Details

Autor(en) / Beteiligte

• Bernstein, D P
• Acremann, Y
• Scherz, A
• Burkhardt, M
• Stöhr, J
• Beye, M
• Schlotter, W F
• Beeck, T
• Sorgenfrei, F
• Pietzsch, A
• Wurth, W
• Föhlisch, A

Titel

Near edge x-ray absorption fine structure spectroscopy with x-rayfree-electron lasers

Ist Teil von

• Applied physics letters, 2009-09, Vol.95 (13), p.134102-134102-3

Ort / Verlag

American Institute of Physics

Erscheinungsjahr

2009

Link zum Volltext

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• We demonstrate the feasibility of near edge x-ray absorption fine structure spectroscopy on solids by means of femtosecond soft x-ray pulses from a free-electron laser (FEL). Our experiments, carried out at the FEL at Hamburg used a special sample geometry, spectrographic energy dispersion, single shot position-sensitive detection, and a data normalization procedure that eliminates the severe fluctuations of the incident intensity in space and photon energy. As an example, we recorded the D 3 1 N 4 , 5 edge absorption resonance of La 3 + ions in LaMnO 3 . Our study opens the door for x-ray absorption measurements on future x-ray FEL facilities.