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Complex diffusion behavior of oxygen in nanocrystalline BaTiO3 ceramicsDedicated to Prof. Manfred Martin on the occasion of his 60th birthday
Erscheinungsjahr
2014-01
Quelle
Alma/SFX Local Collection
Beschreibungen/Notizen
18
O/
16
O exchange annealing and subsequent Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) analysis is used to investigate oxygen transport in dense, nanocrystalline (average grain size
d
300 nm) ceramics of nominally un-doped BaTiO
3
. Isotope penetration profiles are obtained as a function of temperature, 973 <
T
/K < 1173, at an oxygen activity
a
O
2
= 0.20 and as a function of oxygen activity, 0.002 <
a
O
2
< 0.20, at
T
= 1073 K. All isotope profiles show the same unusual shape: a flattened profile over the first ∼10
2
nm, followed by a short, conventional diffusion profile. We demonstrate that the entire isotope profile can be described quantitatively by a numerical solution to the diffusion equation based on an increase in the local oxygen diffusion coefficient close to the surface. This position-dependent increase is attributed to additional oxygen vacancies that are generated by diffusion of chlorine impurities out of the ceramics. The presence of chlorine derives from the chemical route necessary to produce nanometric powders: it thus indicates a new manner in which nanocrystalline ceramics may differ from their microcrystalline counterparts.
Oxygen-isotope profiles in nanocrystalline BaTiO
3
ceramics display complex behaviour that is attributed to the loss of volatile chlorine impurities from the ceramics, together with the nanoscale grain size.
Sprache
Englisch
Identifikatoren
ISSN: 1463-9076
eISSN: 1463-9084
DOI: 10.1039/c3cp53979b
Titel-ID: cdi_rsc_primary_c3cp53979b
Format
–
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