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Fabrication and characterization of the substrate-free InGaN-based resonant-cavity light-emitting diodes for plastic optical fiber communications
Ist Teil von
Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2009-05, Vol.27 (3), p.1080-1085
Erscheinungsjahr
2009
Quelle
American Institute of Physics (AIP) Journals
Beschreibungen/Notizen
In this article, the authors report on the realization of substrate-free InGaN-based thin-film resonant-cavity light-emitting diodes (TF-RCLEDs). Experimentally, the sapphire substrate was stripped by using the laser lift-off technique. The
λ
∕
4
-thick
Ta
2
O
5
∕
Si
O
2
distributed Bragg reflector and the metallic Ag film with mirror reflectivities of 68% and 97% were, respectively, coated onto the top and bottom of the substrate-free LEDs to form a Fabry–Pérot cavity. The performances of LEDs are characterized by light output power, external quantum efficiency, emission spectrum, angular-resolved intensity distribution, and dynamic response. As a result, the fabricated TF-RCLEDs exhibit a low operating voltage of
3.34
V
at
20
mA
, a maximum light output power of
6.3
mW
at
140
mA
, and an external quantum efficiency of 5.5% at
4
mA
. In addition, the TF-RCLEDs show temperature insensitivity as compared to the normal LEDs directly grown on the sapphire substrates. Furthermore, the 50% viewing angle of TF-RCLED is smaller than that of normal LED, i.e., 146° versus 168° at
60
mA
. Finally, the eye pattern of the TF-RCLEDs is improved compared to that of the normal LEDs as operated at the data transmission rate of
100
Mbit
∕
s
. These results exhibit that the InGaN-based TF-RCLEDs are excellent candidates for the use in short-distance plastic optical fiber communications.
Sprache
Englisch
Identifikatoren
ISSN: 1071-1023
eISSN: 1520-8567
DOI: 10.1116/1.3119685
Titel-ID: cdi_scitation_primary_10_1116_1_3119685
Format
–
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