Details

Autor(en) / Beteiligte

• Tanabe, A.
• Kudoh, Y.
• Kawakami, Y.
• Masubuchi, I.
• Kawai, S.
• Yamada, T.
• Morimoto, M.
• Arai, K.
• Hatano, K.
• Furumiya, M.
• Naliashiba, Y.
• Mutoh, N.
• Orihara, K.
• Teranishi, N.

Titel

Dynamic range improvement by narrow-channel effect suppression and smear reduction technologies in small pixel IT-CCD image sensors

Ist Teil von

• IEEE transactions on electron devices, 2000-09, Vol.47 (9), p.1700-1706

Ort / Verlag

New York: IEEE

Erscheinungsjahr

2000

Quelle

IEEE Electronic Library Online

Beschreibungen/Notizen

• Technologies for narrow-channel effect suppression in photodiodes (PDs) and vertical CCDs (V-CCDs) and for smear reduction in PDs have been developed in order to improve dynamic range in small pixel interline-transfer CCD (IT-CCD) image sensors. The new technologies have been applied to a progressive-scan IT-CCD image sensor with 5 /spl mu/m square pixels and have (1) increased the charge handling capability of its V-CCDs to 4500 electrons/V; (2) improved its smear value to -95 dB; and (3) increased the saturation charge of its PDs to 2.3/spl times/10/sup 4/ electrons.