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Channel Material Engineered Nanoscale Cylindrical Surrounding Gate MOSFET with Interface Fixed Charges
Ist Teil von
Trends in Network and Communications, p.476-485
Ort / Verlag
Berlin, Heidelberg: Springer Berlin Heidelberg
Link zum Volltext
Quelle
Alma/SFX Local Collection
Beschreibungen/Notizen
The paper presents a simulation study of effect of interface fixed charges on the performance of the nanoscale cylindrical surrounding gate (SRG)MOSFET for different channel materials (Si, GaAs and Ge). The objective of the present work is to study the effect of hot carrier induced fixed charges at the semiconductor-oxide interface of the nanoscale cylindrical surrounding gate (SRG) MOSFET. Also the circuit reliability issues of the device are discussed in terms of the performance degradation due to interface fixed interface charges and the performance has been compared for the three materials.