Details

Autor(en) / Beteiligte

• Young, S.
• Staruch, M.
• Patterson, E. A.
• Caruso, A. N.
• Lofland, S. E.
• Finkel, P.

Titel

Thermally induced phase switching in mechanically biased single crystal relaxors

Ist Teil von

• Applied physics letters, 2019-12, Vol.115 (25)

Ort / Verlag

Melville: American Institute of Physics

Erscheinungsjahr

2019

Quelle

American Institute of Physics (AIP) Journals

Beschreibungen/Notizen

• In this work, we examine the time-dependent piezoelectric response of [011] poled rhombohedral [Pb(In1/2Nb1/2)O3]0.24[Pb(Mg1/3Nb2/3)O3]0.44[PbTiO3]0.32 single crystals under variable thermal loading. We find that thermal radiation incident on a piezoelectric crystal held under mechanical compressive bias stress generates an abrupt jump in strain with a rise time <1 ms, much faster than the bulk thermal time scale. This discontinuity is associated with a weak first-order ferroelectric–ferroelectric structural phase transition as confirmed by in situ X-ray diffraction results. We demonstrate that this transition can be cycled repeatedly with low thermal hysteresis (<3 °C) under zero applied electric field with a sizable reversible strain jump of ∼0.12%. Moreover, we show that the thermally driven phase switching behavior can be tuned by varying the bias stress and/or electric field, establishing effective control parameters and conditions for future applications such as actuators, thermally controlled transducers, and sensors.