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Wafer-Scale Synthesis of Highly Oriented 2D Topological Semimetal PtTe 2 via Tellurization
Ist Teil von
ACS nano, 2024-06, Vol.18 (23), p.15154
Ort / Verlag
United States
Erscheinungsjahr
2024
Quelle
Alma/SFX Local Collection
Beschreibungen/Notizen
Platinum ditelluride (1
-PtTe
) is a two-dimensional (2D) topological semimetal with a distinctive band structure and flexibility of van der Waals integration as a promising candidate for future electronics and spintronics. Although the synthesis of large-scale, uniform, and highly crystalline films of 2D semimetals system is a prerequisite for device application, the synthetic methods meeting these criteria are still lacking. Here, we introduce an approach to synthesize highly oriented 2D topological semimetal PtTe
using a thermally assisted conversion called tellurization, which is a cost-efficient method compared to the other epitaxial deposition methods. We demonstrate that achieving highly crystalline 1
-PtTe
using tellurization is not dependent on epitaxy but rather relies on two critical factors: (i) the crystallinity of the predeposited platinum (Pt) film and (ii) the surface coverage ratio of the Pt film considering lateral lattice expansion during transformation. By optimizing the surface coverage ratio of the epitaxial Pt film, we successfully obtained 2 in. wafer-scale uniformity without in-plane misalignment between antiparallelly oriented domains. The electronic band structure of 2D topological PtTe
is clearly resolved in momentum space, and we observed an interesting 6-fold gapped Dirac cone at the Fermi surface. Furthermore, ultrahigh electrical conductivity down to ∼3.8 nm, which is consistent with that of single crystal PtTe
, was observed, proving its ultralow defect density.
Sprache
Englisch
Identifikatoren
ISSN: 1936-0851
eISSN: 1936-086X
DOI: 10.1021/acsnano.4c02863
Titel-ID: cdi_pubmed_primary_38808726
Format
–
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