Details

Autor(en) / Beteiligte

• Delpierre, P.
• Berar, J.F.
• Blanquart, L.
• Boudet, N.
• Breugnon, P.
• Caillot, B.
• Clemens, J.C.
• Mouget, C.
• Potheau, R.
• Valin, I.

Titel

Large surface X-ray pixel detector

Ist Teil von

• IEEE transactions on nuclear science, 2002-08, Vol.49 (4), p.1709-1711

Ort / Verlag

New York: IEEE

Erscheinungsjahr

2002

Quelle

IEEE Electronic Library Online

Beschreibungen/Notizen

• A large surface semiconductor photon counting pixel detector is being built. As a first step, this detector is optimized for X-ray crystallography. The aim is to provide a high dynamic range (>10/sup 9/), high counting rate (10/sup 7/ ph/s per pixel), and fast image readout (3 ms). A full custom chip has been produced and tested, and results are presented. Prototypes of 6 cm/sup 2/ containing pixels of 330/spl times/330 /spl mu/m/sup 2/ have been built together with a full fast readout system. These prototypes have been tested in the D2am beam line at the ESRF synchrotron (Grenoble, France) for photon energies between 10 and 24 KeV For photon energies above 70 keV, the signal is separable from the noise. We give results on the efficiency as a function of the photon rate and the effect of the threshold on the efficiency in the region between the pixels. Furthermore, to demonstrate the large dynamic range, we made diffraction images.