Vol.3, p.2459-2463 Vol. 3
2004

2004 American Control Conference Proceedings; Volume 2 of 6, 2004, Vol.2, p.1183-1189 vol.2
2004

Yee's macrocells in three dimensions
2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535), 2004, Vol.3, p.1717-1720 Vol.3
2004

2004 International Conference on Image Processing, 2004. ICIP '04, 2004, Vol.2, p.1153-1156 Vol.2
2004


2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535), 2004, Vol.3, p.1423-1426 Vol.3
2004

30th Annual Conference of IEEE Industrial Electronics Society, 2004. IECON 2004, 2004, Vol.2, p.1018-1023 Vol. 2
2004

2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535), 2004, Vol.2, p.711-714 Vol.2
2004

2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535), 2004, Vol.3, p.1419-1422 Vol.3
2004

Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545), 2004, p.104-110
2004

2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535), 2004, Vol.2, p.1029-1032 Vol.2
2004

2004 American Control Conference Proceedings; Volume 4 of 6, 2004, Vol.4, p.3029-3034 vol.4
2004

2004 American Control Conference Proceedings; Volume 1 of 6, 2004, Vol.1, p.762-767 vol.1
2004

2004 American Control Conference Proceedings; Volume 4 of 6, 2004, Vol.4, p.3705-3710 vol.4
2004

Robust order reduction
2004 American Control Conference Proceedings; Volume 4 of 6, 2004, Vol.4, p.3363-3368 vol.4
2004

2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535), 2004, Vol.3, p.1377-1380 Vol.3
2004

2004 American Control Conference Proceedings; Volume 1 of 6, 2004, Vol.1, p.90-95 vol.1
2004

2004 American Control Conference Proceedings; Volume 1 of 6, 2004, Vol.1, p.108-112 vol.1
2004

2004 American Control Conference Proceedings; Volume 4 of 6, 2004, Vol.4, p.2915-2920 vol.4
2004

2004 American Control Conference Proceedings; Volume 1 of 6, 2004, Vol.1, p.279-286 vol.1
2004

2004 American Control Conference Proceedings; Volume 3 of 6, 2004, Vol.3, p.2222-2226 vol.3
2004

Proceedings of the 2002 American Control Conference (IEEE Cat. No.CH37301), 2002, Vol.3, p.1748-1752 vol.3
2002

2004 American Control Conference Proceedings; Volume 1 of 6, 2004, Vol.1, p.113-118 vol.1
2004

Row by row structure simplification
2004 American Control Conference Proceedings; Volume 1 of 6, 2004, Vol.1, p.758-761 vol.1
2004
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ThemaExact Sciences And Technology